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Author: Bert Keats
Publisher: CRC Press
ISBN: 1000147150
Category : Business & Economics
Languages : en
Pages : 317
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Book Description
This book provides an introduction to statistical process control in automated manufacturing and suggests implementation strategies. It focuses on time series applications in statistical process control and explores the role of knowledge-based systems in process control.
Author: Bert Keats
Publisher: CRC Press
ISBN: 1000147150
Category : Business & Economics
Languages : en
Pages : 317
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Book Description
This book provides an introduction to statistical process control in automated manufacturing and suggests implementation strategies. It focuses on time series applications in statistical process control and explores the role of knowledge-based systems in process control.
Author: William A. Levinson
Publisher: CRC Press
ISBN: 1439820015
Category : Business & Economics
Languages : en
Pages : 272
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Book Description
The normal or bell curve distribution is far more common in statistics textbooks than it is in real factories, where processes follow non-normal and often highly skewed distributions. Statistical Process Control for Real-World Applications shows how to handle non-normal applications scientifically and explain the methodology to suppliers and custom
Author: Xun Xu
Publisher: Springer Science & Business Media
ISBN: 1848827393
Category : Technology & Engineering
Languages : en
Pages : 495
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Book Description
Design and manufacturing is the essential element in any product development lifecycle. Industry vendors and users have been seeking a common language to be used for the entire product development lifecycle that can describe design, manufacturing and other data pertaining to the product. Many solutions were proposed, the most successful being the Stadndard for Exchange of Product model (STEP). STEP provides a mechanism that is capable of describing product data, independent from any particular system. The nature of this description makes it suitable not only for neutral file exchange, but also as a basis for implementing, sharing and archiving product databases. ISO 10303-AP203 is the first and perhaps the most successful AP developed to exchange design data between different CAD systems. Going from geometric data (as in AP203) to features (as in AP224) represents an important step towards having the right type of data in a STEP-based CAD/CAM system. Of particular significance is the publication of STEP-NC, as an extension of STEP to NC, utilising feature-based concepts for CNC machining purposes. The aim of this book is to provide a snapshot of the recent research outcomes and implementation cases in the field of design and manufacturing where STEP is used as the primary data representation protocol. The 20 chapters are contributed by authors from most of the top research teams in the world. These research teams are based in national research institutes, industries as well as universities.
Author: Peihua Qiu
Publisher: CRC Press
ISBN: 1482220415
Category : Business & Economics
Languages : en
Pages : 520
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Book Description
A major tool for quality control and management, statistical process control (SPC) monitors sequential processes, such as production lines and Internet traffic, to ensure that they work stably and satisfactorily. Along with covering traditional methods, Introduction to Statistical Process Control describes many recent SPC methods that improve upon
Author: Bert Keats
Publisher: CRC Press
ISBN: 1000103722
Category : Science
Languages : en
Pages : 313
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Book Description
This book provides an introduction to statistical process control in automated manufacturing and suggests implementation strategies. It focuses on time series applications in statistical process control and explores the role of knowledge-based systems in process control.
Author: Douglas C. Montgomery
Publisher: John Wiley & Sons
ISBN: 1119657113
Category : Einführung
Languages : en
Pages : 773
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Book Description
"Once solely the domain of engineers, quality control has become a vital business operation used to increase productivity and secure competitive advantage. Introduction to Statistical Quality Control offers a detailed presentation of the modern statistical methods for quality control and improvement. Thorough coverage of statistical process control (SPC) demonstrates the efficacy of statistically-oriented experiments in the context of process characterization, optimization, and acceptance sampling, while examination of the implementation process provides context to real-world applications. Emphasis on Six Sigma DMAIC (Define, Measure, Analyze, Improve and Control) provides a strategic problem-solving framework that can be applied across a variety of disciplines.Adopting a balanced approach to traditional and modern methods, this text includes coverage of SQC techniques in both industrial and non-manufacturing settings, providing fundamental knowledge to students of engineering, statistics, business, and management sciences.A strong pedagogical toolset, including multiple practice problems, real-world data sets and examples, provides students with a solid base of conceptual and practical knowledge."--
Author: James Moyne
Publisher: CRC Press
ISBN: 1420040669
Category : Technology & Engineering
Languages : en
Pages : 367
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Book Description
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Author: Kim Phuc Tran
Publisher:
ISBN: 9783030838201
Category :
Languages : en
Pages : 0
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Book Description
This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution. The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes. The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.
Author: National Research Council
Publisher: National Academies Press
ISBN: 0309047846
Category : Technology & Engineering
Languages : en
Pages : 185
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Book Description
To maintain competitiveness in the emerging global economy, U.S. manufacturing must rise to new standards of product quality, responsiveness to customers, and process flexibility. This volume presents a concise and well-organized analysis of new research directions to achieve these goals. Five critical areas receive in-depth analysis of present practices, needed improvement, and research priorities: Advanced engineered materials that offer the prospect of better life-cycle performance and other gains. Equipment reliability and maintenance practices for better returns on capital investment. Rapid product realization techniques to speed delivery to the marketplace. Intelligent manufacturing control for improved reliability and greater precision. Building a workforce with the multidisciplinary skills needed for competitiveness. This sound and accessible analysis will be useful to manufacturing engineers and researchers, business executives, and economic and policy analysts.
Author: Veronica Czitrom
Publisher: SIAM
ISBN: 0898713943
Category : Technology & Engineering
Languages : en
Pages : 510
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Book Description
A selection of studies by professionals in the semiconductor industry illustrating the use of statistical methods to improve manufacturing processes.
