Roadmap of Scanning Probe Microscopy PDF Download
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Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 3540343156
Category : Technology & Engineering
Languages : en
Pages : 207
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Book Description
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 3540343156
Category : Technology & Engineering
Languages : en
Pages : 207
Get Book Here
Book Description
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540850392
Category : Technology & Engineering
Languages : en
Pages : 271
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Book Description
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 354085049X
Category : Technology & Engineering
Languages : en
Pages : 284
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Book Description
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Francesco Marinello
Publisher: Springer Science & Business Media
ISBN: 3642274943
Category : Science
Languages : en
Pages : 513
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Book Description
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540740856
Category : Technology & Engineering
Languages : en
Pages : 475
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Book Description
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author: Paula M. Vilarinho
Publisher: Springer Science & Business Media
ISBN: 1402030193
Category : Science
Languages : en
Pages : 503
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Book Description
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Author: Gustaaf van Tendeloo
Publisher: John Wiley & Sons
ISBN: 3527641874
Category : Technology & Engineering
Languages : en
Pages : 1484
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Book Description
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
Author: Enrico Gnecco
Publisher: Springer Science & Business Media
ISBN: 3540368078
Category : Science
Languages : en
Pages : 713
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Book Description
Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, the book is suitable both as a first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology.
Author: Ulrich Heiz
Publisher: Springer Science & Business Media
ISBN: 3540745513
Category : Science
Languages : en
Pages : 514
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Book Description
Nanocatalysis is one of the most exciting subfields to have emerged from nanoscience. Its central aim is the control of chemical reactions by changing the size, dimensionality, chemical composition and morphology of the reaction center and by changing the kinetics using nanopatterning of the reaction centers. This approach opens up new avenues for atom-by-atom design of nanocatalysts with distinct and tunable chemical activity, specificity, and selectivity. This book is intended to give a pedagogical and methodological overview of this exciting and growing field and to highlight specific examples of current research. In this way, it serves both as an instructive introduction for graduate students who plan to enter the field and as a reference work for scientists already active in this and related areas.
Author: Victor E. Borisenko
Publisher: John Wiley & Sons
ISBN: 3527648380
Category : Technology & Engineering
Languages : en
Pages : 497
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Book Description
The third, partly revised and enlarged edition of this introductory reference summarizes the terms and definitions, most important phenomena, and regulations occurring in the physics, chemistry, technology, and application of nanostructures. A representative collection of fundamental terms and definitions from quantum physics and chemistry, special mathematics, organic and inorganic chemistry, solid state physics, material science and technology accompanies recommended secondary sources for an extended study of any given subject. Each of the more than 2,200 entries, from a few sentences to a page in length, interprets the term or definition in question and briefly presents the main features of the phenomena behind it. Additional information in the form of notes ("First described in", "Recognition", "More details in") supplements the entries and gives a historical perspective of the subject with reference to further sources. Ideal for answering questions related to unknown terms and definitions among undergraduate and PhD students studying the physics of low-dimensional structures, nanoelectronics, and nanotechnology.
