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Author:
Publisher:
ISBN:
Category : Bibliography of bibliographies
Languages : en
Pages : 984
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Book Description
Author:
Publisher:
ISBN:
Category : Bibliography of bibliographies
Languages : en
Pages : 984
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Book Description
Author: H.W. Wilson Company
Publisher:
ISBN:
Category : Bibliographical literature
Languages : en
Pages : 1076
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Book Description
"An index to library and information science".
Author: Robert D. Legler
Publisher: www.Militarybookshop.CompanyUK
ISBN: 9781782662235
Category : Science
Languages : en
Pages : 300
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Book Description
Full color publication. This document has been produced and updated over a 21-year period. It is intended to be a handy reference document, basically one page per flight, and care has been exercised to make it as error-free as possible. This document is basically "as flown" data and has been compiled from many sources including flight logs, flight rules, flight anomaly logs, mod flight descent summary, post flight analysis of mps propellants, FDRD, FRD, SODB, and the MER shuttle flight data and inflight anomaly list. Orbit distance traveled is taken from the PAO mission statistics.
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author:
Publisher:
ISBN:
Category : Education
Languages : en
Pages : 896
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Book Description
Author: Franco Cataldo
Publisher: Springer Science & Business Media
ISBN: 9400702213
Category : Science
Languages : en
Pages : 294
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Book Description
The Mathematics and Topology of Fullerenes presents a comprehensive overview of scientific and technical innovations in theoretical and experimental studies. Topics included in this multi-author volume are: Clar structures for conjugated nanostructures; counting polynomials of fullerenes; topological indices of fullerenes; the wiener index of nanotubes; toroidal fullerenes and nanostars; C60 Structural relatives: a topological study; local combinatorial characterization of fullerenes; computation of selected topological indices of C60 and C80 Fullerenes via the Gap Program; 4valent- analogues of fullerenes; a detailed atlas of Kekule structures of C60. The Mathematics and Topology of Fullerenes is targeted at advanced graduates and researchers working in carbon materials, chemistry and physics.
Author: Anant Agarwal
Publisher: Elsevier
ISBN: 008050681X
Category : Technology & Engineering
Languages : en
Pages : 1009
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Book Description
Unlike books currently on the market, this book attempts to satisfy two goals: combine circuits and electronics into a single, unified treatment, and establish a strong connection with the contemporary world of digital systems. It will introduce a new way of looking not only at the treatment of circuits, but also at the treatment of introductory coursework in engineering in general. Using the concept of ''abstraction,'' the book attempts to form a bridge between the world of physics and the world of large computer systems. In particular, it attempts to unify electrical engineering and computer science as the art of creating and exploiting successive abstractions to manage the complexity of building useful electrical systems. Computer systems are simply one type of electrical systems.+Balances circuits theory with practical digital electronics applications.+Illustrates concepts with real devices.+Supports the popular circuits and electronics course on the MIT OpenCourse Ware from which professionals worldwide study this new approach.+Written by two educators well known for their innovative teaching and research and their collaboration with industry.+Focuses on contemporary MOS technology.
Author: Shabbir Syed-Abdul
Publisher: MDPI
ISBN: 3039363506
Category : Medical
Languages : en
Pages : 498
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Book Description
This book provides a collection of comprehensive research articles on data analytics and applications of wearable devices in healthcare. This Special Issue presents 28 research studies from 137 authors representing 37 institutions from 19 countries. To facilitate the understanding of the research articles, we have organized the book to show various aspects covered in this field, such as eHealth, technology-integrated research, prediction models, rehabilitation studies, prototype systems, community health studies, ergonomics design systems, technology acceptance model evaluation studies, telemonitoring systems, warning systems, application of sensors in sports studies, clinical systems, feasibility studies, geographical location based systems, tracking systems, observational studies, risk assessment studies, human activity recognition systems, impact measurement systems, and a systematic review. We would like to take this opportunity to invite high quality research articles for our next Special Issue entitled “Digital Health and Smart Sensors for Better Management of Cancer and Chronic Diseases” as a part of Sensors journal.
Author:
Publisher:
ISBN:
Category : Humanities
Languages : en
Pages : 1788
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Book Description
Author: Leonard L. Gunderson, MD, MS, FASTRO
Publisher: Elsevier Health Sciences
ISBN: 0323240984
Category : Medical
Languages : en
Pages : 2253
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Book Description
Perfect for radiation oncology physicians and residents needing a multidisciplinary, treatment-focused resource, this updated edition continues to provide the latest knowledge in this consistently growing field. Not only will you broaden your understanding of the basic biology of disease processes, you'll also access updated treatment algorithms, information on techniques, and state-of-the-art modalities. The consistent and concise format provides just the right amount of information, making Clinical Radiation Oncology a welcome resource for use by the entire radiation oncology team. Content is templated and divided into three sections -- Scientific Foundations of Radiation Oncology, Techniques and Modalities, and Disease Sites - for quick access to information. Disease Sites chapters summarize the most important issues on the opening page and include a full-color format, liberal use of tables and figures, a closing section with a discussion of controversies and problems, and a treatment algorithm that reflects the treatment approach of the authors. Chapters have been edited for scientific accuracy, organization, format, and adequacy of outcome data (such as disease control, survival, and treatment tolerance). Allows you to examine the therapeutic management of specific disease sites based on single-modality and combined-modality approaches. Features an emphasis on providing workup and treatment algorithms for each major disease process, as well as the coverage of molecular biology and its relevance to individual diseases. Two new chapters provide an increased emphasis on stereotactic radiosurgery (SRS) and stereotactic body irradiation (SBRT). New Associate Editor, Dr. Andrea Ng, offers her unique perspectives to the Lymphoma and Hematologic Malignancies section. Key Points are summarized at the beginning of each disease-site chapter, mirroring the template headings and highlighting essential information and outcomes. Treatment algorithms and techniques, together with discussions of controversies and problems, reflect the treatment approaches employed by the authors. Disease Site Overviews allow each section editor to give a unique perspective on important issues, while online updates to Disease Site chapters ensure your knowledge is current. Disease Site chapters feature updated information on disease management and outcomes. Four videos accessible on Expert Consult include Intraoperative Irradiation, Prostate Brachytherapy, Penile Brachytherapy, and Ocular Melanoma. Thirty all-new anatomy drawings increase your visual understanding. Expert Consult eBook version included with purchase. This enhanced eBook experience allows you to search all of the text, figures, and references from the book on a variety of devices.
