Workshop on the Physics and Modeling of Submicron Structures PDF Download
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Author: Karl Hess
Publisher:
ISBN:
Category :
Languages : en
Pages : 15
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Book Description
A Workshop on the Physics and Modeling of Submicron Structures has been held. The results and lectures of the Workshop are briefly described.
Author: Karl Hess
Publisher:
ISBN:
Category :
Languages : en
Pages : 15
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Book Description
A Workshop on the Physics and Modeling of Submicron Structures has been held. The results and lectures of the Workshop are briefly described.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 456
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Harold L Grubin
Publisher:
ISBN: 9781461327783
Category :
Languages : en
Pages : 376
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Book Description
Author: Patrick Roblin
Publisher: Cambridge University Press
ISBN: 1139437461
Category : Technology & Engineering
Languages : en
Pages : 726
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Book Description
Fuelled by rapid growth in communications technology, silicon heterostructures and related high-speed semiconductors are spearheading the drive toward smaller, faster and lower power devices. High-Speed Heterostructure Devices is a textbook on modern high-speed semiconductor devices intended for both graduate students and practising engineers. This book is concerned with the underlying physics of heterostructures as well as some of the most recent techniques for modeling and simulating these devices. Emphasis is placed on heterostructure devices of the immediate future such as the MODFET, HBT and RTD. The principles of operation of other devices such as the Bloch Oscillator, RITD, Gunn diode, quantum cascade laser and SOI and LD MOSFETs are also introduced. Initially developed for a graduate course taught at Ohio State University, the book comes with a complete set of homework problems and a web link to MATLAB programs supporting the lecture material.
Author:
Publisher: Gruppo Italiano Frattura
ISBN: 8895940164
Category :
Languages : en
Pages : 285
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Book Description
Author: Österreichische Physikalische Gesellschaft
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 316
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Book Description
This volume presents a discussion of the latest results in the physics of low-dimensional structures. At the winter school major breakthroughs were reported, and some of the excitement of the participants is reflected in the contributions. The topics treated range from the fabrication of microstructures and the physical background of future semiconductor devices to vertical transport in nanostructures, universal conductance fluctuations, and the transition from two-dimensional to one-dimensional conduction in semiconductor structures.
Author: A. S. M. International
Publisher: ASM International
ISBN: 1627080228
Category : Technology & Engineering
Languages : en
Pages : 634
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Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1662
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Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 1044
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Book Description
Author: Eishi H. Ibe
Publisher: John Wiley & Sons
ISBN: 1118479297
Category : Technology & Engineering
Languages : en
Pages : 292
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Book Description
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
