Uncovering Student Ideas in Science: 25 formative assessment probes PDF Download
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Author: Page Keeley
Publisher: NSTA Press
ISBN: 0873552555
Category : Education
Languages : en
Pages : 206
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Book Description
V. 1. Physical science assessment probes -- Life, Earth, and space science assessment probes.
Author: Page Keeley
Publisher: NSTA Press
ISBN: 0873552555
Category : Education
Languages : en
Pages : 206
Get Book Here
Book Description
V. 1. Physical science assessment probes -- Life, Earth, and space science assessment probes.
Author: Page Keeley
Publisher: NSTA Press
ISBN: 1936137518
Category : Science
Languages : en
Pages : 185
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Book Description
Author Page Keeley continues to provide KOCo12 teachers with her highly usable and popular formula for uncovering and addressing the preconceptions that students bring to the classroomOCothe formative assessment probeOCoin this first book devoted exclusively to life science in her Uncovering Student Ideas in Science series. Keeley addresses the topics of life and its diversity; structure and function; life processes and needs of living things; ecosystems and change; reproduction, life cycles, and heredity; and human biology."
Author: Page D. Keeley
Publisher: NSTA Press
ISBN: 1935155180
Category : Education
Languages : en
Pages : 240
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Book Description
This is a must-have book if you're going to tackle the challenging concepts of force and motion in your classroom. --
Author: Page Keeley
Publisher: NSTA Press
ISBN: 1933531738
Category : Education
Languages : en
Pages : 209
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Book Description
The popular features from Volume 1 are all here. The field-tested probes are short, easy to administer, and ready to reproduce. Teacher materials explain science content and suggest grade-appropriate ways to present information. But Volume 2 covers more life science and Earth and space science probes. Volume 2 also suggests ways to embed the probes throughout your instruction, not just when starting a unit or topic.
Author: Page Keeley
Publisher: NSTA Press
ISBN: 1936137380
Category : Education
Languages : en
Pages : 287
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Book Description
What do your students know-- or think they know-- about what causes night and day, why days are shorter in winter, and how to tell a planet from a star? Find out with this book on astronomy, the latest in NSTA' s popular Uncovering Student Ideas in Science series. The 45 astronomy probes provide situations that will pique your students' interest while helping you understand how your students think about key ideas related to the universe and how it operates. The book is organized into five sections: the Nature of Planet Earth; the Sun-Earth System; Modeling the Moon; Dynamic Solar System; and Stars, Galaxies, and the Universe. As the authors note, it' s not always easy to help students untangle mistaken ideas. Using this powerful set of tools to identify students' preconceptions is an excellent first step to helping your students achieve scientific understanding.
Author: Ernst Meyer
Publisher: Springer Nature
ISBN: 3030370895
Category : Science
Languages : en
Pages : 330
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Book Description
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author: Baptiste Gault
Publisher: Springer Science & Business Media
ISBN: 146143436X
Category : Technology & Engineering
Languages : en
Pages : 411
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Book Description
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Author: Hyongsok T. Soh
Publisher: Springer Science & Business Media
ISBN: 1475733313
Category : Technology & Engineering
Languages : en
Pages : 212
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Book Description
Scanning Probe Lithography (SPL) describes recent advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. SPL is capable of patterning sub-30nm features with nanometer-scale alignment registration. It is a relatively simple, inexpensive, reliable method for patterning nanometer-scale features on various substrates. It has potential applications for nanometer-scale research, for maskless semiconductor lithography, and for photomask patterning. The authors of this book have been key players in this exciting new field. Calvin Quate has been involved since the beginning in the early 1980s and leads the research time that is regarded as the foremost group in this field. Hyongsok Tom Soh and Kathryn Wilder Guarini have been the members of this group who, in the last few years, have brought about remarkable series of advances in SPM lithography. Some of these advances have been in the control of the tip which has allowed the scanning speed to be increased from mum/second to mm/second. Both non-contact and in-contact writing have been demonstrated as has controlled writing of sub-100 nm lines over large steps on the substrate surface. The engineering of a custom-designed MOSFET built into each microcantilever for individual current control is another notable achievement. Micromachined arrays of probes each with individual control have been demonstrated. One of the most intriguing new aspects is the use of directly-grown carbon nanotubes as robust, high-resolution emitters. In this book the authors concisely and authoritatively describe the historical context, the relevant inventions, and the prospects for eventual manufacturing use of this exciting new technology.
Author: Michael K. Miller
Publisher: Springer Science & Business Media
ISBN: 1461542812
Category : Technology & Engineering
Languages : en
Pages : 247
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Book Description
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author: Sascha Sadewasser
Publisher: Springer Science & Business Media
ISBN: 3642225667
Category : Technology & Engineering
Languages : en
Pages : 334
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Book Description
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
