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Author: Sirohi
Publisher: CRC Press
ISBN: 9780824789329
Category : Technology & Engineering
Languages : en
Pages : 584
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Book Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Author: Sirohi
Publisher: CRC Press
ISBN: 9780824789329
Category : Technology & Engineering
Languages : en
Pages : 584
Get Book Here
Book Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Author: Rajpal Sirohi
Publisher: CRC Press
ISBN: 1420017764
Category : Technology & Engineering
Languages : en
Pages : 317
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Book Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Author: Thomas Kreis
Publisher: John Wiley & Sons
ISBN: 3527604928
Category : Science
Languages : en
Pages : 554
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Book Description
The book presents the principles and methods of holographic interferometry - a coherent-optical measurement technique for deformation and stress analysis, for the determination of refractive-index distributions, or applied to non-destructive testing. Emphasis of the book is on the quantitative computer-aided evaluation of the holographic interferograms. Based upon wave-optics the evaluation methods, their implementation in computer-algorithms, and their applications in engineering are described.
Author: Joseph W. Goodman
Publisher: Roberts and Company Publishers
ISBN: 9780974707792
Category : Science
Languages : en
Pages : 422
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Book Description
Speckle Phenomena in Optics provides a comprehensive discussion of the statistical properties of speckle, as well as detailed coverage of its role in applications. Some of the applications discussed include speckle in astronomy, speckle in the eye, speckle in projection displays, speckle in coherence tomography, speckle in lithography, speckle in waveguides (modal noise), speckle in optical radar detection, and speckle in metrology. This book is aimed at graduate students and professionals working in a wide variety of fields.
Author: J.C. Shelton
Publisher: Springer Science & Business Media
ISBN: 0585352283
Category : Technology & Engineering
Languages : en
Pages : 208
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Book Description
This book has been written to provide research workers with an introd- tion to several optical techniques for new applications. It is intended to be comprehensible to people from a wide range of backgrounds - no prior optical or physics knowledge has been assumed. However, sufficient technical details have been included to enable the reader to understand the basics of the techniques and to be able to read further from the ref- ences if necessary. The book should be as useful to postgraduate students and experienced researchers as those entering the bioengineering field, irrespective of whether they have a technical or clinical background. It has been prepared with an awareness of the inherent difficulties in und- standing aspects of optics which, in the past, have precluded practical application. The contents address a broad range of optical measurement techniques which have been used in biomechanics, techniques characterized as n- contacting and non-destructive. Theoretical outlines and practical advice on gaining entry to the fields of expertise are complemented by biomec- nical case studies and key literature references. The aim is to present each technique, to appraise its advantages and capabilities and thereby to allow informed selection of an appropriate method for a particular app- cation. It is anticipated that research workers will be assisted in est- lishing new methodologies and gain first-hand experience of the techniques.
Author: R Erf
Publisher: Elsevier
ISBN: 0323154972
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction procedures, and specific applications. These applications are discussed in detail in individual chapters, such as structures inspection. Adaptation of speckle measurement techniques in video recording and processing technology is also given emphasis in one chapter. Finally, one chapter is dedicated to a discussion on the speckle interferometer as one of the most used instrument in metrological speckle application. This text is a valuable reference to students in the fields of engineering and applied science.
Author: David J. Whitehouse
Publisher: CRC Press
ISBN: 1420082027
Category : Science
Languages : en
Pages : 982
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Book Description
Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines h
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1498779506
Category : Science
Languages : en
Pages : 585
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Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Author: William N. Sharpe, Jr.
Publisher: Springer Science & Business Media
ISBN: 0387268839
Category : Mathematics
Languages : en
Pages : 1100
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Book Description
The Springer Handbook of Experimental Solid Mechanics documents both the traditional techniques as well as the new methods for experimental studies of materials, components, and structures. The emergence of new materials and new disciplines, together with the escalating use of on- and off-line computers for rapid data processing and the combined use of experimental and numerical techniques have greatly expanded the capabilities of experimental mechanics. New exciting topics are included on biological materials, MEMS and NEMS, nanoindentation, digital photomechanics, photoacoustic characterization, and atomic force microscopy in experimental solid mechanics. Presenting complete instructions to various areas of experimental solid mechanics, guidance to detailed expositions in important references, and a description of state-of-the-art applications in important technical areas, this thoroughly revised and updated edition is an excellent reference to a widespread academic, industrial, and professional engineering audience.
Author: Nikita A. Fomin
Publisher: Springer Science & Business Media
ISBN: 3662037076
Category : Technology & Engineering
Languages : en
Pages : 253
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Book Description
Speckle photography is an advanced experimental technique used for quantitatve determination of density, velocity and temperature fields in gas, liquid, and plasma flows. This book presents the most important equations for the diffraction theory of speckle formation and the statistical properties of speckle fields. It also describes experimental set-ups and the equipment needed to implement these methods. Speckle photography methods for automatic data acquisition and processing are considered and examples for their use are given.
