Author: S. K. Haynes
Publisher:
ISBN:
Category : Evaporation
Languages : en
Pages : 6
Book Description
The Evaporation of Gallium
Author: S. K. Haynes
Publisher:
ISBN:
Category : Evaporation
Languages : en
Pages : 6
Book Description
Publisher:
ISBN:
Category : Evaporation
Languages : en
Pages : 6
Book Description
Thin Films of Gallium Antimonide by Flash Evaporation
Author: Patrick Randall Ryall
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 104
Book Description
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 104
Book Description
Examination of the growth and evaporation of gallium arsenide (001) using reflection high energy electron diffraction
Author: James M. Van Hove
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
System for Bulk Growth of Gallium Nitride. Vapor Phase Epitaxy of Gallium Nitride by Gallium Arc Evaporation
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 17
Book Description
A vapor phase growth system intended for the growth of bulk gallium nitride crystals was investigated. Potential advantages of the growth technique are cheap source materials of high purity, no corrosive gasses, and low operating and equipment costs. Ga contained in a crucible was evaporated by an arc discharge between a W-electrode and the Ga surface, and was transported to the growth zone by a carrier gas flowing over the Ga source. After mixing with ammonia, the mixture was passed between a top and a bottom susceptor, on which samples were mounted. High growth rates as high as 30 micrometers/hr were obtained on the top sample. The surface of deposited material was rough near the front of the susceptor, but was specular elsewhere and showed step-flow growth morphology in atomic force microscopy. The bottom sample experienced lower growth rates and a high density of macroscopic defects, presumably caused by Ga droplets in the gas phase. Computer flow dynamic simulations predicted growth rates 4 times higher than experiments. The discrepancy was attributed to ammonia pre-reactions, based on the experimental growth rate dependence on ammonia partial pressure. An additional factor 4 reduction in efficiency was due to Ga wall condensation between the evaporation and growth zones. The overall growth efficiency was 2 %.
Publisher:
ISBN:
Category :
Languages : en
Pages : 17
Book Description
A vapor phase growth system intended for the growth of bulk gallium nitride crystals was investigated. Potential advantages of the growth technique are cheap source materials of high purity, no corrosive gasses, and low operating and equipment costs. Ga contained in a crucible was evaporated by an arc discharge between a W-electrode and the Ga surface, and was transported to the growth zone by a carrier gas flowing over the Ga source. After mixing with ammonia, the mixture was passed between a top and a bottom susceptor, on which samples were mounted. High growth rates as high as 30 micrometers/hr were obtained on the top sample. The surface of deposited material was rough near the front of the susceptor, but was specular elsewhere and showed step-flow growth morphology in atomic force microscopy. The bottom sample experienced lower growth rates and a high density of macroscopic defects, presumably caused by Ga droplets in the gas phase. Computer flow dynamic simulations predicted growth rates 4 times higher than experiments. The discrepancy was attributed to ammonia pre-reactions, based on the experimental growth rate dependence on ammonia partial pressure. An additional factor 4 reduction in efficiency was due to Ga wall condensation between the evaporation and growth zones. The overall growth efficiency was 2 %.
Vapor Phase Etching Kinetics of Gallium Phosphide
Author: Carlos Figueroa Ibarra
Publisher:
ISBN:
Category :
Languages : en
Pages : 190
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 190
Book Description
The Chemistry of Gallium
Author: Ivan Arsentʹevich Sheka
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 320
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 320
Book Description
Atom Probe Tomography
Author: Williams Lefebvre
Publisher: Academic Press
ISBN: 0128047453
Category : Science
Languages : en
Pages : 418
Book Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Publisher: Academic Press
ISBN: 0128047453
Category : Science
Languages : en
Pages : 418
Book Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Gallium Oxide
Author: W. Morris
Publisher:
ISBN:
Category : Gallium compounds
Languages : en
Pages : 18
Book Description
Publisher:
ISBN:
Category : Gallium compounds
Languages : en
Pages : 18
Book Description
The American Journal of Science
Author:
Publisher:
ISBN:
Category : Earth sciences
Languages : en
Pages : 1086
Book Description
Publisher:
ISBN:
Category : Earth sciences
Languages : en
Pages : 1086
Book Description
Advanced Nano Deposition Methods
Author: Yuan Lin
Publisher: John Wiley & Sons
ISBN: 3527696458
Category : Technology & Engineering
Languages : en
Pages : 328
Book Description
This concise reference summarizes the latest results in nano-structured thin films, the first to discuss both deposition methods and electronic applications in detail. Following an introduction to this rapidly developing field, the authors present a variety of organic and inorganic materials along with new deposition techniques, and conclude with an overview of applications and considerations for their technology deployment.
Publisher: John Wiley & Sons
ISBN: 3527696458
Category : Technology & Engineering
Languages : en
Pages : 328
Book Description
This concise reference summarizes the latest results in nano-structured thin films, the first to discuss both deposition methods and electronic applications in detail. Following an introduction to this rapidly developing field, the authors present a variety of organic and inorganic materials along with new deposition techniques, and conclude with an overview of applications and considerations for their technology deployment.