Author:
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 622
Book Description
Proceedings of the International Congress on High Speed Photography and Photonics
Proceedings of the 15th International Congress on High Speed Photography and Photonics, August 21-27, 1982, San Diego, California, USA
Author: Lincoln L. Endelman
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 510
Book Description
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 510
Book Description
Proceedings of the 16th International Congress on High Speed Photography and Photonics, 27-31 August 1984, Strasbourg, France
Author:
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 614
Book Description
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 614
Book Description
Techniques
Author: Joseph R. Lakowicz
Publisher: Springer Science & Business Media
ISBN: 0306470578
Category : Science
Languages : en
Pages : 462
Book Description
In this inaugural volume of a new series, experts in the field help biochemists, analytical chemists, spectroscopists, biophysicists, and other specialists keep up with the latest techniques and technologies available in fluorescence spectroscopy.
Publisher: Springer Science & Business Media
ISBN: 0306470578
Category : Science
Languages : en
Pages : 462
Book Description
In this inaugural volume of a new series, experts in the field help biochemists, analytical chemists, spectroscopists, biophysicists, and other specialists keep up with the latest techniques and technologies available in fluorescence spectroscopy.
Proceedings of the 1985 Annual DTIC Users Conference
Author:
Publisher:
ISBN:
Category : Communication of technical information
Languages : en
Pages : 236
Book Description
Publisher:
ISBN:
Category : Communication of technical information
Languages : en
Pages : 236
Book Description
Selected Papers on Scientific and Engineering High-speed Photography
Author: Dennis L. Paisley
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Photography
Languages : en
Pages : 720
Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Photography
Languages : en
Pages : 720
Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
High Speed Photography, Videography, and Photonics
Author:
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 300
Book Description
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 300
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Detonation
Languages : en
Pages : 830
Book Description
Publisher:
ISBN:
Category : Detonation
Languages : en
Pages : 830
Book Description
Liquid Particle Size Measurement Techniques
Author: Julian M. Tishkoff
Publisher: ASTM International
ISBN: 9780803102279
Category : Technology & Engineering
Languages : en
Pages : 198
Book Description
Publisher: ASTM International
ISBN: 9780803102279
Category : Technology & Engineering
Languages : en
Pages : 198
Book Description
Fast Electrical and Optical Measurements
Author: D.J. Thompson
Publisher: Springer Science & Business Media
ISBN: 9401704457
Category : Technology & Engineering
Languages : en
Pages : 1065
Book Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
Publisher: Springer Science & Business Media
ISBN: 9401704457
Category : Technology & Engineering
Languages : en
Pages : 1065
Book Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).