Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports PDF Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704

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Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports PDF Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704

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Sci-tech Book Profiles

Sci-tech Book Profiles PDF Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 856

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Book Description
Includes title page, table of contents, list of contributors, preface and all indexes of each book.

Papers

Papers PDF Author:
Publisher:
ISBN:
Category : Guided missiles
Languages : en
Pages : 504

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NASA SP-7500

NASA SP-7500 PDF Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category :
Languages : en
Pages : 752

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1966 Aerospace Systems Conference

1966 Aerospace Systems Conference PDF Author:
Publisher:
ISBN:
Category : Astrionics
Languages : en
Pages : 844

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Astronautics, 1960-1966

Astronautics, 1960-1966 PDF Author: United States Air Force Academy. Library
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 54

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Failure Data Handbook for Nuclear Power Facilities: Failure data and applications technology

Failure Data Handbook for Nuclear Power Facilities: Failure data and applications technology PDF Author:
Publisher:
ISBN:
Category : Liquid metal cooled reactors
Languages : en
Pages : 856

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A Summary of Research 1995

A Summary of Research 1995 PDF Author: United States. Naval Postgraduate School, Monterey, CA.
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 588

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Preindications of Failure in Electronic Components

Preindications of Failure in Electronic Components PDF Author: J. W. Klapheke
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 68

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Book Description
This report discusses state-of-the-art information and techniques concerned with indications of potential degradation and catastrophic failure in electronic components. The objective of this survey is to present a comprehensive description of past, present, and future planned work on preindicators of failure for certain electronic components. This study is intended to provide basic information for future development in automatic checkout equipment. The following electronic parts were covered in the survey: semiconductors (transistors, diodes, and microcircuits), resistors, capacitors, inductors, computer cores, other items used in a computer, and vacuum tubes. Such items as wire, insulation, lamps, relays, and rotary devices were not considered. Precursors of failure have been investigated for electronic components but few have been identified at the present time. Most of these investigations were undertaken as part of programs directed at physics of failure, screening, or accelerated testing. The results of this study show that predictors of failure for semiconductors (transistors, diodes, and microcircuits) have received more attention than other types of parts. Current noise (l/f noise) and infrared emission profiles show promise as precursors that would apply to all types of semiconductors. Apparently computer cores and inductors are the least considered. (Author).

British Communications & Electronics

British Communications & Electronics PDF Author:
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 656

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