Scientific and Technical Aerospace Reports PDF Download
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1736
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Author:
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ISBN:
Category : Research
Languages : en
Pages : 1220
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Book Description
Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.
Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329
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Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Yves Arden
Publisher: Routledge
ISBN: 1134831633
Category : Reference
Languages : en
Pages : 866
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Book Description
The French-English volume of this highly acclaimed set consists of some 100,000 keywords in both French and English, drawn from the whole range of modern applied science and technical terminology. Covers over 70 subject areas, from engineering and chemistry to packaging, transportation, data processing and much more.
Author: Xenia Klinger
Publisher:
ISBN: 9780662191384
Category : City planning
Languages : en
Pages : 79
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1394
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Author: Debbie Stokes
Publisher: John Wiley & Sons
ISBN: 0470065400
Category : Science
Languages : en
Pages : 247
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Book Description
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
Author:
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ISBN:
Category : Cardiology
Languages : en
Pages : 566
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Author:
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ISBN:
Category : Crystallography
Languages : fr
Pages : 658
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