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Author: Jay L. Bucher
Publisher:
ISBN: 9780873898386
Category : Calibration
Languages : en
Pages : 0
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Book Description
"The Measurement Quality Division, ASQ."
Author: Jay L. Bucher
Publisher:
ISBN: 9780873898386
Category : Calibration
Languages : en
Pages : 0
Get Book Here
Book Description
"The Measurement Quality Division, ASQ."
Author: Horst Czichos
Publisher: Springer Science & Business Media
ISBN: 3642166415
Category : Technology & Engineering
Languages : en
Pages : 1244
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Book Description
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Author: Jay L. Bucher
Publisher: Asq Press
ISBN: 9780873896207
Category : Nature
Languages : en
Pages : 544
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Book Description
Many of the topics listed in the Certified Calibration Technician (CCT) Body of Knowledge are presented in this comprehensive book which serves as an excellent reference to prepare for the certification exam. This book provides an overview of metrology and calibration principles and practices geared towards intermediate and advanced users with a basic understanding of the subject matter. Examples and figures are used throughout the book to aid in practical application of the material along with a list of helpful acronyms and abbreviations, a glossary of terms, and a bibliography for easy reference. Preview a sample chapter from this book along with the full table of contents by clicking here. You will need Adobe Acrobat to view this pdf file.
Author:
Publisher:
ISBN: 9788174890382
Category : Calibration
Languages : en
Pages : 540
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Book Description
Author: Nobuo Suga
Publisher:
ISBN: 9780955613319
Category : Measuring instruments
Languages : en
Pages : 0
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Book Description
Author: Alain C. Diebold
Publisher: CRC Press
ISBN: 0203904540
Category : Technology & Engineering
Languages : en
Pages : 703
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Book Description
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Author: Kevin Harding
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
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Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
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Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author: Adedeji B. Badiru
Publisher: CRC Press
ISBN: 1482225239
Category : Technology & Engineering
Languages : en
Pages : 706
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Book Description
Planning, measuring, and paying attention to details form the basis for all successful engineering operations. Measurements pervade everything we do and must be viewed from a systems perspective. A comprehensive all-encompassing guide to measurements, Handbook of Measurements: Benchmarks for Systems Accuracy and Precision focuses on high-level engineering computations essential for benchmarks and technical innovation. The book uses a systems framework and a technically rigorous approach to systems linking of measurements—an approach that sets it apart from other handbooks. The popular saying "measure twice and cut once" bears out the importance of measurements in human endeavors. This handbook covers both qualitative and quantitative topics of measurement. It opens with a chapter on the fundamentals of measurement and includes coverage of human-centric measurements, such as measurement of personnel productivity and contractor performance. It concludes with three appendices on measurement, references, conversion factors, equations, formulas, and statistics for measurement. It is well understood that humans cannot manage anything that cannot be measured. All elements involved in our day-to-day decision making involve some form of measurement, whether in the kitchen, retail, sports, service operations, geographical exploration, health care delivery, worker productivity, clothing design, engineering product design, or space craft launching. Measuring an attribute of a system and then analyzing it against some standard, some specification, some best practice, or some benchmark empower a decision maker to take appropriate and timely actions. This book gives you a guide for sustainable practices to ensure accurate measurements, helping you make decisions backed by metrics.
Author: Waldemar Nawrocki
Publisher: Springer
ISBN: 3319156691
Category : Technology & Engineering
Languages : en
Pages : 287
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Book Description
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
