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Author: Digital Equipment Corporation. Western Research Laboratory
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages :
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Book Description
The first paper, Efficient Generation of Test Patterns Using Boolean Difference, gives an overview of a successful test pattern generation system using the Boolean satisfiability method. The second paper, A Framework for Evaluating Test Pattern Generation Strategies, describes potential test pattern generation heuristics and their efficacy in the Boolean satisfiability system."
Author: Digital Equipment Corporation. Western Research Laboratory
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages :
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Book Description
The first paper, Efficient Generation of Test Patterns Using Boolean Difference, gives an overview of a successful test pattern generation system using the Boolean satisfiability method. The second paper, A Framework for Evaluating Test Pattern Generation Strategies, describes potential test pattern generation heuristics and their efficacy in the Boolean satisfiability system."
Author: Yonglian Wang
Publisher:
ISBN:
Category : Shift registers
Languages : en
Pages : 128
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Book Description
Author: Rolf Drechsler
Publisher: Springer Science & Business Media
ISBN: 9048123607
Category : Technology & Engineering
Languages : en
Pages : 196
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Book Description
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Author: Stephan Eggersglüß
Publisher: Springer Science & Business Media
ISBN: 1441999760
Category : Technology & Engineering
Languages : en
Pages : 208
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Book Description
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Author: Thomas Williams
Publisher: Routledge
ISBN: 1351409646
Category : Science
Languages : en
Pages : 521
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Book Description
The Optical Transfer Function of Imaging Systems deals extensively with the theoretical concept of the optical transfer function (OTF), its measurement, and application to imaging devices. The OTF is a mathematical entity describing how well the subject is transferred into an image via the lens. The book focuses on the practical aspects of using and measuring the OTF. It presents the background physics necessary to understand and assess the performance of the great proliferation of electro-optical systems, including image intensifiers, video cameras, and thermal imagers. Assuming a senior undergraduate level of optics knowledge, the book is suitable for graduate courses in optics, electro-optics, and photographic science. In addition, it is a practical guide for systems designers who require a means of assessing and specifying the performance of imaging systems. It is also of interest to physicists and engineers working in all areas of imaging.
Author: Wai-Kai Chen
Publisher: CRC Press
ISBN: 113549925X
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
Author: Rene David
Publisher: CRC Press
ISBN: 1000110168
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author: T. Ravindra Babu
Publisher: Springer Science & Business Media
ISBN: 1447156072
Category : Computers
Languages : en
Pages : 208
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Book Description
This book addresses the challenges of data abstraction generation using a least number of database scans, compressing data through novel lossy and non-lossy schemes, and carrying out clustering and classification directly in the compressed domain. Schemes are presented which are shown to be efficient both in terms of space and time, while simultaneously providing the same or better classification accuracy. Features: describes a non-lossy compression scheme based on run-length encoding of patterns with binary valued features; proposes a lossy compression scheme that recognizes a pattern as a sequence of features and identifying subsequences; examines whether the identification of prototypes and features can be achieved simultaneously through lossy compression and efficient clustering; discusses ways to make use of domain knowledge in generating abstraction; reviews optimal prototype selection using genetic algorithms; suggests possible ways of dealing with big data problems using multiagent systems.
Author: Yanwen Wu
Publisher: Springer Science & Business Media
ISBN: 3642253490
Category : Technology & Engineering
Languages : en
Pages : 982
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Book Description
The volume includes a set of selected papers extended and revised from the I2009 Pacific-Asia Conference on Knowledge Engineering and Software Engineering (KESE 2009) was held on December 19~ 20, 2009, Shenzhen, China. Volume 2 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Knowledge Engineering and Communication Technology to disseminate their latest research results and exchange views on the future research directions of these fields. 135 high-quality papers are included in the volume. Each paper has been peer-reviewed by at least 2 program committee members and selected by the volume editor Prof.Yanwen Wu. On behalf of the this volume, we would like to express our sincere appreciation to all of authors and referees for their efforts reviewing the papers. Hoping you can find lots of profound research ideas and results on the related fields of Knowledge Engineering and Communication Technology.
Author: United States. Patent and Trademark Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1404
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Book Description
