Proceedings of the Second Symposium on Defects in Silicon PDF Download
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Author: W. Murray Bullis
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 716
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Book Description
Author: W. Murray Bullis
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 716
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Book Description
Author:
Publisher:
ISBN:
Category : Semiconductor wafers
Languages : en
Pages : 508
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Book Description
Author: P. Rai-Choudhury
Publisher: The Electrochemical Society
ISBN: 9781566771399
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
Author: Jerzy Rużyłło
Publisher: The Electrochemical Society
ISBN: 9781566771887
Category : Technology & Engineering
Languages : en
Pages : 668
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Book Description
Author: Cor L. Claeys
Publisher: The Electrochemical Society
ISBN: 9781566773089
Category : Technology & Engineering
Languages : en
Pages : 636
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Book Description
Author: Dieter K. Schroder
Publisher: The Electrochemical Society
ISBN: 9781566770927
Category : Technology & Engineering
Languages : en
Pages : 408
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Book Description
Author: Yue Kuo
Publisher: The Electrochemical Society
ISBN: 9781566770941
Category : Technology & Engineering
Languages : en
Pages : 428
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Book Description
Author:
Publisher:
ISBN:
Category : Adsorption
Languages : en
Pages : 952
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Book Description
Author: A.G. Cullis
Publisher: CRC Press
ISBN: 1000157016
Category : Science
Languages : en
Pages : 836
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Book Description
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
Author: Banh Tien Long
Publisher: Springer Nature
ISBN: 3030696103
Category : Technology & Engineering
Languages : en
Pages : 1088
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Book Description
This book presents selected, peer-reviewed proceedings of the 2nd International Conference on Material, Machines and Methods for Sustainable Development (MMMS2020), held in the city of Nha Trang, Vietnam, from 12 to 15 November, 2020. The purpose of the conference is to explore and ensure an understanding of the critical aspects contributing to sustainable development, especially materials, machines and methods. The contributions published in this book come from authors representing universities, research institutes and industrial companies, and reflect the results of a very broad spectrum of research, from micro- and nanoscale materials design and processing, to mechanical engineering technology in industry. Many of the contributions selected for these proceedings focus on materials modeling, eco-material processes and mechanical manufacturing.
