Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 278
Book Description
X-ray and UV Detectors
Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 278
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 278
Book Description
X-ray and Ultraviolet Sensors and Applications
Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
Photon Counting Detectors for X-ray Imaging
Author: Hiroaki Hayashi
Publisher: Springer Nature
ISBN: 3030626806
Category : Technology & Engineering
Languages : en
Pages : 119
Book Description
This book first provides readers with an introduction to the underlying physics and state-of-the-art application of photon counting detectors for X-ray imaging. The authors explain that a photon-counting imaging detector can realize quantitative analysis because the detector can derive X-ray attenuation information based on the analysis of intensity changes of individual X-ray. To realize this analysis, it is important to consider the physics of an object and detector material. In this book, the authors introduce a novel analytical procedure to create quantitative X-ray images for medical diagnosis.
Publisher: Springer Nature
ISBN: 3030626806
Category : Technology & Engineering
Languages : en
Pages : 119
Book Description
This book first provides readers with an introduction to the underlying physics and state-of-the-art application of photon counting detectors for X-ray imaging. The authors explain that a photon-counting imaging detector can realize quantitative analysis because the detector can derive X-ray attenuation information based on the analysis of intensity changes of individual X-ray. To realize this analysis, it is important to consider the physics of an object and detector material. In this book, the authors introduce a novel analytical procedure to create quantitative X-ray images for medical diagnosis.
Semiconductor X-Ray Detectors
Author: B. G. Lowe
Publisher: CRC Press
ISBN: 1466554010
Category : Science
Languages : en
Pages : 610
Book Description
This book focuses on the history and development of Si(Li) X-Ray Detectors, while providing an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters summarize relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the manufacture and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.
Publisher: CRC Press
ISBN: 1466554010
Category : Science
Languages : en
Pages : 610
Book Description
This book focuses on the history and development of Si(Li) X-Ray Detectors, while providing an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters summarize relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the manufacture and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.
Advanced X-ray Detector Technologies
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030642798
Category : Technology & Engineering
Languages : en
Pages : 297
Book Description
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Publisher: Springer Nature
ISBN: 3030642798
Category : Technology & Engineering
Languages : en
Pages : 297
Book Description
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Advanced X-Ray Radiation Detection:
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030929892
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.
Publisher: Springer Nature
ISBN: 3030929892
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.
X-ray Photon Processing Detectors
Author: Conny Hansson
Publisher: Springer Nature
ISBN: 3031352416
Category : Technology & Engineering
Languages : en
Pages : 297
Book Description
This book provides readers a good overview of some of most recent advances in the field of hybrid pixelated detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics conducted at leading research institutions in the world. The conversion of the X-ray signal into an analogue/digital value is discussed, as well as a review of CMOS chips used for X-ray image sensors. Applications of hybrid pixel detectors are discussed, such as medical imaging, high energy physics, space, non-destructive testing and security. Provides coverage of a broad range of topics, from international experts in academia and industry; Includes in-depth analysis of how to optimize X-ray detection and electronics for X-ray detection; Covers both technology and applications in a number of different domains.
Publisher: Springer Nature
ISBN: 3031352416
Category : Technology & Engineering
Languages : en
Pages : 297
Book Description
This book provides readers a good overview of some of most recent advances in the field of hybrid pixelated detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics conducted at leading research institutions in the world. The conversion of the X-ray signal into an analogue/digital value is discussed, as well as a review of CMOS chips used for X-ray image sensors. Applications of hybrid pixel detectors are discussed, such as medical imaging, high energy physics, space, non-destructive testing and security. Provides coverage of a broad range of topics, from international experts in academia and industry; Includes in-depth analysis of how to optimize X-ray detection and electronics for X-ray detection; Covers both technology and applications in a number of different domains.
X-ray Detectors in Astronomy
Author: G. W. Fraser
Publisher: Cambridge University Press
ISBN: 9780521106030
Category : Science
Languages : en
Pages : 0
Book Description
First published in 1989, this book provides a comprehensive review of the detection techniques that are used in X-ray astronomy. Since the first discovery of a cosmic X-ray source in 1962, there has been rapid growth in X-ray astronomy, which has largely been made possible by enormous advances in the capabilities of photon counting instrumentation. The book describes the first 25 years of astronomical X-ray instrumentation and summarises the areas of current detector research, giving particular emphasis to imaging devices and to non-dispersive devices of high spectral resolution. It is the first book to give such a comprehensive treatment of the subject, and will provide astronomers with a valuable summary of detection techniques.
Publisher: Cambridge University Press
ISBN: 9780521106030
Category : Science
Languages : en
Pages : 0
Book Description
First published in 1989, this book provides a comprehensive review of the detection techniques that are used in X-ray astronomy. Since the first discovery of a cosmic X-ray source in 1962, there has been rapid growth in X-ray astronomy, which has largely been made possible by enormous advances in the capabilities of photon counting instrumentation. The book describes the first 25 years of astronomical X-ray instrumentation and summarises the areas of current detector research, giving particular emphasis to imaging devices and to non-dispersive devices of high spectral resolution. It is the first book to give such a comprehensive treatment of the subject, and will provide astronomers with a valuable summary of detection techniques.
Soft X-Rays and Extreme Ultraviolet Radiation
Author: David Attwood
Publisher: Cambridge University Press
ISBN: 1139643428
Category : Technology & Engineering
Languages : en
Pages : 611
Book Description
This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.
Publisher: Cambridge University Press
ISBN: 1139643428
Category : Technology & Engineering
Languages : en
Pages : 611
Book Description
This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.
Gamma- and X-ray Spectrometry with Semiconductor Detectors
Author: Klaus Debertin
Publisher: North Holland
ISBN:
Category : Science
Languages : en
Pages : 420
Book Description
Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.
Publisher: North Holland
ISBN:
Category : Science
Languages : en
Pages : 420
Book Description
Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.