The Study Influence of Differnt Thickness Amorphous Silicon Oxide Thin Films to Its Optical Properties PDF Download
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Author: Ahmad Nurdin Mohd. Amin
Publisher:
ISBN:
Category :
Languages : en
Pages : 59
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Author: Ahmad Nurdin Mohd. Amin
Publisher:
ISBN:
Category :
Languages : en
Pages : 59
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Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Arvind Victor Shah
Publisher: CRC Press
ISBN: 1439808104
Category : Science
Languages : en
Pages : 438
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Book Description
Photovoltaic technology has now developed to the extent that it is close to fulfilling the vision of a "solar-energy world," as devices based on this technology are becoming efficient, low-cost and durable. This book provides a comprehensive treatment of thin-film silicon, a prevalent PV material, in terms of its semiconductor nature, startin
Author:
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Category : Aeronautics
Languages : en
Pages : 704
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Author: David S. Soane
Publisher: Elsevier Publishing Company
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 332
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Category : Power resources
Languages : en
Pages : 600
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Author:
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Category : Solar energy
Languages : en
Pages : 636
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Author: United States. Congress. House. Committee on Small Business. Subcommittee on Energy, Environment, Safety and Research
Publisher:
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Category : Energy policy
Languages : en
Pages : 414
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Author: Mahmood Aliofkhazraei
Publisher: Elsevier
ISBN: 044463245X
Category : Science
Languages : en
Pages : 500
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Book Description
Handbook of Modern Coating Technologies: Advanced Characterization Methods reviews advanced characterization methods of modern coating technologies. The topics in this volume consist of scanning vibrating electrode technique, spectroscopic ellipsometry, advances in X-ray diffraction, neutron reflectivity, micro- and nanoprobes, fluorescence technique, stress measurement methods in thin films, micropotentiometry, and localized corrosion studies.
Author:
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Category : Fuel
Languages : en
Pages : 898
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