Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469138
Category : Science
Languages : en
Pages : 316
Book Description
With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact the field, to textiles, where the impact has been marginal. With such a range of fields and applications, questions about sample selection, preparation, treatment, and handling are difficult to cover completely in one review article or one chapter. Therefore, the editors of this book have assembled a range of experts with experience in the major fields impacted by surface characterization. It is the only book which treats the subject of sample handling, preparation, and treatment for surface characterization. It is full of tricks, cautions, and handy tips to make the laboratory scientist’s life easier. With respect to organization of the book, the topics range from discussion of vacuum to discussion of biological, organic, elemental or compound samples, to samples prepared ex situ or in situ to the vacuum, to deposition ofthin films. Generic considerations of sample preparation are also given.
Specimen Handling, Preparation, and Treatments in Surface Characterization
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469138
Category : Science
Languages : en
Pages : 316
Book Description
With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact the field, to textiles, where the impact has been marginal. With such a range of fields and applications, questions about sample selection, preparation, treatment, and handling are difficult to cover completely in one review article or one chapter. Therefore, the editors of this book have assembled a range of experts with experience in the major fields impacted by surface characterization. It is the only book which treats the subject of sample handling, preparation, and treatment for surface characterization. It is full of tricks, cautions, and handy tips to make the laboratory scientist’s life easier. With respect to organization of the book, the topics range from discussion of vacuum to discussion of biological, organic, elemental or compound samples, to samples prepared ex situ or in situ to the vacuum, to deposition ofthin films. Generic considerations of sample preparation are also given.
Publisher: Springer Science & Business Media
ISBN: 0306469138
Category : Science
Languages : en
Pages : 316
Book Description
With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact the field, to textiles, where the impact has been marginal. With such a range of fields and applications, questions about sample selection, preparation, treatment, and handling are difficult to cover completely in one review article or one chapter. Therefore, the editors of this book have assembled a range of experts with experience in the major fields impacted by surface characterization. It is the only book which treats the subject of sample handling, preparation, and treatment for surface characterization. It is full of tricks, cautions, and handy tips to make the laboratory scientist’s life easier. With respect to organization of the book, the topics range from discussion of vacuum to discussion of biological, organic, elemental or compound samples, to samples prepared ex situ or in situ to the vacuum, to deposition ofthin films. Generic considerations of sample preparation are also given.
Handbook of Surface and Interface Analysis
Author: John C. Riviere
Publisher: CRC Press
ISBN: 1420007807
Category : Science
Languages : en
Pages : 682
Book Description
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Publisher: CRC Press
ISBN: 1420007807
Category : Science
Languages : en
Pages : 682
Book Description
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469146
Category : Technology & Engineering
Languages : en
Pages : 447
Book Description
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Publisher: Springer Science & Business Media
ISBN: 0306469146
Category : Technology & Engineering
Languages : en
Pages : 447
Book Description
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Scanning Auger Electron Microscopy
Author: Martin Prutton
Publisher: John Wiley & Sons
ISBN: 0470866780
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.
Publisher: John Wiley & Sons
ISBN: 0470866780
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.
Surface Modification of Textiles
Author: Q Wei
Publisher: Elsevier
ISBN: 1845696689
Category : Technology & Engineering
Languages : en
Pages : 358
Book Description
The surface of textiles offers an important platform for functional modifications in order to meet special requirements for a variety of applications. The surface modification of textiles may be achieved by various techniques ranging from traditional solution treatment to biological approaches. This book reviews fundamental issues relating to textile surfaces and their characterisation and explores the exciting opportunities for surface modification of a range of different textiles.Introductory chapters review some important surface modification techniques employed for improved functional behaviour of textiles and the various surface characterisation methods available. Further chapters examine the different types of surface modification suitable for textiles, ranging from the use of plasma treatments and physical vapour deposition to the use of nanoparticles. Concluding chapters discuss surface modification strategies for various applications of textiles.Surface modification of textiles is a valuable resource for chemists, surface scientists, textile technologists, fibre scientists, textile engineers and textile students. - Reviews fundamental issues relating to textiles surfaces and their characterisation - Examines various types of surface modification suitable for textiles, including plasma treatments and nanoparticles - Discusses surface modification strategies for textile applications such as expansion into technical textile applications
Publisher: Elsevier
ISBN: 1845696689
Category : Technology & Engineering
Languages : en
Pages : 358
Book Description
The surface of textiles offers an important platform for functional modifications in order to meet special requirements for a variety of applications. The surface modification of textiles may be achieved by various techniques ranging from traditional solution treatment to biological approaches. This book reviews fundamental issues relating to textile surfaces and their characterisation and explores the exciting opportunities for surface modification of a range of different textiles.Introductory chapters review some important surface modification techniques employed for improved functional behaviour of textiles and the various surface characterisation methods available. Further chapters examine the different types of surface modification suitable for textiles, ranging from the use of plasma treatments and physical vapour deposition to the use of nanoparticles. Concluding chapters discuss surface modification strategies for various applications of textiles.Surface modification of textiles is a valuable resource for chemists, surface scientists, textile technologists, fibre scientists, textile engineers and textile students. - Reviews fundamental issues relating to textiles surfaces and their characterisation - Examines various types of surface modification suitable for textiles, including plasma treatments and nanoparticles - Discusses surface modification strategies for textile applications such as expansion into technical textile applications
Auger Electron Spectroscopy
Author: John Wolstenholme
Publisher: Momentum Press
ISBN: 160650682X
Category : Technology & Engineering
Languages : en
Pages : 217
Book Description
This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.
