Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits PDF Download
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Author: Yichuang Sun
Publisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
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Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Yichuang Sun
Publisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
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Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Jose Luis Huertas Díaz
Publisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author: Jon S. Wilson
Publisher: Newnes
ISBN: 0750677295
Category : Business & Economics
Languages : en
Pages : 706
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Book Description
Sensor fundamentals -- Application considerations -- Measurement issues and criteria -- Sensor signal conditioning -- Acceleration, shock and vibration sensors -- Biosensors -- Chemical sensors -- Capacitive and inductive displacement sensors -- Electromagnetism in sensing -- Flow and level sensors -- Force, load and weight sensors -- Humidity sensors -- Machinery vibration monitoring sensors -- Optical and radiation sensors -- Position and motion sensors -- Pressure sensors -- Sensors for mechanical shock -- Test and measurement microphones -- Strain gages -- Temperature sensors -- Nanotechnology-enabled sensors -- Wireless sensor networks: principles and applications.
Author: Jess Chen
Publisher: Lulu.com
ISBN: 130003520X
Category : Technology & Engineering
Languages : en
Pages : 410
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Book Description
This book, the Mixed-signal Methodology Guide: Advanced Methodology for AMS IP and SoC Design, Verification, and Implementation provides a broad overview of the design, verification and implementation methodologies required for today's mixed-signal designs. The book covers mixed-signal design trends and challenges, abstraction of analog using behavioral models, assertion-based metric-driven verification methodology applied on analog and mixed-signal and verification of low power intent in mixed-signal design. It also describes methodology for physical implementation in context of concurrent mixed-signal design and for handling advanced node physical effects. The book contains many practical examples of models and techniques. The authors believe it should serve as a reference to many analog, digital and mixed-signal designers, verification, physical implementation engineers and managers in their pursuit of information for a better methodology required to address the challenges of modern mixed-signal design.
Author: Ibrahim (Abe) M. Elfadel
Publisher: Springer
ISBN: 3030046664
Category : Technology & Engineering
Languages : en
Pages : 697
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Book Description
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Author: Sandeep Saini
Publisher: CRC Press
ISBN: 1000523810
Category : Technology & Engineering
Languages : en
Pages : 329
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Book Description
Machine learning is a potential solution to resolve bottleneck issues in VLSI via optimizing tasks in the design process. This book aims to provide the latest machine-learning–based methods, algorithms, architectures, and frameworks designed for VLSI design. The focus is on digital, analog, and mixed-signal design techniques, device modeling, physical design, hardware implementation, testability, reconfigurable design, synthesis and verification, and related areas. Chapters include case studies as well as novel research ideas in the given field. Overall, the book provides practical implementations of VLSI design, IC design, and hardware realization using machine learning techniques. Features: Provides the details of state-of-the-art machine learning methods used in VLSI design Discusses hardware implementation and device modeling pertaining to machine learning algorithms Explores machine learning for various VLSI architectures and reconfigurable computing Illustrates the latest techniques for device size and feature optimization Highlights the latest case studies and reviews of the methods used for hardware implementation This book is aimed at researchers, professionals, and graduate students in VLSI, machine learning, electrical and electronic engineering, computer engineering, and hardware systems.
Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1482254638
Category : Technology & Engineering
Languages : en
Pages : 665
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Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: Tertulien Ndjountche
Publisher: CRC Press
ISBN: 0429850409
Category : Technology & Engineering
Languages : en
Pages : 1178
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Book Description
High-speed, power-efficient analog integrated circuits can be used as standalone devices or to interface modern digital signal processors and micro-controllers in various applications, including multimedia, communication, instrumentation, and control systems. New architectures and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip design, which merges analog circuits with digital, and radio-frequency components.
Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183
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Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author: Zoran Stamenkovic
Publisher: World Scientific
ISBN: 981121073X
Category : Computers
Languages : en
Pages : 430
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Book Description
Today's integrated silicon circuits and systems for wireless communications are of a huge complexity.This unique compendium covers all the steps (from the system-level to the transistor-level) necessary to design, model, verify, implement, and test a silicon system. It bridges the gap between the system-world and the transistor-world (between communication, system, circuit, device, and test engineers).It is extremely important nowadays (and will be more important in the future) for communication, system, and circuit engineers to understand the physical implications of system and circuit solutions based on hardware/software co-design as well as for device and test engineers to cope with the system and circuit requirements in terms of power, speed, and data throughput.Related Link(s)
