Author: Eishi H. Ibe
Publisher: John Wiley & Sons
ISBN: 1118479297
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Author: Eishi H. Ibe
Publisher: John Wiley & Sons
ISBN: 1118479297
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Publisher: John Wiley & Sons
ISBN: 1118479297
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
VLSI Design and Test for Systems Dependability
Author: Shojiro Asai
Publisher: Springer
ISBN: 4431565949
Category : Technology & Engineering
Languages : en
Pages : 792
Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Publisher: Springer
ISBN: 4431565949
Category : Technology & Engineering
Languages : en
Pages : 792
Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Next-Generation ADCs, High-Performance Power Management, and Technology Considerations for Advanced Integrated Circuits
Author: Andrea Baschirotto
Publisher: Springer Nature
ISBN: 3030252671
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
This book is based on the 18 tutorials presented during the 28th workshop on Advances in Analog Circuit Design. Expert designers present readers with information about a variety of topics at the frontier of analog circuit design, including next-generation analog-to-digital converters , high-performance power management systems and technology considerations for advanced IC design. For anyone involved in analog circuit research and development, this book will be a valuable summary of the state-of-the-art in these areas. Provides a summary of the state-of-the-art in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of next-generation analog-to-digital converters, high-performance power management systems, and technology considerations for advanced IC design.
Publisher: Springer Nature
ISBN: 3030252671
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
This book is based on the 18 tutorials presented during the 28th workshop on Advances in Analog Circuit Design. Expert designers present readers with information about a variety of topics at the frontier of analog circuit design, including next-generation analog-to-digital converters , high-performance power management systems and technology considerations for advanced IC design. For anyone involved in analog circuit research and development, this book will be a valuable summary of the state-of-the-art in these areas. Provides a summary of the state-of-the-art in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of next-generation analog-to-digital converters, high-performance power management systems, and technology considerations for advanced IC design.
Principles Of Radiation Interaction In Matter And Detection (3rd Edition)
Author: Claude Leroy
Publisher: World Scientific
ISBN: 9814458465
Category : Science
Languages : en
Pages : 1041
Book Description
This book, like the first and second editions, addresses the fundamental principles of interaction between radiation and matter and the principles of particle detection and detectors in a wide scope of fields, from low to high energy, including space physics and medical environment. It provides abundant information about the processes of electromagnetic and hadronic energy deposition in matter, detecting systems, performance of detectors and their optimization.The third edition includes additional material covering, for instance: mechanisms of energy loss like the inverse Compton scattering, corrections due to the Landau-Pomeranchuk-Migdal effect, an extended relativistic treatment of nucleus-nucleus screened Coulomb scattering, and transport of charged particles inside the heliosphere. Furthermore, the displacement damage (NIEL) in semiconductors has been revisited to account for recent experimental data and more comprehensive comparisons with results previously obtained.This book will be of great use to graduate students and final-year undergraduates as a reference and supplement for courses in particle, astroparticle, space physics and instrumentation. A part of the book is directed toward courses in medical physics. The book can also be used by researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation.
Publisher: World Scientific
ISBN: 9814458465
Category : Science
Languages : en
Pages : 1041
Book Description
This book, like the first and second editions, addresses the fundamental principles of interaction between radiation and matter and the principles of particle detection and detectors in a wide scope of fields, from low to high energy, including space physics and medical environment. It provides abundant information about the processes of electromagnetic and hadronic energy deposition in matter, detecting systems, performance of detectors and their optimization.The third edition includes additional material covering, for instance: mechanisms of energy loss like the inverse Compton scattering, corrections due to the Landau-Pomeranchuk-Migdal effect, an extended relativistic treatment of nucleus-nucleus screened Coulomb scattering, and transport of charged particles inside the heliosphere. Furthermore, the displacement damage (NIEL) in semiconductors has been revisited to account for recent experimental data and more comprehensive comparisons with results previously obtained.This book will be of great use to graduate students and final-year undergraduates as a reference and supplement for courses in particle, astroparticle, space physics and instrumentation. A part of the book is directed toward courses in medical physics. The book can also be used by researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation.
Principles of Radiation Interaction in Matter and Detection
Author: Claude Leroy
Publisher: World Scientific
ISBN: 9812818286
Category : Science
Languages : en
Pages : 951
Book Description
This book, like its first edition, addresses the fundamental principles of interaction between radiation and matter and the principle of particle detectors in a wide scope of fields, from low to high energy, including space physics and the medical environment. It provides abundant information about the processes of electromagnetic and hadronic energy deposition in matter, detecting systems, and performance and optimization of detectors. In this second edition, new sections dedicated to the following topics are included: space and high-energy physics radiation environment, non-ionizing energy loss (NIEL), displacement damage in silicon devices and detectors, single event effects, detection of slow and fast neutrons with silicon detectors, solar cells, pixel detectors, and additional material for dark matter detectors. This book will benefit graduate students and final-year undergraduates as a reference and supplement for courses in particle, astroparticle, and space physics and instrumentation. A part of it is directed toward courses in medical physics. The book can also be used by researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation.
