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Author: W. Wayne Meinke
Publisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 602
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Book Description
A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
Author: W. Wayne Meinke
Publisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 602
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Book Description
A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
Author: Bhim Prasad Kaflé
Publisher: Elsevier
ISBN: 0128148675
Category : Science
Languages : en
Pages : 314
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Book Description
Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films. - Covers the basic analytical theory that is essential for understanding spectrophotometry - Emphasizes minor/trace chemical component analysis - Includes the spectrophotometric analysis of nanomaterials and thin solid films - Thoroughly describes methods and uses easy-to-follow, practical examples and experiments
Author:
Publisher:
ISBN:
Category : Trace elements
Languages : en
Pages : 662
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Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 88
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Book Description
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 24
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Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 224
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Book Description
Author: E. L. Grove
Publisher: Springer Science & Business Media
ISBN: 1468487000
Category : Science
Languages : en
Pages : 339
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Book Description
Volume 7 of Developments in Applied Spectroscopy is a collection of forty-two papers selected from those that were presented at the 7th National Meeting of the Society of Applied Spectroscopy, held (in place of the 19th Mid-America Symposium on Spectroscopy) in Chicago, May 13-17, 1968. These papers, selected by the editors and reviewed by persons knowledgeable in the field, are those of the symposium type and not those pertaining to specific research topics that one would expect to be submitted to a journal. It is the opinion of the committee that this type of publication has an important place in the literature. The relatively large number of papers would result in quite a sizable volume if bound in one set of covers. For this reason, and to present the material in areas of more specific mterest, Volume 7 was divided into two parts, Part A, Physical-Inorganic, and Part B, Physical-Organic Developments. The 7th National Meeting was sponsored by the Chicago Section as host in cooperation with the St. Louis, New England, Penn York, Niagara-Frontier, Cincinnati, Ohio Valley, New York, Baltimore-Washington, North Texas, Rocky Mountain, and Southeastern Sections of the Society for Applied Spectroscopy and the Chicago Gas Chromatography Group. The editors wish to express their appreciation to the authors and to those who helped with the reviewing. The latter include Dr. Elma Lanterman, Mr. John E. Forrette, Dr. Carl Moore, Dr. B. Jaselskis, Mr. H. G. Zelinski, Mr.
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 520
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Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 4
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Book Description
A newsletter for librarians, documentalists, and science information specialists.
Author: Philip D. LaFleur
Publisher:
ISBN:
Category : Trace analysis
Languages : en
Pages : 662
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Book Description
