Author: Ricardo Castroviejo
Publisher: Springer Nature
ISBN: 3031126548
Category : Science
Languages : en
Pages : 951
Book Description
This book offers a guide to the microscopic study of metallic ores with reflected light. It combines a rigorous approach with an attractive and easy-to-follow format, using high-quality calibrated photomicrographs to illustrate the use of color for ore identification. The ore identification methodology is updated with systematic color analysis and the application of new multispectral reflectance datasets, which offer an efficient tool for automated ore characterization. In addition, the first volume of this two-part work discusses the essential gangue minerals. Readers will gain familiarity with the method as they follow its application to over 200 selected minerals, comprising the most important ore (≈150) and gangue (≈50) minerals, which are described in the text. Each entry includes an explanatory text with corresponding color photomicrographs for each of the most common microscope settings, preceded by a table summarizing the ore’s main properties, and followed by spectral information in the visible and near-infrared ranges (specular reflectance values from 370 to 1000 nm). Some uncommon, strategic ores, e.g. columbotantalite (“coltan”) and monazite, receive particular attention or are described for the first time with reflected light. Lastly, the book presents a learning strategy for beginners and students. The approach is essentially practical, focusing on the development of observation skills, including self-checking through proposed practical tasks. In addition, the traditional use of determinative tables is critically reviewed and updated. This book is part of a two-volume work. The second volume focuses on intergrowths/textural analysis and interpretation, as well as computer-vision-based automation and applications to ore processing/geometallurgy. The intended audience includes professionals and engineers dealing with mineral resources, as well as postgraduate students. The book also provides lifelong learning support for freelancers and a valuable reference resource for practical university teaching.
A Practical Guide to Ore Microscopy—Volume 1
Author: Ricardo Castroviejo
Publisher: Springer Nature
ISBN: 3031126548
Category : Science
Languages : en
Pages : 951
Book Description
This book offers a guide to the microscopic study of metallic ores with reflected light. It combines a rigorous approach with an attractive and easy-to-follow format, using high-quality calibrated photomicrographs to illustrate the use of color for ore identification. The ore identification methodology is updated with systematic color analysis and the application of new multispectral reflectance datasets, which offer an efficient tool for automated ore characterization. In addition, the first volume of this two-part work discusses the essential gangue minerals. Readers will gain familiarity with the method as they follow its application to over 200 selected minerals, comprising the most important ore (≈150) and gangue (≈50) minerals, which are described in the text. Each entry includes an explanatory text with corresponding color photomicrographs for each of the most common microscope settings, preceded by a table summarizing the ore’s main properties, and followed by spectral information in the visible and near-infrared ranges (specular reflectance values from 370 to 1000 nm). Some uncommon, strategic ores, e.g. columbotantalite (“coltan”) and monazite, receive particular attention or are described for the first time with reflected light. Lastly, the book presents a learning strategy for beginners and students. The approach is essentially practical, focusing on the development of observation skills, including self-checking through proposed practical tasks. In addition, the traditional use of determinative tables is critically reviewed and updated. This book is part of a two-volume work. The second volume focuses on intergrowths/textural analysis and interpretation, as well as computer-vision-based automation and applications to ore processing/geometallurgy. The intended audience includes professionals and engineers dealing with mineral resources, as well as postgraduate students. The book also provides lifelong learning support for freelancers and a valuable reference resource for practical university teaching.
