Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
ISBN: 9783540676805
Category : Medical
Languages : en
Pages : 400
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Progress in Transmission Electron Microscopy 1
Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
ISBN: 9783540676805
Category : Medical
Languages : en
Pages : 400
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Publisher: Springer Science & Business Media
ISBN: 9783540676805
Category : Medical
Languages : en
Pages : 400
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Progress in Transmission Electron Microscopy 2
Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
ISBN: 9783540676812
Category : Medical
Languages : en
Pages : 342
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Publisher: Springer Science & Business Media
ISBN: 9783540676812
Category : Medical
Languages : en
Pages : 342
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Transmission Electron Microscopy
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135531
Category : Science
Languages : en
Pages : 532
Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Publisher: Springer
ISBN: 3662135531
Category : Science
Languages : en
Pages : 532
Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Progress in Transmission Electron Microscopy
Author: Xiao-Feng Zhang
Publisher:
ISBN: 9787302035893
Category : Science
Languages : en
Pages : 332
Book Description
Publisher:
ISBN: 9787302035893
Category : Science
Languages : en
Pages : 332
Book Description
Research in Progress
Author:
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 514
Book Description
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 514
Book Description
Progress in Thermal Barrier Coatings
Author: ACerS (American Ceramics Society, The)
Publisher: John Wiley & Sons
ISBN: 9780470526248
Category : Technology & Engineering
Languages : en
Pages : 628
Book Description
This edition of the Progress in Ceramic Technology series compiles articles published on thermal barrier coatings (TBCs) by The American Ceramic Society (ACerS). It collects in one resource the current research papers on materials-related aspects of thermal barrier coatings and associated technologies. Logically organized and carefully selected, the papers in this edition divide into six categories: Applications Material Improvements and Novel Compositions Developments in Processing Mechanical Properties Thermal Properties Citations follow each title in the table of contents, making this a key resource for professionals and academia.
Publisher: John Wiley & Sons
ISBN: 9780470526248
Category : Technology & Engineering
Languages : en
Pages : 628
Book Description
This edition of the Progress in Ceramic Technology series compiles articles published on thermal barrier coatings (TBCs) by The American Ceramic Society (ACerS). It collects in one resource the current research papers on materials-related aspects of thermal barrier coatings and associated technologies. Logically organized and carefully selected, the papers in this edition divide into six categories: Applications Material Improvements and Novel Compositions Developments in Processing Mechanical Properties Thermal Properties Citations follow each title in the table of contents, making this a key resource for professionals and academia.
Recent progress of in-situ/operando characterization approaches of zinc-air batteries
Author: Jian-Feng Xiong
Publisher: OAE Publishing Inc.
ISBN:
Category : Science
Languages : en
Pages : 26
Book Description
Zinc-air batteries (ZABs) belong to the category of metal-air batteries, with high theoretical energy density, safety, and low cost. Nevertheless, there are still many challenges that need to be solved for the practical application of ZABs, including high overpotential, poor cycle life, and so on. This article first briefly introduced the principle of ZABs, covering the key components, functions of each element, and challenges faced by the system. Subsequently, seven methods for studying ZABs in-situ or operando were introduced, including X-ray computed tomography (XCT), optical microscopy imaging (OMI), transmission electron microscopy (TEM), nuclear magnetic resonance imaging (MRI), X-ray diffraction (XRD), Raman spectroscopy, and X-ray absorption spectroscopy (XAS), accompanied by specific research examples. The future perspectives of ZAB characterization have also been discussed.
Publisher: OAE Publishing Inc.
ISBN:
Category : Science
Languages : en
Pages : 26
Book Description
Zinc-air batteries (ZABs) belong to the category of metal-air batteries, with high theoretical energy density, safety, and low cost. Nevertheless, there are still many challenges that need to be solved for the practical application of ZABs, including high overpotential, poor cycle life, and so on. This article first briefly introduced the principle of ZABs, covering the key components, functions of each element, and challenges faced by the system. Subsequently, seven methods for studying ZABs in-situ or operando were introduced, including X-ray computed tomography (XCT), optical microscopy imaging (OMI), transmission electron microscopy (TEM), nuclear magnetic resonance imaging (MRI), X-ray diffraction (XRD), Raman spectroscopy, and X-ray absorption spectroscopy (XAS), accompanied by specific research examples. The future perspectives of ZAB characterization have also been discussed.
Progress in Acarology
Author: G. P. Channabasavanna
Publisher: Brill Archive
ISBN: 9789004085268
Category : Acarology
Languages : en
Pages : 548
Book Description
Publisher: Brill Archive
ISBN: 9789004085268
Category : Acarology
Languages : en
Pages : 548
Book Description
Progress in Nanoscale Characterization and Manipulation
Author: Rongming Wang
Publisher: Springer
ISBN: 9811304548
Category : Science
Languages : en
Pages : 511
Book Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Publisher: Springer
ISBN: 9811304548
Category : Science
Languages : en
Pages : 511
Book Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Progress in Optics
Author:
Publisher: Elsevier
ISBN: 9780080880037
Category : Science
Languages : en
Pages : 293
Book Description
Progress in Optics is a well-established series of volumes of review articles dealing with theoretical and applied optics and related subjects. Widely acclaimed by numerous reviewers as representing an authoritative and up-to-date source of information in all branches of optics, the series continues to fulfil a genuine need within the scientific community. Articles are contributed by leading scientists (including two Nobel Prize winners) chosen by the Editor, with the advice of an international panel of experts constituting the Editorial Advisory Board. Many of the articles appearing in these volumes have since been established as basic references in their respective fields.
Publisher: Elsevier
ISBN: 9780080880037
Category : Science
Languages : en
Pages : 293
Book Description
Progress in Optics is a well-established series of volumes of review articles dealing with theoretical and applied optics and related subjects. Widely acclaimed by numerous reviewers as representing an authoritative and up-to-date source of information in all branches of optics, the series continues to fulfil a genuine need within the scientific community. Articles are contributed by leading scientists (including two Nobel Prize winners) chosen by the Editor, with the advice of an international panel of experts constituting the Editorial Advisory Board. Many of the articles appearing in these volumes have since been established as basic references in their respective fields.