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Author: Cyrille Artho
Publisher: Springer
ISBN: 3319054163
Category : Computers
Languages : en
Pages : 307
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Book Description
This book constitutes the refereed proceedings of the Second International Workshop, FTSCS 2013, held in Queenstown, New Zealand, in October 2013. The 17 revised full papers presented together with an invited talk were carefully reviewed and selected from 32 submissions. The papers address various topics related to the application of formal and semi-formal methods to improve the quality of safety-critical computer systems.
Author: Cyrille Artho
Publisher: Springer
ISBN: 3319054163
Category : Computers
Languages : en
Pages : 307
Get Book Here
Book Description
This book constitutes the refereed proceedings of the Second International Workshop, FTSCS 2013, held in Queenstown, New Zealand, in October 2013. The 17 revised full papers presented together with an invited talk were carefully reviewed and selected from 32 submissions. The papers address various topics related to the application of formal and semi-formal methods to improve the quality of safety-critical computer systems.
Author: Olga Goloubeva
Publisher: Springer Science & Business Media
ISBN: 0387329374
Category : Technology & Engineering
Languages : en
Pages : 238
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Book Description
This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769520438
Category : Computers
Languages : en
Pages : 456
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Book Description
MICRO-36 discusses new microarchitecture and software techniques, and explores the latest research related to processor architecture, compilers, and systems for technical interaction on traditional MICRO topics. The proceedings also places a special emphasis on optimizations that take advantage of application specific opportunities. In addition, this year's MICRO includes papers that will benefit both the microarchitecture and embedded architecture communities.
Author: Jörg Henkel
Publisher: Springer Nature
ISBN: 303052017X
Category : Technology & Engineering
Languages : en
Pages : 606
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Book Description
This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 946
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Book Description
Author: Rino Micheloni
Publisher: Springer Science & Business Media
ISBN: 9400751451
Category : Science
Languages : en
Pages : 391
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Book Description
Solid State Drives (SSDs) are gaining momentum in enterprise and client applications, replacing Hard Disk Drives (HDDs) by offering higher performance and lower power. In the enterprise, developers of data center server and storage systems have seen CPU performance growing exponentially for the past two decades, while HDD performance has improved linearly for the same period. Additionally, multi-core CPU designs and virtualization have increased randomness of storage I/Os. These trends have shifted performance bottlenecks to enterprise storage systems. Business critical applications such as online transaction processing, financial data processing and database mining are increasingly limited by storage performance. In client applications, small mobile platforms are leaving little room for batteries while demanding long life out of them. Therefore, reducing both idle and active power consumption has become critical. Additionally, client storage systems are in need of significant performance improvement as well as supporting small robust form factors. Ultimately, client systems are optimizing for best performance/power ratio as well as performance/cost ratio. SSDs promise to address both enterprise and client storage requirements by drastically improving performance while at the same time reducing power. Inside Solid State Drives walks the reader through all the main topics related to SSDs: from NAND Flash to memory controller (hardware and software), from I/O interfaces (PCIe/SAS/SATA) to reliability, from error correction codes (BCH and LDPC) to encryption, from Flash signal processing to hybrid storage. We hope you enjoy this tour inside Solid State Drives.
Author: Louise H Crockett
Publisher:
ISBN: 9780992978754
Category :
Languages : en
Pages : 642
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Book Description
This book introduces the Zynq MPSoC (Multi-Processor System-on-Chip), an embedded device from Xilinx. The Zynq MPSoC combines a sophisticated processing system that includes ARM Cortex-A53 applications and ARM Cortex-R5 real-time processors, with FPGA programmable logic. As well as guiding the reader through the architecture of the device, design tools and methods are also covered in detail: both the conventional hardware/software co-design approach, and the newer software-defined methodology using Xilinx's SDx development environment. Featured aspects of Zynq MPSoC design include hardware and software development, multiprocessing, safety, security and platform management, and system booting. There are also special features on PYNQ, the Python-based framework for Zynq devices, and machine learning applications. This book should serve as a useful guide for those working with Zynq MPSoC, and equally as a reference for technical managers wishing to gain familiarity with the device and its associated design methodologies.
Author: Axel Jantsch
Publisher: Springer Science & Business Media
ISBN: 0306487276
Category : Computers
Languages : en
Pages : 304
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Book Description
As the number of processor cores and IP blocks integrated on a single chip is steadily growing, a systematic approach to design the communication infrastructure becomes necessary. Different variants of packed switched on-chip networks have been proposed by several groups during the past two years. This book summarizes the state of the art of these efforts and discusses the major issues from the physical integration to architecture to operating systems and application interfaces. It also provides a guideline and vision about the direction this field is moving to. Moreover, the book outlines the consequences of adopting design platforms based on packet switched network. The consequences may in fact be far reaching because many of the topics of distributed systems, distributed real-time systems, fault tolerant systems, parallel computer architecture, parallel programming as well as traditional system-on-chip issues will appear relevant but within the constraints of a single chip VLSI implementation.
Author: Stefanos Kaxiras
Publisher: Morgan & Claypool Publishers
ISBN: 1598292080
Category : Computers
Languages : en
Pages : 220
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Book Description
In the last few years, power dissipation has become an important design constraint, on par with performance, in the design of new computer systems. Whereas in the past, the primary job of the computer architect was to translate improvements in operating frequency and transistor count into performance, now power efficiency must be taken into account at every step of the design process. While for some time, architects have been successful in delivering 40% to 50% annual improvement in processor performance, costs that were previously brushed aside eventually caught up. The most critical of these costs is the inexorable increase in power dissipation and power density in processors. Power dissipation issues have catalyzed new topic areas in computer architecture, resulting in a substantial body of work on more power-efficient architectures. Power dissipation coupled with diminishing performance gains, was also the main cause for the switch from single-core to multi-core architectures and a slowdown in frequency increase. This book aims to document some of the most important architectural techniques that were invented, proposed, and applied to reduce both dynamic power and static power dissipation in processors and memory hierarchies. A significant number of techniques have been proposed for a wide range of situations and this book synthesizes those techniques by focusing on their common characteristics.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
