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Author: British Standards Institute Staff
Publisher:
ISBN: 9780580613180
Category :
Languages : en
Pages :
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Book Description
Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580613180
Category :
Languages : en
Pages :
Get Book Here
Book Description
Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author: A. Di Giuseppe
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
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Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Author: Samir Mekid
Publisher: John Wiley & Sons
ISBN: 1119721733
Category : Technology & Engineering
Languages : en
Pages : 404
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Book Description
Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
Author: Gerald Gerlach
Publisher: Springer Science & Business Media
ISBN: 3642285228
Category : Technology & Engineering
Languages : en
Pages : 619
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Book Description
This book discusses future trends and developments in electron device packaging and the opportunities of nano and bio techniques as future solutions. It describes the effect of nano-sized particles and cell-based approaches for packaging solutions with their diverse requirements. It offers a comprehensive overview of nano particles and nano composites and their application as packaging functions in electron devices. The importance and challenges of three-dimensional design and computer modeling in nano packaging is discussed; also ways for implementation are described. Solutions for unconventional packaging solutions for metallizations and functionalized surfaces as well as new packaging technologies with high potential for industrial applications are discussed. The book brings together a comprehensive overview of nano scale components and systems comprising electronic, mechanical and optical structures and serves as important reference for industrial and academic researchers.
Author: Alan S. Morris
Publisher: Academic Press
ISBN: 0128171421
Category : Technology & Engineering
Languages : en
Pages : 737
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Book Description
Measurement and Instrumentation: Theory and Application, Third Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. Providing the most balanced coverage of measurement theory/technologies and instrumentation, this clearly and comprehensively written text arms students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. - Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation - Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays and interfaces - Includes significant material on data acquisition and signal processing with LabVIEW - New sections in this updated edition include an expansion of sections on MEMS and electrical safety, new illustrations, including more photos of real devices, and more worked examples and end-of-chapter problems
Author: Vladimir Murashov
Publisher: Springer Science & Business Media
ISBN: 1441978534
Category : Technology & Engineering
Languages : en
Pages : 269
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Book Description
Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK
Author: Robert Kelsall
Publisher: John Wiley & Sons
ISBN: 0470020865
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
Nanotechnology is a vital new area of research and development addressing the control, modification and fabrication of materials, structures and devices with nanometre precision and the synthesis of such structures into systems of micro- and macroscopic dimensions. Future applications of nanoscale science and technology include motors smaller than the diameter of a human hair and single-celled organisms programmed to fabricate materials with nanometer precision. Miniaturisation has revolutionised the semiconductor industry by making possible inexpensive integrated electronic circuits comprised of devices and wires with sub-micrometer dimensions. These integrated circuits are now ubiquitous, controlling everything from cars to toasters. The next level of miniaturisation, beyond sub-micrometer dimensions into nanoscale dimensions (invisible to the unaided human eye) is a booming area of research and development. This is a very hot area of research with large amounts of venture capital and government funding being invested worldwide, as such Nanoscale Science and Technology has a broad appeal based upon an interdisciplinary approach, covering aspects of physics, chemistry, biology, materials science and electronic engineering. Kelsall et al present a coherent approach to nanoscale sciences, which will be invaluable to graduate level students and researchers and practising engineers and product designers.
Author: Richard Leach
Publisher: William Andrew
ISBN: 1437778321
Category : Technology & Engineering
Languages : en
Pages : 349
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Book Description
Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge
Author: Richard Leach
Publisher: Elsevier
ISBN: 1455777501
Category : Science
Languages : en
Pages : 384
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Book Description
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations
Author: Wendong Zhang
Publisher: John Wiley & Sons
ISBN: 1118717961
Category : Technology & Engineering
Languages : en
Pages : 341
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Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
