Reliability Wearout Mechanisms in Advanced CMOS Technologies PDF Download
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Author: Alvin W. Strong
Publisher: John Wiley & Sons
ISBN: 047045525X
Category : Technology & Engineering
Languages : en
Pages : 642
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Book Description
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Author: Alvin W. Strong
Publisher: John Wiley & Sons
ISBN: 047045525X
Category : Technology & Engineering
Languages : en
Pages : 642
Get Book Here
Book Description
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Author: Elie Maricau
Publisher: Springer Science & Business Media
ISBN: 1461461634
Category : Technology & Engineering
Languages : en
Pages : 208
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Book Description
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Author: Joseph B. Bernstein
Publisher: John Wiley & Sons
ISBN: 1394210930
Category : Technology & Engineering
Languages : en
Pages : 404
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Book Description
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Author: R. Jacob Baker
Publisher: John Wiley & Sons
ISBN: 1119481554
Category : Technology & Engineering
Languages : en
Pages : 1282
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Book Description
A revised guide to the theory and implementation of CMOS analog and digital IC design The fourth edition of CMOS: Circuit Design, Layout, and Simulation is an updated guide to the practical design of both analog and digital integrated circuits. The author—a noted expert on the topic—offers a contemporary review of a wide range of analog/digital circuit blocks including: phase-locked-loops, delta-sigma sensing circuits, voltage/current references, op-amps, the design of data converters, and switching power supplies. CMOS includes discussions that detail the trade-offs and considerations when designing at the transistor-level. The companion website contains numerous examples for many computer-aided design (CAD) tools. Using the website enables readers to recreate, modify, or simulate the design examples presented throughout the book. In addition, the author includes hundreds of end-of-chapter problems to enhance understanding of the content presented. This newly revised edition: • Provides in-depth coverage of both analog and digital transistor-level design techniques • Discusses the design of phase- and delay-locked loops, mixed-signal circuits, data converters, and circuit noise • Explores real-world process parameters, design rules, and layout examples • Contains a new chapter on Power Electronics Written for students in electrical and computer engineering and professionals in the field, the fourth edition of CMOS: Circuit Design, Layout, and Simulation is a practical guide to understanding analog and digital transistor-level design theory and techniques.
Author: Seiichi Aritome
Publisher: John Wiley & Sons
ISBN: 1119132614
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectives Describes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memory Written by an authority in NAND flash memory technology, with over 25 years’ experience
Author: Shubham Sahay
Publisher: John Wiley & Sons
ISBN: 1119523532
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
A comprehensive one-volume reference on current JLFET methods, techniques, and research Advancements in transistor technology have driven the modern smart-device revolution—many cell phones, watches, home appliances, and numerous other devices of everyday usage now surpass the performance of the room-filling supercomputers of the past. Electronic devices are continuing to become more mobile, powerful, and versatile in this era of internet-of-things (IoT) due in large part to the scaling of metal-oxide semiconductor field-effect transistors (MOSFETs). Incessant scaling of the conventional MOSFETs to cater to consumer needs without incurring performance degradation requires costly and complex fabrication process owing to the presence of metallurgical junctions. Unlike conventional MOSFETs, junctionless field-effect transistors (JLFETs) contain no metallurgical junctions, so they are simpler to process and less costly to manufacture.JLFETs utilize a gated semiconductor film to control its resistance and the current flowing through it. Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an inclusive, one-stop referenceon the study and research on JLFETs This timely book covers the fundamental physics underlying JLFET operation, emerging architectures, modeling and simulation methods, comparative analyses of JLFET performance metrics, and several other interesting facts related to JLFETs. A calibrated simulation framework, including guidance on SentaurusTCAD software, enables researchers to investigate JLFETs, develop new architectures, and improve performance. This valuable resource: Addresses the design and architecture challenges faced by JLFET as a replacement for MOSFET Examines various approaches for analytical and compact modeling of JLFETs in circuit design and simulation Explains how to use Technology Computer-Aided Design software (TCAD) to produce numerical simulations of JLFETs Suggests research directions and potential applications of JLFETs Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an essential resource for CMOS device design researchers and advanced students in the field of physics and semiconductor devices.
Author: Semeen Rehman
Publisher: Springer
ISBN: 3319257722
Category : Technology & Engineering
Languages : en
Pages : 259
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Book Description
This book describes novel software concepts to increase reliability under user-defined constraints. The authors’ approach bridges, for the first time, the reliability gap between hardware and software. Readers will learn how to achieve increased soft error resilience on unreliable hardware, while exploiting the inherent error masking characteristics and error (stemming from soft errors, aging, and process variations) mitigations potential at different software layers.
Author: Daniele Ielmini
Publisher: John Wiley & Sons
ISBN: 3527680942
Category : Technology & Engineering
Languages : en
Pages : 784
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Book Description
With its comprehensive coverage, this reference introduces readers to the wide topic of resistance switching, providing the knowledge, tools, and methods needed to understand, characterize and apply resistive switching memories. Starting with those materials that display resistive switching behavior, the book explains the basics of resistive switching as well as switching mechanisms and models. An in-depth discussion of memory reliability is followed by chapters on memory cell structures and architectures, while a section on logic gates rounds off the text. An invaluable self-contained book for materials scientists, electrical engineers and physicists dealing with memory research and development.
Author: Liming Xiu
Publisher: John Wiley & Sons
ISBN: 1119027322
Category : Technology & Engineering
Languages : en
Pages : 180
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Book Description
Written in a simple, easy to understand style, this book will teach PLL users how to use new clock technology in their work in order to create innovative applications. Investigates the clock frequency concept from a different perspective--at an application level Teaches engineers to use this new clocking technology to create innovations in chip/system level, through real examples extracted from commercial products
Author: Ed Lipiansky
Publisher: John Wiley & Sons
ISBN: 1118414543
Category : Technology & Engineering
Languages : en
Pages : 574
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Book Description
A practical guide for solving real-world circuit board problems Electrical, Electronics, and Digital Hardware Essentials for Scientists and Engineers arms engineers with the tools they need to test, evaluate, and solve circuit board problems. It explores a wide range of circuit analysis topics, supplementing the material with detailed circuit examples and extensive illustrations. The pros and cons of various methods of analysis, fundamental applications of electronic hardware, and issues in logic design are also thoroughly examined. The author draws on more than twenty-five years of experience in Silicon Valley to present a plethora of troubleshooting techniques readers can use in real-life situations. Plus, he devotes an entire chapter to the design of a small CPU, including all critical elements—the complete machine instruction set, from its execution path to logic implementation and timing analysis, along with power decoupling, resets, and clock considerations. Electrical, Electronics, and Digital Hardware Essentials for Scientists and Engineers covers: Resistors, inductors, and capacitors as well as a variety of analytical methods The elements of magnetism—an often overlooked topic in similar books Time domain and frequency analyses of circuit behavior Numerous electronics, from operational amplifiers to MOSFET transistors Both basic and advanced logic design principles and techniques This remarkable, highly practical book is a must-have resource for solid state circuit engineers, semiconductor designers and engineers, electric circuit testing engineers, and anyone dealing with everyday circuit analysis problems. A solutions manual is available to instructors. Please email
[email protected] to request the solutions manual. An errata sheet is available.
