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Author: Miloš Stanisavljević
Publisher: Springer Science & Business Media
ISBN: 1441962174
Category : Technology & Engineering
Languages : en
Pages : 215
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Book Description
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Author: Miloš Stanisavljević
Publisher: Springer Science & Business Media
ISBN: 1441962174
Category : Technology & Engineering
Languages : en
Pages : 215
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Book Description
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Author: Masashi Horiguchi
Publisher: Springer Science & Business Media
ISBN: 1441979581
Category : Technology & Engineering
Languages : en
Pages : 221
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Book Description
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Author: Masanori Hashimoto
Publisher: McGraw Hill Professional
ISBN: 0071787771
Category : Technology & Engineering
Languages : en
Pages : 417
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Book Description
Proven methods for noise-tolerant nanoscale integrated circuit design This leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and the latest design trends, including low-power design. Power Integrity for Nanoscale Integrated Systems describes how these problems can be forecast early in the design process and the countermeasures that can be used to address them, such as the inclusion of inductance and accurate modeling for PI analysis, as well as robust circuit design. Detailed examples and a case study on the IBM POWER7+ processor illustrate real-world applications of the techniques presented in this practical resource. Coverage includes: Significance of power integrity for integrated circuits Supply and substrate noise impact on circuits Clock generation and distribution with power integrity Signal and power integrity design for I/O circuits Power integrity degradation and modeling Lumped, distributed, and 3D modeling for power integrity Chip temperature and PI impact Low-power techniques and PI impact Power integrity case study using the IBM POWER7+ processor chip Carbon nanotube interconnects for power delivery
Author: Bhupendra Singh Reniwal
Publisher: CRC Press
ISBN: 1000985156
Category : Technology & Engineering
Languages : en
Pages : 213
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Book Description
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.
Author: Alexandre Schmid
Publisher: Springer Science & Business Media
ISBN: 3642048498
Category : Computers
Languages : en
Pages : 299
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Book Description
This book constitutes the proceedings of the 4th International Conference on Nano-Networks, Nano-Net 2009, held in Lucerne, Switherland, in October 2009. The 36 invited and regular papers address the whole spectrum of Nano-Networks and spans topis like modeling, simulation, statdards, architectural aspects, novel information and graph theory aspects, device physics and interconnects, nanorobotics as well as nano-biological systems. The volume also contains the workshop on Nano-Bio-Sensing Paradigms as well as the workshop on Brain Inspired Interconnects and Circuits.
Author: Mohsen Raji
Publisher: Springer Nature
ISBN: 3031153456
Category : Technology & Engineering
Languages : en
Pages : 113
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Book Description
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Author: Cardoso, Pedro J.S.
Publisher: IGI Global
ISBN: 152257333X
Category : Computers
Languages : en
Pages : 405
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Book Description
As innovators continue to explore and create new developments within the fields of artificial intelligence and computer science, subfields such as machine learning and the internet of things (IoT) have emerged. Now, the internet of everything (IoE), foreseen as a cohesive and intelligent connection of people, processes, data, and things, is theorized to make internet connections more valuable by converting information into wise actions that create unprecedented capabilities, richer experiences, and economic opportunities to all players in the market. Harnessing the Internet of Everything (IoE) for Accelerated Innovation Opportunities discusses the theoretical, design, evaluation, implementation, and use of innovative technologies within the fields of IoE, machine learning, and IoT. Featuring research on topics such as low-power electronics, mobile technology, and artificial intelligence, this book is ideally designed for computer engineers, software developers, investigators, advanced-level students, professors, and professionals seeking coverage on the various contemporary theories, technologies, and tools in IoE engineering.
Author: Zheng Wang
Publisher: Springer
ISBN: 9811010730
Category : Technology & Engineering
Languages : en
Pages : 210
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Book Description
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Author: Mourad Fakhfakh
Publisher: Springer
ISBN: 3319200712
Category : Computers
Languages : en
Pages : 360
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Book Description
This book explains the application of recent advances in computational intelligence – algorithms, design methodologies, and synthesis techniques – to the design of integrated circuits and systems. It highlights new biasing and sizing approaches and optimization techniques and their application to the design of high-performance digital, VLSI, radio-frequency, and mixed-signal circuits and systems. This second of two related volumes addresses digital and network designs and applications, with 12 chapters grouped into parts on digital circuit design, network optimization, and applications. It will be of interest to practitioners and researchers in computer science and electronics engineering engaged with the design of electronic circuits.
Author: Sandip Kundu
Publisher: McGraw Hill Professional
ISBN: 0071635203
Category : Technology & Engineering
Languages : en
Pages : 316
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Book Description
Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies
