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Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: S. Amelinckx
Publisher: John Wiley & Sons
ISBN: 3527614559
Category : Technology & Engineering
Languages : en
Pages : 527
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Book Description
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Author: Ulrich Kubitscheck
Publisher: John Wiley & Sons
ISBN: 3527687726
Category : Medical
Languages : de
Pages : 508
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Book Description
Zu dem Thema gibt es viele Publikationen, die von Experten für Experten geschrieben wurden. Dieses Buch wendet sich insbesondere an Studenten höherer Semester und Forscher, denen das Hintergrundwissen der Physik fehlt, um neuartige Verfahren der Fluoreszenzmikroskopie zu verstehen. Die zweite Auflage wartet mit neuen Kapiteln und einer erweiterten Einführung auf. Der Schwerpunkt liegt auf der hochauflösenden und Einzelmolekül-Mikroskopie. Jedes Kapitel wurde von einem anerkannten Experten des Fachgebiets geschrieben und sorgfältig überarbeitet, um so die Entwicklungen der letzten Jahre wiederzugeben.
Author: John J. Bozzola
Publisher: Jones & Bartlett Learning
ISBN: 9780763701925
Category : Medical
Languages : en
Pages : 702
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Book Description
New edition of an introductory reference that covers all of the important aspects of electron microscopy from a biological perspective, including theory of scanning and transmission; specimen preparation; darkroom, digital imaging, and image analysis; laboratory safety; interpretation of images; and an atlas of ultrastructure. Generously illustrated with bandw line drawings and photographs. Annotation copyrighted by Book News, Inc., Portland, OR
Author: Ian M. Watt
Publisher: Cambridge University Press
ISBN: 9780521435918
Category : Science
Languages : en
Pages : 506
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Book Description
The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1489920374
Category : Science
Languages : en
Pages : 458
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Book Description
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Author: Min Gu
Publisher: World Scientific
ISBN: 9814499404
Category : Science
Languages : en
Pages : 351
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Book Description
This book discusses the various principles in confocal scanning microscopy which has become a useful tool in many practical fields including biological studies and industrial inspection. The methodology presented in this book is unique and is based on the concept of the three-dimensional transfer functions which have been developed by the author and his colleagues over the last five years. With the 3-D transfer functions, resolving power in 3-D confocal imaging can be defined in a unified way, different optical arrangements can be compared with an insight into their inter-relationship, and images of thick objects can be modeled in terms of the Fourier transform which makes the analysis easy. The aim of this book is to provide a systematic introduction to the concept of the 3-D transfer functions in various confocal microscopes, to describe the methods for the derivation of different 3-D transfer functions, and to explain the principles of 3-D confocal imaging in terms of these functions.
Author: Paul T. Callaghan
Publisher:
ISBN: 9780198539971
Category : Science
Languages : en
Pages : 520
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Book Description
Although nuclear magnetic resonance is perhaps best known for its spectacular utility in medical tomography, its potential applicability to fields such as biology, materials science, and chemical physics is being increasingly recognized as laboratory NMR spectrometers are adapted to enable small scale imaging. This excellent introduction to the subject explores principles and common themes underlying two key variants of NMR microscopy, and provides many examples of their use. Methods discussed are not only important to fundamental biological and physical research, but have applications to a wide variety of industries, including those concerned with petrochemicals, polymers, biotechnology, food processing, and natural product processing. The wide range of scientists interested in NMR microscopy will want to own a copy of this book.
Author: David L. Spector
Publisher: CSHL Press
ISBN: 0879697512
Category : Science
Languages : en
Pages : 384
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Book Description
This manual contains selected material from Cells - a Laboratory Manual, as well as two chapters from Live Cell Imaging. It includes sections on microscopy, and on preparing and labelling specimens for microscopy.
Author: Douglas B. Murphy
Publisher:
ISBN:
Category :
Languages : en
Pages : 538
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Book Description
