The MSFC Complementary Metal Oxide Semiconductor (including Multilevel Interconnect Metallization) Process Handbook PDF Download
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Category : Application-specific integrated circuits
Languages : en
Pages : 76
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Author:
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ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 76
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ISBN:
Category : Aeronautics
Languages : en
Pages : 80
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Category : Aeronautics
Languages : en
Pages : 1370
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
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Category : Technology
Languages : en
Pages : 180
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Category : Science
Languages : en
Pages : 1620
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ISBN:
Category : Government reports announcements & index
Languages : en
Pages : 1304
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Author: Sonia Ben Dhia
Publisher: Springer Science & Business Media
ISBN: 0387266011
Category : Technology & Engineering
Languages : en
Pages : 478
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Book Description
Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
Author: Perry L. Martin
Publisher: McGraw Hill Professional
ISBN: 9780070410442
Category : Technology & Engineering
Languages : en
Pages : 770
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Book Description
Annotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--BOOK JACKET. Title Summary field provided by Blackwell North America, Inc. All Rights Reserved.
Author: Joseph R. Chambers
Publisher: Government Printing Office
ISBN: 9780160941474
Category : Aeronautics
Languages : en
Pages : 134
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Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 296
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