Progress Report on Reliability of Electronic Equipment PDF Download
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Author: United States. Research and Development Board. Committee on Electronics. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category :
Languages : en
Pages : 129
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Book Description
Author: United States. Department of Defense. Research and Development Board. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 144
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Book Description
Author: United States. Research and Development Board. Committee on Electronics. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category :
Languages : en
Pages : 129
Get Book Here
Book Description
Author: United States. Department of Defense. Research and Development Board. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category :
Languages : en
Pages : 129
Get Book Here
Book Description
Author: United States. Department of Defense. Research and Development Board. Committee on Electronics
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: United States. Dept. of Defense. Research and Development Board. Ad Hoc Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category :
Languages : en
Pages : 129
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Carlotta M. Vidoni
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 68
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Book Description
Author: United States. Advisory Group on Reliability of Electronic Equipment
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 608
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Book Description
Author: Eugene R. Hnatek
Publisher: CRC Press
ISBN: 0824743547
Category : Technology & Engineering
Languages : en
Pages : 433
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Book Description
Practical Reliability of Electronic Equipment and Products will help electrical, electronics, manufacturing, mechanical, systems design, and reliability engineers; electronics production managers; electronic circuit designers; and upper-level undergraduate and graduate students in these disciplines.
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
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Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
