X-Ray Diffraction Studies on the Deformation and Fracture of Solids PDF Download
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Author: Kazuyoshi Tanaka
Publisher: Elsevier
ISBN: 1483290387
Category : Technology & Engineering
Languages : en
Pages : 338
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Book Description
This volume covers current research findings and engineering applications of X–ray methods by the Japanese X–ray group members. The first part of the volume deals with fundamental problems in the methods for X–ray stress measurement. Phase stresses in the constituent phases of ceramic composites and ceramic-fiber reinforced metal-matrix composites are separately measured by X–rays, while three-dimensional stresses and thermal stresses in composites measured by X–rays are compared with the theoretical and numerical analyses. This work will therfore provide significant information for designing high-performance composites. Other topics covered include synchrotron X–ray radiation and the analysis of X–ray data by the Guassian curve method. Part two is devoted to the application of X–ray diffraction methods for various engineering purposes, the residual stress and half-value breadth (the full width at half the maximum) of the diffraction profiles being the two main X–ray parameters utilized in those applications. Chapters are included on X–ray fractography, a powerful technique for failure analysis, which is applied to the brittle fracture of ceramics and to the fatigue fracture of steels under various service conditions.
Author: Kazuyoshi Tanaka
Publisher: Elsevier
ISBN: 1483290387
Category : Technology & Engineering
Languages : en
Pages : 338
Get Book Here
Book Description
This volume covers current research findings and engineering applications of X–ray methods by the Japanese X–ray group members. The first part of the volume deals with fundamental problems in the methods for X–ray stress measurement. Phase stresses in the constituent phases of ceramic composites and ceramic-fiber reinforced metal-matrix composites are separately measured by X–rays, while three-dimensional stresses and thermal stresses in composites measured by X–rays are compared with the theoretical and numerical analyses. This work will therfore provide significant information for designing high-performance composites. Other topics covered include synchrotron X–ray radiation and the analysis of X–ray data by the Guassian curve method. Part two is devoted to the application of X–ray diffraction methods for various engineering purposes, the residual stress and half-value breadth (the full width at half the maximum) of the diffraction profiles being the two main X–ray parameters utilized in those applications. Chapters are included on X–ray fractography, a powerful technique for failure analysis, which is applied to the brittle fracture of ceramics and to the fatigue fracture of steels under various service conditions.
Author: B. K. Tanner
Publisher: Elsevier
ISBN: 1483187683
Category : Science
Languages : en
Pages : 189
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Book Description
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
Author: William G. Messenger
Publisher:
ISBN:
Category : Metals
Languages : en
Pages : 104
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Book Description
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Åsa Bengtsson
Publisher:
ISBN: 9789180391849
Category :
Languages : en
Pages : 0
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Book Description
X-ray diffraction is an invaluable tool in the field of structural dynamics. In the work described in this thesis, time-resolved X-ray diffraction experiments were carried out to investigate ultrafast lattice dynamics. Ultrashort laser pulses were used to induce non-thermal melting and large-amplitude strain waves, and X-rays were used to probe these phenomena. Non-thermal melting was studied in indium antimonide (InSb). It was found that the inertial model, which states that the motion of the atoms is determined by their initial vibrational energy at the time of laser irradiation, accurately describes the process of non-thermal melting. It was demonstrated that the model is valid over a large range of temperatures, from 35 to 500 K, when taking the zero-point energy into account at low temperatures. It was also shown how the process of non-thermal melting can be used as a timing monitor to determine the relative timing of laser and X-ray beams in pump/probe experiments. It was shown how the use of an opto-acoustic transducer could reduce the duration of an Xray pulse. The transducer was made of a thin gold film deposited on the surface of bulk InSb. Upon heating the thin gold film with an ultrashort laser pulse, a strain wave was generated in the semiconductor. This resulted in a modulated phonon spectrum and X-ray reflectivity. It was shown that a 100 ps long X-ray pulse can be transformed to a 20 ps pulse with an 8% efficiency. A large-amplitude strain wave was generated in graphite using an ultrashort laser pulse to elucidate the potential role of strain in phase transitions. The temporal evolution of the strain wave was mapped, and the pressure deduced. It was found that it was possible to induce a pressure and temperature corresponding to the region in the carbon phase diagram in which diamond can form.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 9783540405191
Category : Science
Languages : en
Pages : 588
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: S. K. CHATTERJEE
Publisher: PHI Learning Pvt. Ltd.
ISBN: 8120341945
Category : Science
Languages : en
Pages : 221
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Book Description
Designed for the undergraduate and postgraduate students of physics, materials science and metallurgical engineering, this text explains the theory of X-ray diffraction starting from diffraction by an electron to that by an atom, a crystal, and finally ending with a diffraction by a conglomerate of atoms either in the single crystal or in the polycrystal stage. This Second Edition of the book includes a new chapter on Electron Diffraction as electron diffraction along with X-ray diffraction are complementary to each other and are also included in the curriculum. The book amply blends the theory with major applications of X-ray diffraction, including those of direct analysis of lattice defects by X-ray topography, orientation texture analysis, chemical analysis by diffraction as well as by fluorescence. KEY FEATURES : Set of numerical problems along with solutions Details of some different experimental techniques Unsolved problems and Review Questions to grasp the concepts.
Author: James F. Bell
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 272
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Book Description
Historically, a major problem for the study of the large deformation of crystalline solids has been the apparent lack of unity in experimentally determined stress-strain functions. The writer's discovery in 1949 of the unexpectedly high velocity of incremental loading waves in pre-stressed large deformation fields emphasized to him the pressing need for the independent, systematic experimental study of the subject, to provide a firm foundation upon which physically plausible theories for the finite deformation of crystalline solids could be constructed. Such a study undertaken by the writer at that time and continued uninterruptedly to the present, led in 1956 to the development of the diffraction grating experiment which permitted, for the first time, the optically accurate determination of the strain-time detail of non-linear finite amplitude wave fronts propagating into crystalline solids whose prior history was precisely known. These experimental diffraction grating studies during the past decade have led to the discovery that the uniaxial stress-strain functions of 27 crystalline solids are unified in a single, generalized stress-strain function which is described, much of it hitherto unpublished, in the present monograph. The detailed study of over 2,000 polycrystal and single crystal uni axial stress experiments in 27 crystalline solids, in terms of the variation of a large number of pertinent parameters, has provided new unified pat terns of understanding which, it is hoped, will be of interest and value to theorists and experimentalists alike.
Author: Manfred L. Ristig
Publisher: Springer
ISBN: 3540458816
Category : Science
Languages : en
Pages : 206
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Book Description
Interesting and new specific results of current theoretical and experimental work in various fields at the frontier of particle scattering and X-ray diffraction are reviewed in this volume. Special emphasis is placed on the study of the microstructure of solids, crystals and liquids, both classically and quantum mechanically. This gives the reader essential insights into the dynamics and properties of these states of matter. The authors address students interested in the physics of quantum solids, crystallography and material science as well as physical chemistry and computational physics.
Author: Emil Zolotoyabko
Publisher: John Wiley & Sons
ISBN: 3527681183
Category : Science
Languages : en
Pages : 299
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Book Description
Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
