Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf PDF Download
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Author: Gijs Bosman
Publisher: World Scientific
ISBN: 9814490695
Category : Technology & Engineering
Languages : en
Pages : 850
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Book Description
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.
Author: Gijs Bosman
Publisher: World Scientific
ISBN: 9814490695
Category : Technology & Engineering
Languages : en
Pages : 850
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Book Description
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.
Author: C Claeys
Publisher: World Scientific
ISBN: 9814546143
Category :
Languages : en
Pages : 702
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Book Description
The recent conferences in this series were organised in Montreal (1987), Budapest (1989), Kyoto (1991), St Louis (1993) and Palanga (1995). The aim of the conference was to bring together specialists in fluctuation phenomena from different fields and to make a bridge between theoretical scientists and more applied or engineering oriented researchers. Therefore a broad variety of topics covering the fundamental aspects of noise and fluctuations as well as applications in various fields are addressed. Noise in materials, components, circuits and electronic, biological and other physical systems are discussed.
Author: Vytautas Bareikis
Publisher: World Scientific
ISBN: 9814549177
Category :
Languages : en
Pages : 770
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Book Description
The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.
Author: Gijs Bosman
Publisher: World Scientific
ISBN: 9812811168
Category : Electronic noise
Languages : en
Pages : 850
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Book Description
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide. Contents: Noise in Nanoscale Devices (S Bandyopadhyay et al.); 1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors (O V Gerashchenko); Low Frequency Noise Analysis of Different Types of Polysilicon Resistors (A Penarier et al.); Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different Technologies (P Fantini et al.); Modeling of Current Transport and 1/f Noise in GaN Based HBTs (H Unlu); Low Frequency Noise in CdSe Thin Film Transistors (M J Deen & S Rumyanstsev); NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nm (G Obarski); Physical Model of the Current Noise Spectral Density Versus Dark Current in CdTe Detectors (A Imad et al.); Time and Frequency Study of RTS in Bipolar Transistors (A Penarier et al.); Neural Network Based Adaptive Processing of Electrogastrogram (S Selvan); Shot Noise as a Test of Entanglement and Nonlocality of Electrons in Mesoscopic Systems (E V Sukhorukov et al.); The Readout of Time, Continued Fractions and 1/f Noise (M Planat & J Cresson); Longitudinal and Transverse Noise of Hot Electrons in 2DEG Channels (J Liberis et al.); 1/f Noise, Intermittency and Clustering Poisson Process (F Gruneis); Noise Modeling for PDE Based Device Simulations (F Bonani & G Ghione); Methods of Slope Estimation of Noise Power Spectral Density (J Smulko); and other papers. Readership: Researchers, academics and graduate students in electrical and electronic engineering, biophysics, nanoscience, applied physics, statistical physics and semiconductor science.
Author: I. D. Mayergoyz
Publisher: Gulf Professional Publishing
ISBN: 9780123694324
Category : Science
Languages : en
Pages : 664
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Book Description
Volume 1 covers: * Mathematical models * Differential equations * Stochastic aspects of hysteresis * Binary detection using hysteresis * Models of unemployment in economics Volume 2 covers: * Physical models of magnetic hysteresis * All aspects of magnetisation dynamics Volume 3 covers: * Hysteresis phenomena in materials * Over 2100 pages, rich with supporting illustrations, figures and equations * Contains contributions from an international list of authors, from a wide-range of disciplines * Covers all aspects of hysteresis - from differential equations, and binary detection, to models of unemployment and magnetisation dynamics.
Author: Paul Herman Ernst Meijer
Publisher:
ISBN:
Category : Electronic noise
Languages : en
Pages : 436
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Book Description
Author: Taoufik Bourdi
Publisher: Springer Science & Business Media
ISBN: 1402059280
Category : Technology & Engineering
Languages : en
Pages : 215
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Book Description
In this book, the authors outline detailed design methodology for fast frequency hopping synthesizers for RF and wireless communications applications. There is great emphasis on fractional-N delta-sigma based phase locked loops from specifications, system analysis and architecture planning to circuit design and silicon implementation. The developed techniques in the book can help in designing very low noise, high speed fractional-N frequency synthesizers.
Author: Hans Hartnagel
Publisher: John Wiley & Sons
ISBN: 9780471384328
Category : Technology & Engineering
Languages : en
Pages : 316
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Book Description
A thorough reference work bridging the gap between contemporary and traditional approaches to noise problems Noise in semiconductor devices refers to any unwanted signal or disturbance in the device that degrades performance. In semiconductor devices, noise is attributed to hot-electron effects. Current advances in information technology have led to the development of ultrafast devices that are required to provide low-noise, high-speed performance. Microwave Noise in Semiconductor Devices considers available data on the speed versus noise trade-off and discusses optimal solutions in semiconductors and semiconductor structures. These solutions are of direct interest in the research and development for fast, efficient, and reliable communications systems. As the only book of its kind accessible to practicing engineers, the material is divided into four parts-the kinetic theory of fluctuations and its corollaries, the methods of measurements of microwave noise, low-dimensional structures, and, finally, devices. With over 100 illustrations presenting recent experimental data for up-to-date semiconductor structures designed for ultrafast electronics, together with results of microscopic simulation where available, these examples, tables, and references offer a full comprehension of electronic processes and fluctuation in dimensionally quantizing structures. Bridging the apparent gap between the microscopic approach and the equivalent circuit approach, Microwave Noise in Semiconductor Devices considers microwave fluctuation phenomena and noise in terms of ultrafast kinetic processes specific to modern quantum-well structures. Scientists in materials science, semiconductor and solid-state physics, electronic engineers, and graduate students will all appreciate this indispensable review of contemporary and future microwave and high-speed electronics.
Author: Giorgio Bertotti
Publisher: Elsevier
ISBN: 0080540783
Category : Science
Languages : en
Pages : 2144
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Book Description
Volume 1 covers: * Mathematical models * Differential equations * Stochastic aspects of hysteresis * Binary detection using hysteresis * Models of unemployment in economics Volume 2 covers: * Physical models of magnetic hysteresis * All aspects of magnetisation dynamics Volume 3 covers: * Hysteresis phenomena in materials* Over 2100 pages, rich with supporting illustrations, figures and equations * Contains contributions from an international list of authors, from a wide-range of disciplines * Covers all aspects of hysteresis - from differential equations, and binary detection, to models of unemployment and magnetisation dynamics
Author: Tibor Grasser
Publisher: Springer Nature
ISBN: 3030375005
Category : Technology & Engineering
Languages : en
Pages : 724
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Book Description
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
