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Author: United States. Advisory Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 608
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Book Description
Author: United States. Advisory Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 608
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Book Description
Author: Dhanasekharan Natarajan
Publisher: Springer
ISBN: 3319091115
Category : Technology & Engineering
Languages : en
Pages : 156
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Book Description
This book explains reliability techniques with examples from electronics design for the benefit of engineers. It presents the application of de-rating, FMEA, overstress analyses and reliability improvement tests for designing reliable electronic equipment. Adequate information is provided for designing computerized reliability database system to support the application of the techniques by designers. Pedantic terms and the associated mathematics of reliability engineering discipline are excluded for the benefit of comprehensiveness and practical applications. This book offers excellent support for electrical and electronics engineering students and professionals, bridging academic curriculum with industrial expectations.
Author: United States. Department of Defense. Research and Development Board. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 144
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Book Description
Author: Panel on Reliability Growth Methods for Defense Systems
Publisher: National Academy Press
ISBN: 9780309314749
Category : Technology & Engineering
Languages : en
Pages : 235
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Book Description
A high percentage of defense systems fail to meet their reliability requirements. This is a serious problem for the U.S. Department of Defense (DOD), as well as the nation. Those systems are not only less likely to successfully carry out their intended missions, but they also could endanger the lives of the operators. Furthermore, reliability failures discovered after deployment can result in costly and strategic delays and the need for expensive redesign, which often limits the tactical situations in which the system can be used. Finally, systems that fail to meet their reliability requirements are much more likely to need additional scheduled and unscheduled maintenance and to need more spare parts and possibly replacement systems, all of which can substantially increase the life-cycle costs of a system. Beginning in 2008, DOD undertook a concerted effort to raise the priority of reliability through greater use of design for reliability techniques, reliability growth testing, and formal reliability growth modeling, by both the contractors and DOD units. To this end, handbooks, guidances, and formal memoranda were revised or newly issued to reduce the frequency of reliability deficiencies for defense systems in operational testing and the effects of those deficiencies. "Reliability Growth" evaluates these recent changes and, more generally, assesses how current DOD principles and practices could be modified to increase the likelihood that defense systems will satisfy their reliability requirements. This report examines changes to the reliability requirements for proposed systems; defines modern design and testing for reliability; discusses the contractor's role in reliability testing; and summarizes the current state of formal reliability growth modeling. The recommendations of "Reliability Growth" will improve the reliability of defense systems and protect the health of the valuable personnel who operate them.
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
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Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Geoffrey William Arnold Dummer
Publisher:
ISBN:
Category : Electronic Apparatus & Appliances
Languages : en
Pages : 322
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Book Description
Author: United States. Navy. Electronics Laboratory
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 508
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Book Description
Author:
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 236
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Book Description
Author:
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
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Book Description
Author: United States. Congress Senate
Publisher:
ISBN:
Category :
Languages : en
Pages : 2594
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Book Description