Publisher: Springer Nature
ISBN: 3031126548
Category : Science
Languages : en
Pages : 951
Book Description
This book offers a guide to the microscopic study of metallic ores with reflected light. It combines a rigorous approach with an attractive and easy-to-follow format, using high-quality calibrated photomicrographs to illustrate the use of color for ore identification. The ore identification methodology is updated with systematic color analysis and the application of new multispectral reflectance datasets, which offer an efficient tool for automated ore characterization. In addition, the first volume of this two-part work discusses the essential gangue minerals. Readers will gain familiarity with the method as they follow its application to over 200 selected minerals, comprising the most important ore (≈150) and gangue (≈50) minerals, which are described in the text. Each entry includes an explanatory text with corresponding color photomicrographs for each of the most common microscope settings, preceded by a table summarizing the ore’s main properties, and followed by spectral information in the visible and near-infrared ranges (specular reflectance values from 370 to 1000 nm). Some uncommon, strategic ores, e.g. columbotantalite (“coltan”) and monazite, receive particular attention or are described for the first time with reflected light. Lastly, the book presents a learning strategy for beginners and students. The approach is essentially practical, focusing on the development of observation skills, including self-checking through proposed practical tasks. In addition, the traditional use of determinative tables is critically reviewed and updated. This book is part of a two-volume work. The second volume focuses on intergrowths/textural analysis and interpretation, as well as computer-vision-based automation and applications to ore processing/geometallurgy. The intended audience includes professionals and engineers dealing with mineral resources, as well as postgraduate students. The book also provides lifelong learning support for freelancers and a valuable reference resource for practical university teaching.
The Microscope Past and Present
Author: S. Bradbury
Publisher: Elsevier
ISBN: 1483138976
Category : Nature
Languages : en
Pages : 283
Book Description
The Microscope: Past and Present discusses the best methods of using microscope. This book presents a concise account of the development of this valuable tool, which is used at some time or another by almost every scientist. Comprised of seven chapters, this book begins with an overview of the factors that stimulated the rapid progress in microscopy. This text then describes the immense importance of the work of Robert Hooke in the development of optical devices for assisting the human eye. Other chapters consider the different types of compound microscopes and describe the single-lens or simple microscopes. This book discusses as well the development of the mechanical aspect of the microscope that resulted in a vast increase in the professional use of the microscope. The final chapter deals with the development of electron microscopes. This book is a valuable resource for medical students, scientists, and specialist workers in all fields of industry.
Publisher: Elsevier
ISBN: 1483138976
Category : Nature
Languages : en
Pages : 283
Book Description
The Microscope: Past and Present discusses the best methods of using microscope. This book presents a concise account of the development of this valuable tool, which is used at some time or another by almost every scientist. Comprised of seven chapters, this book begins with an overview of the factors that stimulated the rapid progress in microscopy. This text then describes the immense importance of the work of Robert Hooke in the development of optical devices for assisting the human eye. Other chapters consider the different types of compound microscopes and describe the single-lens or simple microscopes. This book discusses as well the development of the mechanical aspect of the microscope that resulted in a vast increase in the professional use of the microscope. The final chapter deals with the development of electron microscopes. This book is a valuable resource for medical students, scientists, and specialist workers in all fields of industry.
Under the Microscope
Author: William J. Croft
Publisher: World Scientific
ISBN: 9810237812
Category : Science
Languages : en
Pages : 153
Book Description
This is a brief history of the development of microscopy, from the use of beads and water droplets in ancient Greece, through the simple magnifying glass, to the modern compound microscope. The technology and optical theory are developed in a straightforward manner, and this leads to a description and explanation of the most modern technologies in electron microscopy, and scanning electron microscopy as well as the new scanning probe microscopies. A series of very interesting applications of the various microscopic techniques are described. The most recent pioneering techniques in near field and confocal optical microscope technologies are described and evaluated for their future importance.
Publisher: World Scientific
ISBN: 9810237812
Category : Science
Languages : en
Pages : 153
Book Description
This is a brief history of the development of microscopy, from the use of beads and water droplets in ancient Greece, through the simple magnifying glass, to the modern compound microscope. The technology and optical theory are developed in a straightforward manner, and this leads to a description and explanation of the most modern technologies in electron microscopy, and scanning electron microscopy as well as the new scanning probe microscopies. A series of very interesting applications of the various microscopic techniques are described. The most recent pioneering techniques in near field and confocal optical microscope technologies are described and evaluated for their future importance.
