Author: John C. Stover
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 468
Book Description
Scatter from Optical Components
Author: John C. Stover
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 468
Book Description
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 468
Book Description
Scatter from Optical Components
Author: John C. Stover
Publisher:
ISBN: 9780819402011
Category :
Languages : en
Pages : 0
Book Description
Publisher:
ISBN: 9780819402011
Category :
Languages : en
Pages : 0
Book Description
Optical Scattering
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Scatter from Optical Components
Author: John C. Stover
Publisher:
ISBN: 9780819402011
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9780819402011
Category :
Languages : en
Pages :
Book Description
Stray Light Analysis and Control
Author: Eric C. Fest
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819493255
Category : Light
Languages : en
Pages : 0
Book Description
Stray light is defined as unwanted light in an optical system, a familiar concept for anyone who has taken a photograph with the sun in or near their camera's field of view. In a low-cost consumer camera, stray light may be only a minor annoyance, but in a space-based telescope, it can result in the loss of data worth millions of dollars. It is imperative that optical system designers understand its consequences on system performance and adapt the design process to control it. This book addresses stray light terminology, radiometry, and the physics of stray light mechanisms, such as surface roughness scatter and ghost reflections. The most-efficient ways of using stray light analysis software packages are included. The book also demonstrates how the basic principles are applied in the design, fabrication, and testing phases of optical system development.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819493255
Category : Light
Languages : en
Pages : 0
Book Description
Stray light is defined as unwanted light in an optical system, a familiar concept for anyone who has taken a photograph with the sun in or near their camera's field of view. In a low-cost consumer camera, stray light may be only a minor annoyance, but in a space-based telescope, it can result in the loss of data worth millions of dollars. It is imperative that optical system designers understand its consequences on system performance and adapt the design process to control it. This book addresses stray light terminology, radiometry, and the physics of stray light mechanisms, such as surface roughness scatter and ghost reflections. The most-efficient ways of using stray light analysis software packages are included. The book also demonstrates how the basic principles are applied in the design, fabrication, and testing phases of optical system development.
Laser Induced Damage in Optical Materials
Author:
Publisher:
ISBN:
Category : Laser materials
Languages : en
Pages : 292
Book Description
Publisher:
ISBN:
Category : Laser materials
Languages : en
Pages : 292
Book Description
Optical Components, Techniques, and Systems in Engineering
Author: Sirohi
Publisher: Routledge
ISBN: 1351426885
Category : Science
Languages : en
Pages : 464
Book Description
Presents optical techniques and measurement procedures, providing basic background information on optics and lasers, their components and basic systems. Contains information on thermal and laser sources, detectors, and recording materials, semi-conductor laser diodes, and optical techniques such as
Publisher: Routledge
ISBN: 1351426885
Category : Science
Languages : en
Pages : 464
Book Description
Presents optical techniques and measurement procedures, providing basic background information on optics and lasers, their components and basic systems. Contains information on thermal and laser sources, detectors, and recording materials, semi-conductor laser diodes, and optical techniques such as
Absorption and Scattering of Light by Small Particles
Author: Craig F. Bohren
Publisher: John Wiley & Sons
ISBN: 3527618163
Category : Science
Languages : en
Pages : 544
Book Description
Absorption and Scattering of Light by Small Particles Treating absorption and scattering in equal measure, this self-contained, interdisciplinary study examines and illustrates how small particles absorb and scatter light. The authors emphasize that any discussion of the optical behavior of small particles is inseparable from a full understanding of the optical behavior of the parent material-bulk matter. To divorce one concept from the other is to render any study on scattering theory seriously incomplete. Special features and important topics covered in this book include: * Classical theories of optical properties based on idealized models * Measurements for three representative materials: magnesium oxide, aluminum, and water * An extensive discussion of electromagnetic theory * Numerous exact and approximate solutions to various scattering problems * Examples and applications from physics, astrophysics, atmospheric physics, and biophysics * Some 500 references emphasizing work done since Kerker's 1969 work on scattering theory * Computer programs for calculating scattering by spheres, coated spheres, and infinite cylinders
Publisher: John Wiley & Sons
ISBN: 3527618163
Category : Science
Languages : en
Pages : 544
Book Description
Absorption and Scattering of Light by Small Particles Treating absorption and scattering in equal measure, this self-contained, interdisciplinary study examines and illustrates how small particles absorb and scatter light. The authors emphasize that any discussion of the optical behavior of small particles is inseparable from a full understanding of the optical behavior of the parent material-bulk matter. To divorce one concept from the other is to render any study on scattering theory seriously incomplete. Special features and important topics covered in this book include: * Classical theories of optical properties based on idealized models * Measurements for three representative materials: magnesium oxide, aluminum, and water * An extensive discussion of electromagnetic theory * Numerous exact and approximate solutions to various scattering problems * Examples and applications from physics, astrophysics, atmospheric physics, and biophysics * Some 500 references emphasizing work done since Kerker's 1969 work on scattering theory * Computer programs for calculating scattering by spheres, coated spheres, and infinite cylinders
Optical Measurements for Scientists and Engineers
Author: Arthur McClelland
Publisher: Cambridge University Press
ISBN: 1107173019
Category : Science
Languages : en
Pages : 321
Book Description
An accessible, introductory text explaining how to select, set up and use optical spectroscopy and optical microscopy techniques.
Publisher: Cambridge University Press
ISBN: 1107173019
Category : Science
Languages : en
Pages : 321
Book Description
An accessible, introductory text explaining how to select, set up and use optical spectroscopy and optical microscopy techniques.
Light Scattering of Optical Components at 193 Nm and 13.5 Nm
Author: Sven Schröder
Publisher:
ISBN:
Category :
Languages : en
Pages : 198
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 198
Book Description