The Measurement of Strain Fields by X-Ray Topographic Contour Mapping PDF Download

Author: S. R. Stock
Publisher:
ISBN:
Category :
Languages : en
Pages : 37

Get Book Here

Book Description
X-ray diffraction topography offers unique advantages for imaging dislocations and accumulated plastic deformation in single crystals. X-ray diffraction is much more sensitive to strains and samples larger volumes of material than does electron microscopy. Also, topography can be used non-destructively to examine a single specimen many times during the course of an experiment. With the advent of synchrotron radiation sources and of rapid imaging systems for laboratory sources, the emphasis in applying x-ray topography is shifting from characterization studies to dynamic, in-situ observation of experiments. One such application is observation of plastic deformation during tensile or bending tests. An x-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white x-radiation. Results are reported for some components of the deformation field surrounding a precipitate of beta-NbH. Possible applications of contour mapping are discussed.