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Author: Kazuaki Wagatsuma
Publisher: Springer
ISBN: 9789811659454
Category : Technology & Engineering
Languages : en
Pages : 101
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Book Description
This book includes X-ray fluorescence spectroscopy, electron spectroscopy, and atomic emission spectroscopy, which are now extensively employed in material analysis. This book is organized as a guide for undergraduate students and engineers who wish to study analytical spectroscopy in material science. An objective of this book is to explain the principles of those methods of spectroscopy only with basic mathematical expressions and to introduce their applications to actual materials.
Author: Kazuaki Wagatsuma
Publisher: Springer
ISBN: 9789811659454
Category : Technology & Engineering
Languages : en
Pages : 101
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Book Description
This book includes X-ray fluorescence spectroscopy, electron spectroscopy, and atomic emission spectroscopy, which are now extensively employed in material analysis. This book is organized as a guide for undergraduate students and engineers who wish to study analytical spectroscopy in material science. An objective of this book is to explain the principles of those methods of spectroscopy only with basic mathematical expressions and to introduce their applications to actual materials.
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: Surender Kumar Sharma
Publisher: Springer
ISBN: 3319929550
Category : Technology & Engineering
Languages : en
Pages : 612
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Book Description
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Author: Simonpietro Agnello
Publisher: John Wiley & Sons
ISBN: 1119697328
Category : Technology & Engineering
Languages : en
Pages : 500
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Book Description
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Author: Sam Zhang
Publisher: CRC Press
ISBN: 1420042955
Category : Science
Languages : en
Pages : 344
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Book Description
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
Author: Bhim Prasad Kaflé
Publisher: Elsevier
ISBN: 0128148675
Category : Science
Languages : en
Pages : 314
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Book Description
Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films. - Covers the basic analytical theory that is essential for understanding spectrophotometry - Emphasizes minor/trace chemical component analysis - Includes the spectrophotometric analysis of nanomaterials and thin solid films - Thoroughly describes methods and uses easy-to-follow, practical examples and experiments
Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 9780367576929
Category :
Languages : en
Pages : 748
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Book Description
With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into ma
Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Category : Technology & Engineering
Languages : en
Pages : 242
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Book Description
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Sidney Perkowitz
Publisher: Elsevier
ISBN: 0080984274
Category : Technology & Engineering
Languages : en
Pages : 229
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Book Description
This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.Discusses and compares infrared, Raman, and photoluminescence methodsEnables readers to choose the best method for a given problemIllustrates applications to help non-experts and industrial users, with answers to selected common problemsPresents fundamentals with examples from the semiconductor literature without excessive abstract discussionFeatures equipment lists and discussion of techniques to help establish characterization laboratories
