X-ray Scattering From Semiconductors And Other Materials (3rd Edition) PDF Download
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Author: Paul F Fewster
Publisher: World Scientific
ISBN: 9814436941
Category : Science
Languages : en
Pages : 510
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Book Description
This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
Author: Paul F Fewster
Publisher: World Scientific
ISBN: 9814436941
Category : Science
Languages : en
Pages : 510
Get Book Here
Book Description
This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
Author: Alessandro Cunsolo
Publisher: World Scientific
ISBN: 9813229500
Category : Science
Languages : en
Pages : 325
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Book Description
Since its development toward the end of the past millennium, high-resolution Inelastic X-Ray Scattering (IXS) has substantially improved our knowledge of the collective dynamics of liquids at mesoscopic scales, that is, over distances and time-lapses approaching those typical of first neighboring atoms' interactions. However, despite the undoubted scientific relevance and the rapid evolution toward maturity, comprehensive monographs on this technique are not available. The primary purpose of this book is to partially fill this lack while providing a helpful reference for both mature scientists and less experienced researchers in the field.After a general introduction to the fundamental aspects of scattering measurements, the IXS cross-section is analytically derived, and the complementarity with Inelastic Neutron Scattering is discussed in detail.The remainder of the book reviews representative IXS studies on simple fluids focusing on topics as relevant as the dynamic crossover from the hydrodynamic to the kinetic regime, the onset of relaxation phenomena and related high-frequency viscoelasticity, the gradual emergence of quantum effects, the evidence of dynamic boundaries partitioning the supercritical domain, the prevalence of solid-like aspects in the high-frequency dynamics of fluids, and the dynamic fingerprints of the polymorphic nature of liquid aggregates.
Author: Paul F. Fewster
Publisher: World Scientific
ISBN: 1860941591
Category : Science
Languages : en
Pages : 303
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Book Description
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.
Author: Ullrich Pietsch
Publisher: Springer Science & Business Media
ISBN: 9780387400921
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Author: John R. Reynolds
Publisher: CRC Press
ISBN: 1351660233
Category : Technology & Engineering
Languages : en
Pages : 1525
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Book Description
In the last 10 years there have been major advances in fundamental understanding and applications and a vast portfolio of new polymer structures with unique and tailored properties was developed. Work moved from a chemical repeat unit structure to one more based on structural control, new polymerization methodologies, properties, processing, and applications. The 4th Edition takes this into account and will be completely rewritten and reorganized, focusing on spin coating, spray coating, blade/slot die coating, layer-by-layer assembly, and fiber spinning methods; property characterizations of redox, interfacial, electrical, and optical phenomena; and commercial applications.
Author: Ullrich Pietsch
Publisher: Springer Science & Business Media
ISBN: 1475740506
Category : Technology & Engineering
Languages : en
Pages : 410
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Book Description
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Author: Matthew D. McCluskey
Publisher: CRC Press
ISBN: 1351977970
Category : Science
Languages : en
Pages : 475
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Book Description
Praise for the First Edition "The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics ... an easy reading, broad introductory overview of the field" ?Materials Today "... well written, with clear, lucid explanations ..." ?Chemistry World This revised edition provides the most complete, up-to-date coverage of the fundamental knowledge of semiconductors, including a new chapter that expands on the latest technology and applications of semiconductors. In addition to inclusion of additional chapter problems and worked examples, it provides more detail on solid-state lighting (LEDs and laser diodes). The authors have achieved a unified overview of dopants and defects, offering a solid foundation for experimental methods and the theory of defects in semiconductors. Matthew D. McCluskey is a professor in the Department of Physics and Astronomy and Materials Science Program at Washington State University (WSU), Pullman, Washington. He received a Physics Ph.D. from the University of California (UC), Berkeley. Eugene E. Haller is a professor emeritus at the University of California, Berkeley, and a member of the National Academy of Engineering. He received a Ph.D. in Solid State and Applied Physics from the University of Basel, Switzerland.
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
ISBN: 1118844289
Category : Science
Languages : en
Pages : 896
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Book Description
During the last two decades, remarkable and often spectacularprogress has been made in the methodological and instrumentalaspects of x–ray absorption and emission spectroscopy. Thisprogress includes considerable technological improvements in thedesign and production of detectors especially with the developmentand expansion of large-scale synchrotron reactors All this hasresulted in improved analytical performance and new applications,as well as in the perspective of a dramatic enhancement in thepotential of x–ray based analysis techniques for the nearfuture. This comprehensive two-volume treatise features articlesthat explain the phenomena and describe examples of X–rayabsorption and emission applications in several fields, includingchemistry, biochemistry, catalysis, amorphous and liquid systems,synchrotron radiation, and surface phenomena. Contributors explainthe underlying theory, how to set up X–ray absorptionexperiments, and how to analyze the details of the resultingspectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory andApplications: Combines the theory, instrumentation and applications of x-rayabsorption and emission spectroscopies which offer uniquediagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchersacross multi-disciplines since intense beams from modern sourceshave revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers workingon x-rays and related synchrotron sources and applications inmaterials, physics, medicine, environment/geology, andbiomedical materials
Author: Peter YU
Publisher: Springer Science & Business Media
ISBN: 3540264752
Category : Technology & Engineering
Languages : en
Pages : 651
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Book Description
Excellent bridge between general solid-state physics textbook and research articles packed with providing detailed explanations of the electronic, vibrational, transport, and optical properties of semiconductors "The most striking feature of the book is its modern outlook ... provides a wonderful foundation. The most wonderful feature is its efficient style of exposition ... an excellent book." Physics Today "Presents the theoretical derivations carefully and in detail and gives thorough discussions of the experimental results it presents. This makes it an excellent textbook both for learners and for more experienced researchers wishing to check facts. I have enjoyed reading it and strongly recommend it as a text for anyone working with semiconductors ... I know of no better text ... I am sure most semiconductor physicists will find this book useful and I recommend it to them." Contemporary Physics Offers much new material: an extensive appendix about the important and by now well-established, deep center known as the DX center, additional problems and the solutions to over fifty of the problems at the end of the various chapters.
Author: Alan Owens
Publisher: Taylor & Francis
ISBN: 1439873135
Category : Science
Languages : en
Pages : 570
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Book Description
For many applications, compound semiconductors are now viable competitors to elemental semiconductors because of their wide range of physical properties. This book describes all aspects of radiation detection and measurement using compound semiconductors, including crystal growth, detector fabrication, contacting, and spectroscopic performance (with particular emphasis on the X- and gamma-ray regimes). A concentrated reference for researchers in various disciplines as well as graduate students in specialized courses, the text outlines the potential and limitations of semiconductor detectors.
