Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits PDF Download
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Author: Yichuang Sun
Publisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
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Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Yichuang Sun
Publisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
Get Book Here
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Jose Luis Huertas Díaz
Publisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1482254638
Category : Technology & Engineering
Languages : en
Pages : 644
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Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: Yangyuan Wang
Publisher: Springer Nature
ISBN: 9819928362
Category : Technology & Engineering
Languages : en
Pages : 2006
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Book Description
Written by hundreds experts who have made contributions to both enterprise and academics research, these excellent reference books provide all necessary knowledge of the whole industrial chain of integrated circuits, and cover topics related to the technology evolution trends, fabrication, applications, new materials, equipment, economy, investment, and industrial developments of integrated circuits. Especially, the coverage is broad in scope and deep enough for all kind of readers being interested in integrated circuit industry. Remarkable data collection, update marketing evaluation, enough working knowledge of integrated circuit fabrication, clear and accessible category of integrated circuit products, and good equipment insight explanation, etc. can make general readers build up a clear overview about the whole integrated circuit industry. This encyclopedia is designed as a reference book for scientists and engineers actively involved in integrated circuit research and development field. In addition, this book provides enough guide lines and knowledges to benefit enterprisers being interested in integrated circuit industry.
Author: Patrick Gaydecki
Publisher: IET
ISBN: 0852964315
Category : Technology & Engineering
Languages : en
Pages : 485
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Book Description
This book covers the basic theoretical, algorithmic and real-time aspects of digital signal processing (DSP). Detailed information is provided on off-line, real-time and DSP programming and the reader is effortlessly guided through advanced topics such as DSP hardware design, FIR and IIR filter design and difference equation manipulation.
Author: C.C. Marouchos
Publisher: IET
ISBN: 086341351X
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
"This new book demonstrates the usefulness of the switching function in analyzing power electronic circuits in the steady state. A procedure is suggested for the effective application of this method for the analysis of all types of power electronic circuits."--BOOK JACKET.
Author: Institution of Electrical Engineers
Publisher: IET
ISBN: 0852964439
Category : Technology & Engineering
Languages : en
Pages : 304
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Book Description
This book examines integrated circuits, systems and transceivers for wireless and mobile communications. It covers the most recent developments in key RF, IF, analogue, mixed-signal components and single-chip transceivers in CMOS technology.
Author: Bashir M. Al-Hashimi
Publisher: IET
ISBN: 0863415520
Category : Technology & Engineering
Languages : en
Pages : 940
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Book Description
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Author: S.M. Vaezi-Nejad
Publisher: IET
ISBN: 0852967799
Category : Science
Languages : en
Pages : 266
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Book Description
Vaezi-Nejad (electronics and measurements, U. of Greenwich, London, England) has assembled a textbook that will be useful to graduate students and engineers on advanced solid state and fiber optic sensors, with each chapter written by a specialist in that area, and a lengthy introduction by the editor. The topics covered are: measurement and instrumentation systems based on optical techniques; amplitude, wavelength, phase and polarization modulating sensors; amorphous semiconductor photoreceptors and X-ray image sensors; dielectrophoretic sensors for microbiological applications; electrically conducting polymers for sensing volatile chemicals, and thin film (CIAIPc) phthalocyanine gas sensors. c. Book News Inc.
Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183
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Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
