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Author: Padmanabhan Krishna
Publisher: Pergamon
ISBN:
Category : X-ray crystallography
Languages : en
Pages : 288
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Book Description
Author: Padmanabhan Krishna
Publisher: Pergamon
ISBN:
Category : X-ray crystallography
Languages : en
Pages : 288
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Book Description
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
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Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: Zainal Arifin Ahmad
Publisher: Trans Tech Publications Ltd
ISBN: 3038139416
Category : Technology & Engineering
Languages : en
Pages : 550
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Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
Author: Gavin R. Mallett
Publisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
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Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Author: Gregory J. McCarthy
Publisher: Springer
ISBN: 9780306401633
Category : Science
Languages : en
Pages : 0
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Book Description
Many of the science and engineering problems under investiga tion at industry, government and university laboratories come under the headings "energy, materials and resources." X-ray analysis plays a key role in these investigations. This is reflected in the content of the present volume of Advances in X-ray Analysis. Nearly half of the papers come under such headings as energy production and conversion, materials optimization and mineral characterization. The remainder continue the long tradition of this series in pre senting the latest advances in apparatus and procedures for x-ray diffraction and fluorescence analyses. In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data. The first group of papers in this volume were presented in a plenary session on unusual specimen preparation, handling and analy ses by x-ray diffraction. In the lead paper, D. K. Smith and C. S. Barrett combine their seven decades of experience with surveys of diffractionists throughout the world to present a comprehensive re view of non-routine specimen preparation in powder diffractometry. Next, M. J. Camp discusses the particular procedures and constraints under which foresnic laboratories employ diffraction methods. F. A. Mauer and C. R. Robbins discuss a method for characteri zation of high temperature-pressure reactions in situ by energy dis persive x-ray diffraction that offers the promise of sorting out the mechanisms underlying materials compatibility and durability.
Author: Jacques Desrues
Publisher: John Wiley & Sons
ISBN: 0470394846
Category : Science
Languages : en
Pages : 454
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Book Description
This book brings together a total of 48 contributions (including 5 keynote papers) which were presented at the 2nd International Workshop on the Application of X-ray CT for Geomaterials (GeoX 2006) held in Aussois, France, on 4-7 October, 2006. The contributions cover a wide range of topics, from fundamental characterization of material behavior to applications in geotechnical and geoenvironmental engineering. Recent advances of X-ray technology, hardware and software are also discussed. As such, this will be valuable reading for anyone interested in the application of X-ray CT to geomaterials from both fundamental and applied perspectives.
Author: Leonardo Abbene
Publisher: Springer Nature
ISBN: 3031209559
Category : Technology & Engineering
Languages : en
Pages : 246
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Book Description
This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.
Author: Ashok Kumar Singh
Publisher: IOS Press
ISBN: 9781586035372
Category : Medical
Languages : en
Pages : 604
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Book Description
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
