Total-Reflection X-Ray Fluorescence Analysis and Related Methods PDF Download
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Author: Reinhold Klockenkämper
Publisher: John Wiley & Sons
ISBN: 1118460278
Category : Science
Languages : en
Pages : 554
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Book Description
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study
Author: Reinhold Klockenkämper
Publisher: John Wiley & Sons
ISBN: 1118460278
Category : Science
Languages : en
Pages : 554
Get Book Here
Book Description
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study
Author: Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
Publisher:
ISBN:
Category :
Languages : en
Pages : 1544
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Book Description
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Eva Margui
Publisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 149
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Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: Dick K. G. de Boer
Publisher:
ISBN:
Category :
Languages : en
Pages : 277
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Book Description
Author: Reinhold Klockenkämper
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 280
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Book Description
Using only a minimum of mathematics, the author focuses on practical applications of TXRF in a variety of disciplines, including geology, biology, material and environmental sciences, medicine, forensics, and art history.
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780203908709
Category : Science
Languages : en
Pages : 1016
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Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Martina Schmeling
Publisher: Elsevier
ISBN: 9780323959155
Category : Science
Languages : en
Pages : 0
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Book Description
A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful and accurate results. Sample handling is a complex problem and often very targeted approaches are needed. The strengths and weaknesses of the method are discussed in the context of each application in this book. This includes guidelines and suggestions of how to treat and analyze different samples and how to evaluate the data. In addition to sample handling, users of TXRF will learn how to use and calibrate the instrumentation, what specific features are present and which experimental parameters need to be considered, and how to evaluate the data.The book is divided into two parts. with the first part describing the theoretical aspects of the method and the second part being solely dedicated to its applications. The book emphasizes a practical approach to the method, including advantages and also limitations. The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis. The concept is introduced in the first part of the book describing its main aspects like samples, sample handling, and quantification. In the second part of the book the topic is applied to the different application fields of TXRF, presented as separated chapters. Key case studies emphasizing the strength of the method are included in each of the chapters. The book also explains in detail the calibration of the instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation.This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.
Author: M. Steven Shackley
Publisher: Springer Science & Business Media
ISBN: 1441968865
Category : Social Science
Languages : en
Pages : 244
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Book Description
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come. Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
Author: Michael Haschke
Publisher: John Wiley & Sons
ISBN: 3527344632
Category : Science
Languages : en
Pages : 496
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Book Description
Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.
