Author: Tom Wit
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769520049
Category : Computers
Languages : en
Pages : 116
Book Description
"IEEE Computer Society Order Number PR02004"--T.p. verso.
Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
Author: Tom Wit
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769520049
Category : Computers
Languages : en
Pages : 116
Book Description
"IEEE Computer Society Order Number PR02004"--T.p. verso.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769520049
Category : Computers
Languages : en
Pages : 116
Book Description
"IEEE Computer Society Order Number PR02004"--T.p. verso.
Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
Author: Thomas Wik
Publisher:
ISBN:
Category :
Languages : en
Pages : 95
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 95
Book Description
American Book Publishing Record
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 864
Book Description
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 864
Book Description
Object-Oriented Technology.ECOOP 2006 Workshop Reader
Author: Mario Südholt
Publisher: Springer
ISBN: 3540717749
Category : Computers
Languages : en
Pages : 165
Book Description
This book contains the final reports of 19 workshops held during the 20th European Conference on Object-Oriented Programming, ECOOP 2006, held in Nantes, France in July 2006. The 19 reports cover the entire range of object technology and related topics, presenting a coherent and highly representative snapshot of the major trends in the field.
Publisher: Springer
ISBN: 3540717749
Category : Computers
Languages : en
Pages : 165
Book Description
This book contains the final reports of 19 workshops held during the 20th European Conference on Object-Oriented Programming, ECOOP 2006, held in Nantes, France in July 2006. The 19 reports cover the entire range of object technology and related topics, presenting a coherent and highly representative snapshot of the major trends in the field.
Proceedings
Author:
Publisher:
ISBN:
Category : Computer architecture
Languages : en
Pages : 308
Book Description
Publisher:
ISBN:
Category : Computer architecture
Languages : en
Pages : 308
Book Description
ACM SIGPLAN Notices
Author:
Publisher:
ISBN:
Category : Programming languages (Electronic computers)
Languages : en
Pages : 448
Book Description
Publisher:
ISBN:
Category : Programming languages (Electronic computers)
Languages : en
Pages : 448
Book Description
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
MTDT 2004
Author: IEEE International Workshop on Memory Technology, Design and Testing
Publisher:
ISBN:
Category : Random access memory
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Random access memory
Languages : en
Pages :
Book Description
31st Annual International Symposium on Computer Architecture
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computer architecture
Languages : en
Pages : 412
Book Description
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computer architecture
Languages : en
Pages : 412
Book Description
Autonomous Vehicle Technology
Author: James M. Anderson
Publisher: Rand Corporation
ISBN: 0833084372
Category : Transportation
Languages : en
Pages : 215
Book Description
The automotive industry appears close to substantial change engendered by “self-driving” technologies. This technology offers the possibility of significant benefits to social welfare—saving lives; reducing crashes, congestion, fuel consumption, and pollution; increasing mobility for the disabled; and ultimately improving land use. This report is intended as a guide for state and federal policymakers on the many issues that this technology raises.
Publisher: Rand Corporation
ISBN: 0833084372
Category : Transportation
Languages : en
Pages : 215
Book Description
The automotive industry appears close to substantial change engendered by “self-driving” technologies. This technology offers the possibility of significant benefits to social welfare—saving lives; reducing crashes, congestion, fuel consumption, and pollution; increasing mobility for the disabled; and ultimately improving land use. This report is intended as a guide for state and federal policymakers on the many issues that this technology raises.