Scanning Electron Microscopy and X-Ray Microanalysis
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Under the Microscope
Author: Jeremy Burgess
Publisher: CUP Archive
ISBN: 9780521399401
Category : Science
Languages : en
Pages : 212
Book Description
"A celebration of the hidden beauty & variety of microscopic imagery."--Back cover.
Publisher: CUP Archive
ISBN: 9780521399401
Category : Science
Languages : en
Pages : 212
Book Description
"A celebration of the hidden beauty & variety of microscopic imagery."--Back cover.
Quantitative Imaging in Cell Biology
Author:
Publisher: Academic Press
ISBN: 0124202012
Category : Science
Languages : en
Pages : 609
Book Description
This new volume, number 123, of Methods in Cell Biology looks at methods for quantitative imaging in cell biology. It covers both theoretical and practical aspects of using optical fluorescence microscopy and image analysis techniques for quantitative applications. The introductory chapters cover fundamental concepts and techniques important for obtaining accurate and precise quantitative data from imaging systems. These chapters address how choice of microscope, fluorophores, and digital detector impact the quality of quantitative data, and include step-by-step protocols for capturing and analyzing quantitative images. Common quantitative applications, including co-localization, ratiometric imaging, and counting molecules, are covered in detail. Practical chapters cover topics critical to getting the most out of your imaging system, from microscope maintenance to creating standardized samples for measuring resolution. Later chapters cover recent advances in quantitative imaging techniques, including super-resolution and light sheet microscopy. With cutting-edge material, this comprehensive collection is intended to guide researchers for years to come. Covers sections on model systems and functional studies, imaging-based approaches and emerging studies Chapters are written by experts in the field Cutting-edge material
Publisher: Academic Press
ISBN: 0124202012
Category : Science
Languages : en
Pages : 609
Book Description
This new volume, number 123, of Methods in Cell Biology looks at methods for quantitative imaging in cell biology. It covers both theoretical and practical aspects of using optical fluorescence microscopy and image analysis techniques for quantitative applications. The introductory chapters cover fundamental concepts and techniques important for obtaining accurate and precise quantitative data from imaging systems. These chapters address how choice of microscope, fluorophores, and digital detector impact the quality of quantitative data, and include step-by-step protocols for capturing and analyzing quantitative images. Common quantitative applications, including co-localization, ratiometric imaging, and counting molecules, are covered in detail. Practical chapters cover topics critical to getting the most out of your imaging system, from microscope maintenance to creating standardized samples for measuring resolution. Later chapters cover recent advances in quantitative imaging techniques, including super-resolution and light sheet microscopy. With cutting-edge material, this comprehensive collection is intended to guide researchers for years to come. Covers sections on model systems and functional studies, imaging-based approaches and emerging studies Chapters are written by experts in the field Cutting-edge material
X-Ray Microscopy
Author: Chris Jacobsen
Publisher: Cambridge University Press
ISBN: 1107076579
Category : Medical
Languages : en
Pages : 594
Book Description
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
Publisher: Cambridge University Press
ISBN: 1107076579
Category : Medical
Languages : en
Pages : 594
Book Description
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
Transmission Electron Microscopy
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Atom Probe Microscopy
Author: Baptiste Gault
Publisher: Springer Science & Business Media
ISBN: 146143436X
Category : Technology & Engineering
Languages : en
Pages : 411
Book Description
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Publisher: Springer Science & Business Media
ISBN: 146143436X
Category : Technology & Engineering
Languages : en
Pages : 411
Book Description
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Science of Microscopy
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
ISBN: 0387497625
Category : Technology & Engineering
Languages : en
Pages : 1336
Book Description
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Publisher: Springer Science & Business Media
ISBN: 0387497625
Category : Technology & Engineering
Languages : en
Pages : 1336
Book Description
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.