Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing PDF full book. Access full book title Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing by Bernard Courtois. Download full books in PDF and EPUB format.
Author: Bernard Courtois
Publisher: IEEE Computer Society Press
ISBN: 9780769516172
Category : Computers
Languages : en
Pages : 202
Get Book Here
Book Description
Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
Author: Bernard Courtois
Publisher: IEEE Computer Society Press
ISBN: 9780769516172
Category : Computers
Languages : en
Pages : 202
Get Book Here
Book Description
Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
Author: Rino Micheloni
Publisher: Springer Science & Business Media
ISBN: 1402083912
Category : Technology & Engineering
Languages : en
Pages : 338
Get Book Here
Book Description
Nowadays it is hard to find an electronic device which does not use codes: for example, we listen to music via heavily encoded audio CD's and we watch movies via encoded DVD's. There is at least one area where the use of encoding/decoding is not so developed, yet: Flash non-volatile memories. Flash memory high-density, low power, cost effectiveness, and scalable design make it an ideal choice to fuel the explosion of multimedia products, like USB keys, MP3 players, digital cameras and solid-state disk. In ECC for Non-Volatile Memories the authors expose the basics of coding theory needed to understand the application to memories, as well as the relevant design topics, with reference to both NOR and NAND Flash architectures. A collection of software routines is also included for better understanding. The authors form a research group (now at Qimonda) which is the typical example of a fruitful collaboration between mathematicians and engineers.
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
Get Book Here
Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Get Book Here
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author:
Publisher:
ISBN:
Category : Electronic circuit design
Languages : en
Pages : 298
Get Book Here
Book Description
Author: Giovanni Campardo
Publisher: Springer Science & Business Media
ISBN: 9783540201984
Category : Computers
Languages : en
Pages : 616
Get Book Here
Book Description
VLSI-Design for Non-Volatile Memories is intended for electrical engineers and graduate students who want to enter into the integrated circuit design world. Non-volatile memories are treated as an example to explain general design concepts. Practical illustrative examples of non-volatile memories, including flash types, are showcased to give insightful examples of the discussed design approaches. A collection of photos is included to make the reader familiar with silicon aspects. Throughout all parts of this book, the authors have taken a practical and applications-driven point of view, providing a comprehensive and easily understood approach to all the concepts discussed. Giovanni Campardo and Rino Micheloni have a solid track record of leading design activities at the STMicroelectronics Flash Division. David Novosel is President and founder of Intelligent Micro Design, Inc., Pittsburg, PA.
Author: British Library. Document Supply Centre
Publisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 836
Get Book Here
Book Description
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
Get Book Here
Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author:
Publisher:
ISBN:
Category : Books
Languages : en
Pages : 2068
Get Book Here
Book Description
Author: Michel Renovell
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 540
Get Book Here
Book Description
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
