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Author: Symposium on Progress in Quantitative Surface Analysis
Publisher: ASTM International
ISBN: 9780803105430
Category : Analytical chemistry
Languages : en
Pages : 220
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Book Description
Author: Symposium on Progress in Quantitative Surface Analysis
Publisher: ASTM International
ISBN: 9780803105430
Category : Analytical chemistry
Languages : en
Pages : 220
Get Book
Book Description
Author: N. S. MacIntyre
Publisher:
ISBN:
Category :
Languages : en
Pages : 214
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Book Description
Author: Graham C. Smith
Publisher: Maney Publishing
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 194
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Book Description
Discusses the range of methods used to describe the structure, composition, and chemical nature of material surfaces, comparing the merits of each. The techniques standardly used in analytical laboratories auger electron and x-ray photoelectron spectroscopy, and secondary mass ion spectrometry are d
Author: D.J. O'Connor
Publisher: Springer Science & Business Media
ISBN: 366205227X
Category : Technology & Engineering
Languages : en
Pages : 588
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: D.J. O'Connor
Publisher: Springer Science & Business Media
ISBN: 3662027674
Category : Science
Languages : en
Pages : 457
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Book Description
The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University.
Author: John O'Connor
Publisher: Springer Science & Business Media
ISBN: 9783540413301
Category : Science
Languages : en
Pages : 626
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: D. John O'Connor
Publisher: Springer
ISBN:
Category : Surfaces (Technology)
Languages : en
Pages : 488
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction, a techniques section and a section on applications. Each chapter has been written by specialists in the field. This book is aimed at industrial scientists and engineers in R&D seeking a description of available techniques in a concise but informative style. It is invaluable as a comprehensive text for scientists and engineers attending training courses and workshops. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273807
Category : Science
Languages : en
Pages : 544
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Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469146
Category : Technology & Engineering
Languages : en
Pages : 430
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Book Description
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Author: John C. Vickerman
Publisher: John Wiley & Sons
ISBN: 1119965519
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
