Proceedings International Test Conference 2002 PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Proceedings International Test Conference 2002 PDF full book. Access full book title Proceedings International Test Conference 2002 by . Download full books in PDF and EPUB format.
Author:
Publisher:
ISBN: 9780780375420
Category : Electronic digital computers
Languages : en
Pages : 1250
Get Book Here
Book Description
Author:
Publisher:
ISBN: 9780780375420
Category : Electronic digital computers
Languages : en
Pages : 1250
Get Book Here
Book Description
Author:
Publisher:
ISBN: 9780780375420
Category : Automatic test equipment
Languages : en
Pages :
Get Book Here
Book Description
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Get Book Here
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1351830996
Category : Technology & Engineering
Languages : en
Pages : 773
Get Book Here
Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: Erik Larsson
Publisher: Springer Science & Business Media
ISBN: 0387256245
Category : Technology & Engineering
Languages : en
Pages : 397
Get Book Here
Book Description
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author: Patrick Girard
Publisher: Springer Science & Business Media
ISBN: 1441909281
Category : Technology & Engineering
Languages : en
Pages : 376
Get Book Here
Book Description
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author: Xiao Liu
Publisher: Springer Science & Business Media
ISBN: 3319005332
Category : Technology & Engineering
Languages : en
Pages : 118
Get Book Here
Book Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
Get Book Here
Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Author: H. S. Saini
Publisher: Springer Nature
ISBN: 9811685126
Category : Technology & Engineering
Languages : en
Pages : 613
Get Book Here
Book Description
This book covers various streams of communication engineering like signal processing, VLSI design, embedded systems, wireless communications and electronics and communications in general. The book is a collection of best selected research papers presented at 9th International Conference on Innovations in Electronics and Communication Engineering at Guru Nanak Institutions Hyderabad, India. The book presents works from researchers, technocrats and experts about latest technologies in electronic and communication engineering. The authors have discussed the latest cutting edge technology, and the book will serve as a reference for young researchers.
Author: Hongjiang Song
Publisher: Lulu.com
ISBN: 1329199812
Category : Technology & Engineering
Languages : en
Pages : 390
Get Book Here
Book Description
This book covers various VLSI circuit noise effects and VLSI noise processing circuit implementations. All materials are organized in am unified framework with VLSI noise modeling and noise processing circuits across various VLSI signal domains.