Publisher: Momentum Press
ISBN: 160650682X
Category : Technology & Engineering
Languages : en
Pages : 217
Book Description
This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.
Optimal Control Of Singularly Perturbed Linear Systems And Applications
Author: Zoran Gajic
Publisher: CRC Press
ISBN: 9780203907900
Category : Technology & Engineering
Languages : en
Pages : 334
Book Description
Highlights the Hamiltonian approach to singularly perturbed linear optimal control systems. Develops parallel algorithms in independent slow and fast time scales for solving various optimal linear control and filtering problems in standard and nonstandard singularly perturbed systems, continuous- and discrete-time, deterministic and stochastic, mul
Publisher: CRC Press
ISBN: 9780203907900
Category : Technology & Engineering
Languages : en
Pages : 334
Book Description
Highlights the Hamiltonian approach to singularly perturbed linear optimal control systems. Develops parallel algorithms in independent slow and fast time scales for solving various optimal linear control and filtering problems in standard and nonstandard singularly perturbed systems, continuous- and discrete-time, deterministic and stochastic, mul
Catalysis with Supported Size-selected Pt Clusters
Author: Florian Frank Schweinberger
Publisher: Springer Science & Business Media
ISBN: 3319014994
Category : Science
Languages : en
Pages : 231
Book Description
In his thesis, Florian Schweinberger investigates the influence of the precise size of catalytically active species on reactivity. In order to do this he carries out studies both in UHV and under ambient conditions for supported, size-selected Platium clusters (8-68 atoms). Schweinberger probed the electronic structure, adsorption properties and reactivity of two olefins on surfaces and Pt clusters in the submonolayer range. With adsorbed trichloroethene (TCE) a possible cluster-adsorbate induced change in the electronic structure, and for ethene a low-temperature, size-dependent self-/hydrogenation was observed.In a collaborative approach, Schweinberger and colleagues investigated Pt clusters under ambient pressure conditions. They characterised the clusters at at the local and integral level and tested for temperature stability. Experiments in gas phase ?-reactors and in liquid, as part of a hybrid photocatalytic system, revealed size-dependent reactivity.Overall this thesis is not only of interest for those who want to perform similar experiments but also provides superb scientific insights for researchers in the field.
Publisher: Springer Science & Business Media
ISBN: 3319014994
Category : Science
Languages : en
Pages : 231
Book Description
In his thesis, Florian Schweinberger investigates the influence of the precise size of catalytically active species on reactivity. In order to do this he carries out studies both in UHV and under ambient conditions for supported, size-selected Platium clusters (8-68 atoms). Schweinberger probed the electronic structure, adsorption properties and reactivity of two olefins on surfaces and Pt clusters in the submonolayer range. With adsorbed trichloroethene (TCE) a possible cluster-adsorbate induced change in the electronic structure, and for ethene a low-temperature, size-dependent self-/hydrogenation was observed.In a collaborative approach, Schweinberger and colleagues investigated Pt clusters under ambient pressure conditions. They characterised the clusters at at the local and integral level and tested for temperature stability. Experiments in gas phase ?-reactors and in liquid, as part of a hybrid photocatalytic system, revealed size-dependent reactivity.Overall this thesis is not only of interest for those who want to perform similar experiments but also provides superb scientific insights for researchers in the field.
Damage Analysis and Fundamental Studies
Author: United States Department of Energy
Publisher:
ISBN:
Category :
Languages : en
Pages : 710
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 710
Book Description
Quality Assurance in Environmental Monitoring
Author: Philippe Quevauviller
Publisher: John Wiley & Sons
ISBN: 3527615202
Category : Science
Languages : en
Pages : 321
Book Description
It is increasingly recognized that the greatest risks of error in environmental analysis lie in the sample preparation rather than the analysis stage. This book describes the precautions that must be taken from the sampling to the sample pretreatment via the storage stage to assure good quality. Typical pitfalls - and recommendations for avoiding them - are discussed. Special emphasis is given to the monitoring of trace contaminants in environmental matrices (e. g., water, sediment, plants, air). This book, based on the experience of specialists, constitutes an invaluable guide to the quality assurance relevant to environmental chemists.
Publisher: John Wiley & Sons
ISBN: 3527615202
Category : Science
Languages : en
Pages : 321
Book Description
It is increasingly recognized that the greatest risks of error in environmental analysis lie in the sample preparation rather than the analysis stage. This book describes the precautions that must be taken from the sampling to the sample pretreatment via the storage stage to assure good quality. Typical pitfalls - and recommendations for avoiding them - are discussed. Special emphasis is given to the monitoring of trace contaminants in environmental matrices (e. g., water, sediment, plants, air). This book, based on the experience of specialists, constitutes an invaluable guide to the quality assurance relevant to environmental chemists.