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Author: Alan Wiemann
Publisher: Springer Science & Business Media
ISBN: 0387717331
Category : Technology & Engineering
Languages : en
Pages : 289
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Book Description
The Integrated Circuit (IC) industry has gone without a standardized verification approach for decades. This book defines a uniform, standardizable methodology for verifying the logical behavior of an integrated circuit, whether an I/O controller, a microprocessor, or a complete digital system. This book will help Engineers and managers responsible for IC development to bring a single, standards-based methodology to their R & D efforts, cutting costs and improving results.
Author: Alan Wiemann
Publisher: Springer Science & Business Media
ISBN: 0387717331
Category : Technology & Engineering
Languages : en
Pages : 289
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Book Description
The Integrated Circuit (IC) industry has gone without a standardized verification approach for decades. This book defines a uniform, standardizable methodology for verifying the logical behavior of an integrated circuit, whether an I/O controller, a microprocessor, or a complete digital system. This book will help Engineers and managers responsible for IC development to bring a single, standards-based methodology to their R & D efforts, cutting costs and improving results.
Author: Chris Spear
Publisher: Springer Science & Business Media
ISBN: 146140715X
Category : Technology & Engineering
Languages : en
Pages : 500
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Book Description
Based on the highly successful second edition, this extended edition of SystemVerilog for Verification: A Guide to Learning the Testbench Language Features teaches all verification features of the SystemVerilog language, providing hundreds of examples to clearly explain the concepts and basic fundamentals. It contains materials for both the full-time verification engineer and the student learning this valuable skill. In the third edition, authors Chris Spear and Greg Tumbush start with how to verify a design, and then use that context to demonstrate the language features, including the advantages and disadvantages of different styles, allowing readers to choose between alternatives. This textbook contains end-of-chapter exercises designed to enhance students’ understanding of the material. Other features of this revision include: New sections on static variables, print specifiers, and DPI from the 2009 IEEE language standard Descriptions of UVM features such as factories, the test registry, and the configuration database Expanded code samples and explanations Numerous samples that have been tested on the major SystemVerilog simulators SystemVerilog for Verification: A Guide to Learning the Testbench Language Features, Third Edition is suitable for use in a one-semester SystemVerilog course on SystemVerilog at the undergraduate or graduate level. Many of the improvements to this new edition were compiled through feedback provided from hundreds of readers.
Author: Lionel Bening
Publisher: Springer Science & Business Media
ISBN: 0306476312
Category : Technology & Engineering
Languages : en
Pages : 297
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Book Description
System designers, computer scientists and engineers have c- tinuously invented and employed notations for modeling, speci- ing, simulating, documenting, communicating, teaching, verifying and controlling the designs of digital systems. Initially these s- tems were represented via electronic and fabrication details. F- lowing C. E. Shannon’s revelation of 1948, logic diagrams and Boolean equations were used to represent digital systems in a fa- ion that de-emphasized electronic and fabrication detail while revealing logical behavior. A small number of circuits were made available to remove the abstraction of these representations when it was desirable to do so. As system complexity grew, block diagrams, timing charts, sequence charts, and other graphic and symbolic notations were found to be useful in summarizing the gross features of a system and describing how it operated. In addition, it always seemed necessary or appropriate to augment these documents with lengthy verbal descriptions in a natural language. While each notation was, and still is, a perfectly valid means of expressing a design, lack of standardization, conciseness, and f- mal definitions interfered with communication and the understa- ing between groups of people using different notations. This problem was recognized early and formal languages began to evolve in the 1950s when I. S. Reed discovered that flip-flop input equations were equivalent to a register transfer equation, and that xvi tor-like notation. Expanding these concepts Reed developed a no- tion that became known as a Register Transfer Language (RTL).
Author: Ashok B. Mehta
Publisher: Springer
ISBN: 3319594184
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
This book describes in detail all required technologies and methodologies needed to create a comprehensive, functional design verification strategy and environment to tackle the toughest job of guaranteeing first-pass working silicon. The author first outlines all of the verification sub-fields at a high level, with just enough depth to allow an engineer to grasp the field before delving into its detail. He then describes in detail industry standard technologies such as UVM (Universal Verification Methodology), SVA (SystemVerilog Assertions), SFC (SystemVerilog Functional Coverage), CDV (Coverage Driven Verification), Low Power Verification (Unified Power Format UPF), AMS (Analog Mixed Signal) verification, Virtual Platform TLM2.0/ESL (Electronic System Level) methodology, Static Formal Verification, Logic Equivalency Check (LEC), Hardware Acceleration, Hardware Emulation, Hardware/Software Co-verification, Power Performance Area (PPA) analysis on a virtual platform, Reuse Methodology from Algorithm/ESL to RTL, and other overall methodologies.