Publisher: World Scientific
ISBN: 9812818286
Category : Science
Languages : en
Pages : 951
Book Description
This book, like its first edition, addresses the fundamental principles of interaction between radiation and matter and the principle of particle detectors in a wide scope of fields, from low to high energy, including space physics and the medical environment. It provides abundant information about the processes of electromagnetic and hadronic energy deposition in matter, detecting systems, and performance and optimization of detectors. In this second edition, new sections dedicated to the following topics are included: space and high-energy physics radiation environment, non-ionizing energy loss (NIEL), displacement damage in silicon devices and detectors, single event effects, detection of slow and fast neutrons with silicon detectors, solar cells, pixel detectors, and additional material for dark matter detectors. This book will benefit graduate students and final-year undergraduates as a reference and supplement for courses in particle, astroparticle, and space physics and instrumentation. A part of it is directed toward courses in medical physics. The book can also be used by researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation.
Electrical & Electronics Abstracts
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1860
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1860
Book Description
Semiconductor TeraHertz Technology
Author: Guillermo Carpintero
Publisher: John Wiley & Sons
ISBN: 1118920422
Category : Technology & Engineering
Languages : en
Pages : 426
Book Description
Key advances in Semiconductor Terahertz (THz) Technology now promises important new applications enabling scientists and engineers to overcome the challenges of accessing the so-called "terahertz gap". This pioneering reference explains the fundamental methods and surveys innovative techniques in the generation, detection and processing of THz waves with solid-state devices, as well as illustrating their potential applications in security and telecommunications, among other fields. With contributions from leading experts, Semiconductor Terahertz Technology: Devices and Systems at Room Temperature Operation comprehensively and systematically covers semiconductor-based room temperature operating sources such as photomixers, THz antennas, radiation concepts and THz propagation as well as room-temperature operating THz detectors. The second part of the book focuses on applications such as the latest photonic and electronic THz systems as well as emerging THz technologies including: whispering gallery resonators, liquid crystals, metamaterials and graphene-based devices. This book will provide support for practicing researchers and professionals and will be an indispensable reference to graduate students in the field of THz technology. Key features: Includes crucial theoretical background sections to photomixers, photoconductive switches and electronic THz generation & detection. Provides an extensive overview of semiconductor-based THz sources and applications. Discusses vital technologies for affordable THz applications. Supports teaching and studying increasingly popular courses on semiconductor THz technology.
Publisher: John Wiley & Sons
ISBN: 1118920422
Category : Technology & Engineering
Languages : en
Pages : 426
Book Description
Key advances in Semiconductor Terahertz (THz) Technology now promises important new applications enabling scientists and engineers to overcome the challenges of accessing the so-called "terahertz gap". This pioneering reference explains the fundamental methods and surveys innovative techniques in the generation, detection and processing of THz waves with solid-state devices, as well as illustrating their potential applications in security and telecommunications, among other fields. With contributions from leading experts, Semiconductor Terahertz Technology: Devices and Systems at Room Temperature Operation comprehensively and systematically covers semiconductor-based room temperature operating sources such as photomixers, THz antennas, radiation concepts and THz propagation as well as room-temperature operating THz detectors. The second part of the book focuses on applications such as the latest photonic and electronic THz systems as well as emerging THz technologies including: whispering gallery resonators, liquid crystals, metamaterials and graphene-based devices. This book will provide support for practicing researchers and professionals and will be an indispensable reference to graduate students in the field of THz technology. Key features: Includes crucial theoretical background sections to photomixers, photoconductive switches and electronic THz generation & detection. Provides an extensive overview of semiconductor-based THz sources and applications. Discusses vital technologies for affordable THz applications. Supports teaching and studying increasingly popular courses on semiconductor THz technology.
Directory of Published Proceedings
Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 408
Book Description
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 408
Book Description
Journal of Communications Technology & Electronics
Author:
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 782
Book Description
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 782
Book Description
Index to IEEE Publications
Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 1234
Book Description
Issues for 1973- cover the entire IEEE technical literature.
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 1234
Book Description
Issues for 1973- cover the entire IEEE technical literature.