Auger- and X-Ray Photoelectron Spectroscopy in Materials Science PDF Download
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Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273807
Category : Science
Languages : en
Pages : 544
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Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273807
Category : Science
Languages : en
Pages : 544
Get Book Here
Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: John C. Riviere
Publisher: CRC Press
ISBN: 1420007807
Category : Science
Languages : en
Pages : 671
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Book Description
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Klaus Wandelt
Publisher: John Wiley & Sons
ISBN: 3527411569
Category : Science
Languages : en
Pages : 1010
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Book Description
Covering interface science from a novel surface science perspective, this unique handbook offers a comprehensive overview of this burgeoning field. Eight topical volumes cover basic concepts and methods, elemental and composite surfaces, solid-gas, solid-liquid and inorganic biological interfaces, as well as applications of surface science in nanotechnology, materials science and molecular electronics. With its broad scope and clear structure, it is ideal as a reference for scientists in the field, as well as an introduction for newcomers.
Author: Horst Czichos
Publisher: Springer Science & Business Media
ISBN: 3642166415
Category : Technology & Engineering
Languages : en
Pages : 1244
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Book Description
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Author: Wendel Wohlleben
Publisher: CRC Press
ISBN: 1466567880
Category : Science
Languages : en
Pages : 468
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Book Description
The incorporation of nanomaterials into products can improve performance, efficiency, and durability in various fields ranging from construction, energy management, catalysis, microelectronics, plastics, coatings, and paints to consumer articles such as foods and cosmetics. But innovation never comes at zero risk. The potential hazards resulting fr
Author: Kevin Healy
Publisher: Elsevier
ISBN: 0081006926
Category : Technology & Engineering
Languages : en
Pages : 4865
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Book Description
Comprehensive Biomaterials II, Second Edition, Seven Volume Set brings together the myriad facets of biomaterials into one expertly-written series of edited volumes. Articles address the current status of nearly all biomaterials in the field, their strengths and weaknesses, their future prospects, appropriate analytical methods and testing, device applications and performance, emerging candidate materials as competitors and disruptive technologies, research and development, regulatory management, commercial aspects, and applications, including medical applications. Detailed coverage is given to both new and emerging areas and the latest research in more traditional areas of the field. Particular attention is given to those areas in which major recent developments have taken place. This new edition, with 75% new or updated articles, will provide biomedical scientists in industry, government, academia, and research organizations with an accurate perspective on the field in a manner that is both accessible and thorough. Reviews the current status of nearly all biomaterials in the field by analyzing their strengths and weaknesses, performance, and future prospects Covers all significant emerging technologies in areas such as 3D printing of tissues, organs and scaffolds, cell encapsulation; multimodal delivery, cancer/vaccine - biomaterial applications, neural interface understanding, materials used for in situ imaging, and infection prevention and treatment Effectively describes the many modern aspects of biomaterials from basic science, to clinical applications
Author: Fritz H. Frimmel
Publisher: Springer Science & Business Media
ISBN: 3642103189
Category : Science
Languages : en
Pages : 243
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Book Description
As nanotechnology enters everyday life, engineered nanoparticles (ENP) will find their way into nature, including surface and groundwater. Here, distinguished experts of water chemistry present dedicated methods for the analysis of nanoparticles in the aquatic environment, their distribution and fate. This includes the influence of complex matrices such as wastewater, brown water with natural organic matter (NOM), and high salt concentrations as well as available and future standardized methods. The background of geogenic, natural nanoparticles is considered in a discussion of known environmental effects, including strategies to test for potential effects on human and environmental health.
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Social Science
Languages : en
Pages : 2263
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Book Description
This document provides the comprehensive list of Chinese National Standards - Category: GB/T; GBT.
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Social Science
Languages : en
Pages : 371
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Book Description
This document provides the comprehensive list of Chinese National Standards - Category: GB, GB/T Series of year 2013.
