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Author: John A. Reffner
Publisher: John Wiley & Sons
ISBN: 111978820X
Category : Science
Languages : en
Pages : 325
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Book Description
Solving Problems with Microscopy Comprehensive resource, based on real case examples, on the ability of the microscope for solving problems This book takes a “why to” rather than the common “how to” approach to demonstrate the capabilities of microscopy to solve problems. It provides entertaining and informative case examples and lessons regarding the unique value the microscope brings to problem solving by experienced scientists in various industries, including criminal and civil forensic science, manufacturing, environmental science, pharmaceutical science, cultural heritage, and biological sciences. Sample topics covered in this learning resource include: History of problem solving with microscopy Fortune favors the prepared mind The value of multiple associations The importance of context Knowing your limitations (i.e. knowing what you don’t know) Microscopists and other professional scientists who use microscopy can harness the information in this book to make better and more informed decisions by improving their problem-solving strategies and processes.
Author: John A. Reffner
Publisher: John Wiley & Sons
ISBN: 111978820X
Category : Science
Languages : en
Pages : 325
Get Book Here
Book Description
Solving Problems with Microscopy Comprehensive resource, based on real case examples, on the ability of the microscope for solving problems This book takes a “why to” rather than the common “how to” approach to demonstrate the capabilities of microscopy to solve problems. It provides entertaining and informative case examples and lessons regarding the unique value the microscope brings to problem solving by experienced scientists in various industries, including criminal and civil forensic science, manufacturing, environmental science, pharmaceutical science, cultural heritage, and biological sciences. Sample topics covered in this learning resource include: History of problem solving with microscopy Fortune favors the prepared mind The value of multiple associations The importance of context Knowing your limitations (i.e. knowing what you don’t know) Microscopists and other professional scientists who use microscopy can harness the information in this book to make better and more informed decisions by improving their problem-solving strategies and processes.
Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Category : Technology & Engineering
Languages : en
Pages : 764
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Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: John A. Reffner
Publisher: John Wiley & Sons
ISBN: 1119788226
Category : Science
Languages : en
Pages : 325
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Book Description
Solving Problems with Microscopy Comprehensive resource, based on real case examples, on the ability of the microscope for solving problems This book takes a “why to” rather than the common “how to” approach to demonstrate the capabilities of microscopy to solve problems. It provides entertaining and informative case examples and lessons regarding the unique value the microscope brings to problem solving by experienced scientists in various industries, including criminal and civil forensic science, manufacturing, environmental science, pharmaceutical science, cultural heritage, and biological sciences. Sample topics covered in this learning resource include: History of problem solving with microscopy Fortune favors the prepared mind The value of multiple associations The importance of context Knowing your limitations (i.e. knowing what you don’t know) Microscopists and other professional scientists who use microscopy can harness the information in this book to make better and more informed decisions by improving their problem-solving strategies and processes.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: James Pawley
Publisher: Springer Science & Business Media
ISBN: 1475753489
Category : Science
Languages : en
Pages : 639
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Book Description
This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition and properties of fluorescent dyes, the techniques of 3D specimen preparation and the fundamental limitations, and practical complexities of quantitative confocal fluorescence imaging. Coverage includes practical multiphoton, photodamage and phototoxicity, 3D FRET, 3D microscopy correlated with micro-MNR, CARS, second and third harmonic signals, ion imaging in 3D, scanning RAMAN, plant specimens, practical 3D microscopy and correlated optical tomography.
Author: United States. Congress. House. Committee on Ways and Means
Publisher:
ISBN:
Category : Taxation
Languages : en
Pages : 986
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Book Description
Author: Xing Zhu
Publisher: World Scientific
ISBN: 9789810243654
Category : Science
Languages : en
Pages : 300
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Book Description
Near-field optics, dealing with the interaction between optical field and matter in the nanometric region, has become an interdisciplinary field spaning physics, chemistry, materials science, electrical engineering and high density data storage. This book reflects the recent status of this rapidly growing field. It discusses the basic theories, instrumentation, novel probes, theoretical simulations, and the application of near-field optics to the fields of condensed matter physics, new materials, information storage, atom photonics, etc. It provides an overview of the research on near-field optics in the 1990s.
Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0443193274
Category : Technology & Engineering
Languages : en
Pages : 286
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Book Description
Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics
Author: S. Fortier
Publisher: Springer Science & Business Media
ISBN: 9401590931
Category : Science
Languages : en
Pages : 505
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Book Description
This book of the proceedings of the 1997 NATO Advanced Study Institute (ASI) on Direct Methods for Solving Macromolecular Structures was assembled from the lecturers' contributions and represents a comprehensive and in-depth overview of crystallographic structure determination methods for macromolecules. While having a focus based on the direct methods, the Institute adopted an inclusive and broad perspective. Thus, both direct and experimental phasing techniques are presented in this book, highlighting their complementarities and synergies. As weil, methodologies spanning the full crystallographic image reconstruction process - from low resolution envelope definition to high resolution atomic refinement- are discussed. The first part of the book introduces the array of tools currently used in structure determination, whether originating from a mathematical, computational or experimental framework. This section of the book displays the variety and ingenuity of old and new phasing approaches developed to solve increasingly complex structures. Some of the contributions focus on recent developments and/or implementations that have given older approaches a new life. A case in point is the re-implementation of Buerger's superposition approach, which is now solving protein structures. Another beautiful example is found in the introduction to the traditional multiple isomorphous replacement approach where new techniques, such as site-directed mutagenesis and the use of inert gases in the preparation of heavy atom derivatives, are described. Equally impressive are the presentations of newer approaches, which take advantage of advances on the experimental front (e. g.
Author: A. Lee Smith
Publisher: John Wiley & Sons
ISBN: 0471516244
Category : Science
Languages : en
Pages : 596
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Book Description
High-Resolution Solid-State NMR of Silicates and Zeolites Gunter Engelhardt and Dieter Michel "I strongly recommend this book as an important reference for scientists concerned with the structural properties of siliceous materials." --Applied Spectroscopy This well-organized and up-to-date text gives a thorough account of the wide range of applications of multinuclear high-resolution solid-state NMR spectroscopy in silicate and zeolite science, with emphasis on the kinds of chemical information retrievable from NMR experiments. 1988 (0 471-91597-1) 485 pp. The Chemistry of Silica Solubility, Polymerization, Colloid and Surface Properties, and Biochemistry Ralph K. Iler A major component of the earth's solid surface and the constituent of sand, silica--an ageless natural staple--is also integral to industries as diverse as chemistry, biology, medicine, agriculture, metallurgy, and mining. This landmark reference details the chemistry surrounding the research and development of silica as well as information on its production and production control. 1979 (0 471-02404-X) 866 pp. The Chemistry of Organic Silicon Compounds Parts 1 and 2 Edited by Saul Patai and Zvi Rappoport "This volume will probably become the first reference consulted for C-Si chemistry." --Choice This authoritative account of organic compounds containing carbon-silicon bonds brings specialists up-to-date to the field's latest innovative turns. The emphasis in this compilation of studies--from 17 prominent researchers--is on small molecules, single bonds, analysis, structure, synthesis, spectroscopy, and reaction mechanisms. Part 1:1989 (0 471-91441-X) 892 pp. Part 2:1989 (0 471-91992-6) 1,668 pp.
