Compendium of Surface and Interface Analysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Compendium of Surface and Interface Analysis PDF full book. Access full book title Compendium of Surface and Interface Analysis by The Surface Science Society of Japan. Download full books in PDF and EPUB format.
Author: The Surface Science Society of Japan
Publisher: Springer
ISBN: 9811061564
Category : Technology & Engineering
Languages : en
Pages : 807
Get Book Here
Book Description
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Author: The Surface Science Society of Japan
Publisher: Springer
ISBN: 9811061564
Category : Technology & Engineering
Languages : en
Pages : 807
Get Book Here
Book Description
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Author: Rich Lysakowski
Publisher: ASTM International
ISBN: 0803118767
Category : Chemistry
Languages : en
Pages : 166
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 324
Get Book Here
Book Description
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273815
Category : Science
Languages : en
Pages : 545
Get Book Here
Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 716
Get Book Here
Book Description
Author: https://www.codeofchina.com
Publisher: https://www.codeofchina.com
ISBN:
Category : Architecture
Languages : en
Pages : 571
Get Book Here
Book Description
HTTPS://WWW.CODEOFCHINA.COM EMAIL:
[email protected] "Codeofchina Inc., a part of TransForyou (Beijing) Translation Co., Ltd., is a professional Chinese code translator in China. Now, Codeofchina Inc. is running a professional Chinese code website, www.codeofchina.com. Through this website, Codeofchina Inc. provides English-translated Chinese codes to clients worldwide. About TransForyou TransForyou (Beijing) Translation Co., Ltd., established in 2003, is a reliable language service provider for clients at home and abroad. Since our establishment, TransForyou has been aiming to build up a translation brand with our professional dedicated service. Currently, TransForyou is the director of China Association of Engineering Construction Standardization (CECS); the committeeman of Localization Service Committee / Translators Association of China (TAC) and the member of Boya Translation Culture Salon (BTCS); and the field study center of the University of the University of International Business & Economics (UIBE) and Hebei University (HU). In 2016, TransForyou ranked 27th among Asian Language Service Providers by Common Sense Advisory. "
Author: Dr. Meng Yongye CODEOFCHINA
Publisher: Codeofchina Inc.
ISBN:
Category : Architecture
Languages : en
Pages : 3955
Get Book Here
Book Description
All English-translated Chinese codes are available at: www.codeofchina.com
Author: Minoru Matsui
Publisher: John Wiley & Sons
ISBN: 1118371496
Category : Technology & Engineering
Languages : en
Pages : 282
Get Book Here
Book Description
This new book presents new ceramic information in two parts. Thefirst section presents state-of-the-art information on newmeasurements and characterization methods in the ceramicmanufacturing process including characterization of mechanicalproperties microstructure, and machining techniques, as well as thestatus on the activity of standards in ceramics. The second part isa selection of peer reviewed research papers in this field. This volume will prove indispensable for academic as well asindustry researchers and for anyone seeking broader knowledge onthe quality improvements through new measurements and processingtechnology.
Author: Elisabeth Mansfield
Publisher: John Wiley & Sons
ISBN: 3527800050
Category : Technology & Engineering
Languages : en
Pages : 630
Get Book Here
Book Description
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author: Phillip Benjamin Abel
Publisher:
ISBN:
Category : FORTRAN (Computer program language)
Languages : en
Pages : 16
Get Book Here
Book Description
