Thirty-fourth International Symposium for Testing and Failure Analysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Thirty-fourth International Symposium for Testing and Failure Analysis PDF full book. Access full book title Thirty-fourth International Symposium for Testing and Failure Analysis by ASM International. Download full books in PDF and EPUB format.
Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551
Get Book Here
Book Description
Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551
Get Book Here
Book Description
Author: Sabu Thomas
Publisher: Elsevier
ISBN: 0323998275
Category : Technology & Engineering
Languages : en
Pages : 462
Get Book Here
Book Description
Nickel-Titanium Smart Hybrid Materials: From Micro- to Nano-structured Alloys for Emerging Applications describes advanced properties that can be adapted in NiTi-alloys. Nickel-Titanium (NiTi) systems are receiving wide demand in growing industries due to their smart, high-temperature or biocompatible behavior. These influenced behaviors are carefully described in the micro-scale and nanoscale range, with NiTi smart materials described on the basis of their shape memory effect (SME) and super-elastic (SE) properties for sensor and actuator application. This book discusses novel properties of nickel-titanium systems, helping materials scientists and engineers produce smart technologies and systems for the aeronautical, automobile, mechanical, healthcare and electronics industries. - Describes the use of nanotechnology and microtechnology in nickel-titanium-based systems - Outlines the major properties of Nickel-Titanium Nanoalloys - Assesses the major challenges of manufacturing nickel-titanium nanoalloys at an industrial scale
Author: ASM International
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages : 666
Get Book Here
Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author: ASM International
Publisher: ASM International(OH)
ISBN: 9780871707147
Category : Electronic apparatus and appliances
Languages : en
Pages : 528
Get Book Here
Book Description
Author: Grace M. Davidson
Publisher: ASM International
ISBN: 1615030824
Category : Technology & Engineering
Languages : en
Pages : 310
Get Book Here
Book Description
Author:
Publisher: ASM International
ISBN: 1615030921
Category : Technology & Engineering
Languages : en
Pages : 371
Get Book Here
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author: ASM International
Publisher: ASM International
ISBN: 1627080996
Category : Technology & Engineering
Languages : en
Pages : 593
Get Book Here
Book Description
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author: ASM International
Publisher: ASM International
ISBN: 1615030883
Category : Technology & Engineering
Languages : en
Pages : 524
Get Book Here
Book Description
Author: Zhiyong Ma
Publisher: CRC Press
ISBN: 135173394X
Category : Science
Languages : en
Pages : 889
Get Book Here
Book Description
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author: EDFAS Desk Reference Committee
Publisher: ASM International
ISBN: 1615037268
Category : Technology & Engineering
Languages : en
Pages : 673
Get Book Here
Book Description
Includes bibliographical references and index.