Author: Pierre Bricaud
Publisher: Springer Science & Business Media
ISBN: 0306476401
Category : Technology & Engineering
Languages : en
Pages : 306
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Book Description
This revised and updated third edition outlines a set of best practices for creating reusable designs for use in an System-on-a-Chip (SoC) design methodology. These practices are based on the authors' experience in developing reusable designs, as well as the experience of design teams in many companies around the world.
Author: Pierre Bricaud
Publisher: Springer Science & Business Media
ISBN: 1461550378
Category : Technology & Engineering
Languages : en
Pages : 302
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Book Description
Silicon technology now allows us to build chips consisting of tens of millions of transistors. This technology not only promises new levels of system integration onto a single chip, but also presents significant challenges to the chip designer. As a result, many ASIC developers and silicon vendors are re-examining their design methodologies, searching for ways to make effective use of the huge numbers of gates now available. These designers see current design tools and methodologies as inadequate for developing million-gate ASICs from scratch. There is considerable pressure to keep design team size and design schedules constant even as design complexities grow. Tools are not providing the productivity gains required to keep pace with the increasing gate counts available from deep submicron technology. Design reuse - the use of pre-designed and pre-verified cores - is the most promising opportunity to bridge the gap between available gate-count and designer productivity. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition outlines an effective methodology for creating reusable designs for use in a System-on-a-Chip (SoC) design methodology. Silicon and tool technologies move so quickly that no single methodology can provide a permanent solution to this highly dynamic problem. Instead, this manual is an attempt to capture and incrementally improve on current best practices in the industry, and to give a coherent, integrated view of the design process. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition will be updated on a regular basis as a result of changing technology and improved insight into the problems of design reuse and its role in producing high-quality SoC designs.
Author: Samir Palnitkar
Publisher: Prentice Hall Professional
ISBN: 9780131413092
Category : Computers
Languages : en
Pages : 418
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Book Description
As part of the Modern Semiconductor Design series, this book details a broad range of e-based topics including modelling, constraint-driven test generation, functional coverage and assertion checking.
Author: Mourad Debbabi
Publisher: Springer Science & Business Media
ISBN: 3642152287
Category : Computers
Languages : en
Pages : 261
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Book Description
At the dawn of the 21st century and the information age, communication and c- puting power are becoming ever increasingly available, virtually pervading almost every aspect of modern socio-economical interactions. Consequently, the potential for realizing a signi?cantly greater number of technology-mediated activities has emerged. Indeed, many of our modern activity ?elds are heavily dependant upon various underlying systems and software-intensive platforms. Such technologies are commonly used in everyday activities such as commuting, traf?c control and m- agement, mobile computing, navigation, mobile communication. Thus, the correct function of the forenamed computing systems becomes a major concern. This is all the more important since, in spite of the numerous updates, patches and ?rmware revisions being constantly issued, newly discovered logical bugs in a wide range of modern software platforms (e. g. , operating systems) and software-intensive systems (e. g. , embedded systems) are just as frequently being reported. In addition, many of today’s products and services are presently being deployed in a highly competitive environment wherein a product or service is succeeding in most of the cases thanks to its quality to price ratio for a given set of features. Accordingly, a number of critical aspects have to be considered, such as the ab- ity to pack as many features as needed in a given product or service while c- currently maintaining high quality, reasonable price, and short time -to- market.
Author: Xue-Ren Wu
Publisher: Springer Nature
ISBN: 981168961X
Category : Science
Languages : en
Pages : 665
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Book Description
This book provides a systematic and standardized approach based on the authors’ over 30 years of research experience with weight function methods, as well as the relevant literature. Fracture mechanics has become an indispensable tool for the design and safe operation of damage-tolerant structures in many important technical areas. The stress intensity factor—the characterizing parameter of the crack tip field—is the foundation of fracture mechanics analysis. The weight function method is a powerful technique for determining stress intensity factors and crack opening displacements for complex load conditions, with remarkable computational efficiency and high accuracy. The book presents the theoretical background of the weight function methods, together with a wealth of analytical weight functions and stress intensity factors for two- and three-dimensional crack geometries; many of these have been incorporated into national, international standards and industrial codes of practice. The accuracy of the results is rigorously verified, and various sample applications are provided. Accordingly, the book offers an ideal reference source for graduate students, researchers, and engineers whose work involves fracture and fatigue of materials and structures, who need not only stress intensity factors themselves but also efficient and reliable tools for obtaining them.
Author: United States. Congress. House. Committee on Science. Subcommittee on Space and Aeronautics
Publisher:
ISBN:
Category : Political Science
Languages : en
Pages : 834
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Book Description
