Scanning Tunneling Microscopy and Spectroscopy of Topological Materials with Broken Symmetry PDF Download
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Author: Kane Lee Scipioni
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Kane Lee Scipioni
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Michael Gottschalk
Publisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 0
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Book Description
Topological phases in condensed matter systems have received tremendous interest in the past two decades. Theoretical work has shown how topological invariants can be calculated from the band structures in a wide range of insulating systems that contain an energy gap. Broadly speaking, these topological invariants are quantities that are invariant under continuous deformation so long as specific symmetries hold and the energy gap stays open. What separates topological states of matter from traditional phases is the concept of bulk-boundary correspondence. The topology of the vacuum is trivial, so if the bulk of a material is topologically non-trivial, the energy gap must close at the boundary between the two. This creates conducting states at the boundaries, or edges, of the material; the conducting states within the gap have specific properties. Strong, 3Dtopological insulators, such as Bi2Se3 , are materials that are insulating in the bulk with conducting surface states due to bulk-boundary correspondence. The surface states are topologically protected from local perturbations and feature a linear dispersion relation, known as the Dirac cone. Bi2Se3is one of the most widely studied topological insulators due to the relative simplicity of its band structure with a single Dirac cone. In this work, I study the effects of N2 gas on the surface states of Bi2Se3 , which appears to p-type dope the density of states spectra measured with a scanning tunneling microscope. Topological superconductors have also garnered great interest for their potential applications in topological quantum computing. The second half of this dissertation is focused on describing, fabricating, and measuring a potential platform for a possible topological superconducting state known as a Majorana zero mode. These devices feature Nb sputtered onBi2Se3 that is patterned into Josephson junctions with e-beam lithography techniques.
Author: H. Neddermeyer
Publisher: Springer Science & Business Media
ISBN: 9401118124
Category : Science
Languages : en
Pages : 275
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Book Description
The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.
Author: C. Julian Chen
Publisher: Oxford University Press
ISBN: 0198023561
Category : Science
Languages : en
Pages : 472
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Book Description
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 3642793665
Category : Science
Languages : en
Pages : 359
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Book Description
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 3642973639
Category : Science
Languages : en
Pages : 316
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Book Description
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.
Author: Roland Wiesendanger
Publisher: Cambridge University Press
ISBN: 9780521428477
Category : Science
Languages : en
Pages : 664
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Book Description
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Author: C. Julian Chen
Publisher: Oxford University Press
ISBN: 0192598562
Category : Technology & Engineering
Languages : en
Pages : 523
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Book Description
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.
Author: Robert Conner Walko
Publisher:
ISBN:
Category : Condensed matter
Languages : en
Pages : 0
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Book Description
Material systems that combine magnetism and topology have garnered intense interest recently due to predictions of a variety of phenomena such as the quantum anomalous Hall effect, chiral topological edge states, magnetoelectric effects, and Weyl semimetal and axion insulator phases. In this dissertation scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) are used to investigate the structural and electronic properties of several materials that exist at the intersection of topology and magnetism such as topological insulators, van der Waals layered materials, two-dimensional magnets, and intrinsic magnetic topological insulators. Specifically, STM was used to confirm the growth quality and properties of thin films grown by molecular beam epitaxy including Bi2Se3, SnSe2, MnSe, and Fe3GeTe2. In the van der Waals heterostructure SnSe2/Bi2Se3 a moiré pattern was observed which was found to be correlated to a set of localized electronic states in STS measurements. STM was also used to provide feedback for the growth of the heterostructure MnSe/Bi2Se3, which led to successful growth of partial monolayers of MnSe. In Fe3GeTe2, a magnetic field dependent Kondo lattice behavior was observed as well as a ferromagnetic hysteresis loop using spin-polarized STM. In addition, this work reports the first STM study of the recently experimentally verified intrinsic antiferromagnetic topological insulator (AFM TI) MnBi2Se4. Its atomic and layered properties are found to reasonably match theoretical predictions. Two different terminations of its layered structure are observed on the surface with distinct electronic properties. In-gap states are observed near some step edges which could be related to predicted topological edge states. Another AFM TI, the related material MnBi2Te4, was also studied in which nanoscale surface manipulation using an STM tip was demonstrated.
Author: Hans-Joachim Güntherodt
Publisher: Springer Science & Business Media
ISBN: 3642973434
Category : Science
Languages : en
Pages : 252
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Book Description
Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.
