Rietveld Refinement in the Characterization of Crystalline Materials PDF Download
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Author: Igor Djerdj
Publisher: MDPI
ISBN: 3038975273
Category :
Languages : en
Pages : 89
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Book Description
This book is a printed edition of the Special Issue "Rietveld Refinement in the Characterization of Crystalline Materials" that was published in Crystals
Author: Igor Djerdj
Publisher: MDPI
ISBN: 3038975273
Category :
Languages : en
Pages : 89
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Book Description
This book is a printed edition of the Special Issue "Rietveld Refinement in the Characterization of Crystalline Materials" that was published in Crystals
Author: Igor Djerdj
Publisher:
ISBN: 9783038975281
Category : Electronic books
Languages : en
Pages : 1
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Book Description
This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Author: Robert Alan Young
Publisher: Oxford University Press, USA
ISBN:
Category : Language Arts & Disciplines
Languages : en
Pages : 320
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Book Description
The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science. The audience is thus comprised of all scientists using the method: graduate students who may be starting research in this area, powder diffraction specialists, crystallographers, physicists, chemists, and materials scientists.
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 0387095799
Category : Science
Languages : en
Pages : 751
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Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: Henryk Morawiec
Publisher: World Scientific
ISBN: 9814549649
Category :
Languages : en
Pages : 502
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Book Description
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.
Author: Stroz Danuta
Publisher: World Scientific
ISBN: 9814545554
Category :
Languages : en
Pages : 512
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Book Description
The need to investigate functional differential equations with discontinuous delays is addressed in this book. Recording the work and findings of several scientists on differential equations with piecewise continuous arguments over the last few years, this book serves as a useful source of reference. Great interest is placed on discussing the stability, oscillation and periodic properties of the solutions. Considerable attention is also given to the study of initial and boundary-value problems for partial differential equations of mathematical physics with discontinuous time delays. In fact, a large part of the book is devoted to the exploration of differential and functional differential equations in spaces of generalized functions (distributions) and contains a wealth of new information in this area. Each topic discussed appears to provide ample opportunity for extending the known results. A list of new research topics and open problems is also included as an update.
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 9781402073656
Category : Technology & Engineering
Languages : en
Pages : 752
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Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Author: Georg Will
Publisher: Springer Science & Business Media
ISBN: 3540279865
Category : Science
Languages : en
Pages : 232
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Book Description
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Author: René Guinebretière
Publisher: John Wiley & Sons
ISBN: 1118613953
Category : Technology & Engineering
Languages : en
Pages : 290
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Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: Duncan W. Bruce
Publisher: John Wiley & Sons
ISBN: 1118695712
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Inorganic materials show a diverse range of important propertiesthat are desirable for many contemporary, real-world applications.Good examples include recyclable battery cathode materials forenergy storage and transport, porous solids for capture and storageof gases and molecular complexes for use in electronic devices. Anunderstanding of the function of these materials is necessary inorder to optimise their behaviour for real applications, hence theimportance of 'structure–property relationships'. The chapters presented in this volume deal with recent advancesin the characterisation of crystalline materials. They include somefamiliar diffraction methods, thoroughly updated with modernadvances. Also included are techniques that can now probe detailsof the three-dimensional arrangements of atoms in nanocrystallinesolids, allowing aspects of disorder to be studied. Small-anglescattering, a technique that is often overlooked, can probe bothordered and disordered structures of materials at longer lengthscales than those probed by powder diffraction methods. Addressing both physical principals and recent advances in theirapplications, Structure from Diffraction Methodscovers: Powder Diffraction X-Ray and Neutron Single-Crystal Diffraction PDF Analysis of Nanoparticles Electron Crystallography Small-Angle Scattering Ideal as a complementary reference work to other volumes in theseries (Local Structural Characterisation and MultiLength-Scale Characterisation), or as an examination of thespecific characterisation techniques in their own right,Structure from Diffraction Methods is a valuable addition tothe Inorganic Materials Series.
