Principles of Quantitative X-ray Fluorescence Analysis PDF Download
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Author: R. Tertian
Publisher: John Wiley & Sons
ISBN:
Category : Education
Languages : en
Pages : 412
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Book Description
Author: R. Tertian
Publisher: John Wiley & Sons
ISBN:
Category : Education
Languages : en
Pages : 412
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Book Description
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: P.J. Potts
Publisher: Springer Science & Business Media
ISBN: 940153988X
Category : Science
Languages : en
Pages : 633
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Book Description
without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.
Author: Gerald R. Lachance
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 432
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Book Description
A systematic account concerning the basic theory of X-ray physics and spectrometer configurations leading to simple expressions quantifying primary and secondary fluorescence emissions. Discusses the fundamental parameters approach for converting intensities to concentrations in both its classical formalism and by a number of basic influence coefficient algorithms. Examines approximations underlying influence coefficient models and theoretical simulations are used to evaluate global methods. Includes numerous detailed examples as well as extensive tabulations of theoretical data.
Author: Eva Margui
Publisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 149
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Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: Ron Jenkins
Publisher: CRC Press
ISBN: 9780824795542
Category : Science
Languages : en
Pages : 512
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Book Description
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Author: E.P. Bertin
Publisher: Springer Science & Business Media
ISBN: 1461344166
Category : Science
Languages : en
Pages : 1098
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Book Description
Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.
Author: Peter Brouwer
Publisher:
ISBN: 9789090167589
Category :
Languages : en
Pages : 71
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Book Description
Author: John C. Russ
Publisher: Butterworth-Heinemann
ISBN: 1483164004
Category : Science
Languages : en
Pages : 315
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Book Description
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.
Author: Rudolf Muller
Publisher: Springer Science & Business Media
ISBN: 1468417975
Category : Science
Languages : en
Pages : 328
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Book Description
In recent years the x-ray fluorescence technique has become increasingly important in modern analysis and production control; it can be classified as a spectroscopical method for the determination of the elemental com position. Many articles treat this method; however, there exists no modern textbook suitable for the beginner as well as the practician and theoretician. In this monograph the author intends to fill this need to present the prin ciples of x-ray fluorescence analysis and to develop a theoretical under standing of the technique. Both principles and theory w.ill be treated exten sively, for they are the basis for successful practical application of the method. X-ray fluorescence, on the other hand, is often carried out exclusively because of its practical usefulness. For this reason theoretical investigations are used exclusively as a basis for practical work and the multitude of applications, which constitute the value of the x-ray fluores cence method, will be explained on the basis of simple theory. The idea to write this monograph originated and developed when efforts to train coworkers required a more complete treatise. I would like to thank the elBA Aktiengesellschaft in Basel, where this work originated, for generous support and permission to publish the book. The head of the Physics Department, Dr. E. Ganz, and my colleagues have contributed to this book by providing a stimulating working atmosphere. I am grateful to my associates, in particular Messrs. E. Eng, S. Gasser, and H. R.
