Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization PDF Download
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Author: Chandra Shakher Pathak
Publisher: BoD – Books on Demand
ISBN: 1839682299
Category : Science
Languages : en
Pages : 275
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Book Description
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Author: Chandra Shakher Pathak
Publisher: BoD – Books on Demand
ISBN: 1839682299
Category : Science
Languages : en
Pages : 275
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Book Description
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Author: Tomasz Tański
Publisher: BoD – Books on Demand
ISBN: 1789851696
Category : Science
Languages : en
Pages : 116
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Book Description
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
Author: R.W. Cahn
Publisher: Elsevier
ISBN: 1483287513
Category : Technology & Engineering
Languages : en
Pages : 670
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Book Description
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
Author: Ch Sateesh Kumar
Publisher: CRC Press
ISBN: 1000872335
Category : Technology & Engineering
Languages : en
Pages : 152
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Book Description
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
Author: Pankaj Sharma
Publisher: Springer Nature
ISBN: 9819925835
Category : Ferrites (Magnetic materials)
Languages : en
Pages : 260
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Book Description
This book edited by leading experts focuses on the foundation of ferrite materials since inception to its contemporary scenario including their vast applications. The contents range from the basic physics and chemistry of ferrites to its applications in telecommunication, SAR reduction, EMI shielding, hyperthermia treatment, and water decontamination. It also focuses on ferrite nanoparticles for sensing application, energy-storage applications, antimicrobial applications, corrosion protection applications, among others. This book is a useful reference to those in academia and industry.
Author: Kaushik Kumar
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110997592
Category : Technology & Engineering
Languages : en
Pages : 270
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Book Description
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.
Author: Akira Otsuki
Publisher: Elsevier
ISBN: 0323984789
Category : Science
Languages : en
Pages : 842
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Book Description
Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments. From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis. Provides an overview of a wide-range of NDT material characterization methods, strengths and weaknesses of these methods, when to apply them, and more Includes eddy current sensing and imaging, ultrasonic sensing and imaging, RF and THz imaging, internet and cloud-based methods, among many others Presents case studies, applications and other insights on putting these methods into practice
Author: Ji-Xin Cheng
Publisher: Elsevier
ISBN: 0323903371
Category : Science
Languages : en
Pages : 612
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Book Description
Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics
Author: Euth Ortiz Ortega
Publisher: Springer Nature
ISBN: 9811695695
Category : Science
Languages : en
Pages : 314
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Book Description
This book presents commonly applied characterization techniques in material science, their brief history and origins, mechanism of operation, advantages and disadvantages, their biosensing applications, and troubleshooting for each technique, while addressing the challenges researchers face when working with these techniques. The book dedicates its focus to identifying physicochemical and electrochemical nature of materials including analyses of morphology, mass spectrometry, and topography, as well as the characterization of elemental, structural, thermal, wettability, electrochemical, and chromatography properties. Additionally, the main features and benefits of using coupled characterization techniques are discussed in this book.
Author: National Research Council
Publisher: National Academies Press
ISBN: 030916463X
Category : Science
Languages : en
Pages : 222
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Book Description
Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.
